Cypress CY7C1324H manual Pin Definitions

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CY7C1324H

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Pin Definitions

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Name

I/O

 

 

 

 

Description

 

 

 

 

 

 

 

A0, A1, A

Input-

Address Inputs used to select one of the 128K address locations. Sampled at the rising

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Synchronous

edge of the CLK if ADSP or ADSC is active LOW, and CE1, CE2, and

CE

3 are sampled active.

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

A[1:0] feed the 2-bit counter.

 

 

 

 

 

A,

 

 

 

B

Input-

Byte Write Select Inputs, active LOW. Qualified with

 

to conduct Byte Writes to the

 

 

BW

BW

BWE

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Synchronous

SRAM. Sampled on the rising edge of CLK.

 

 

 

 

 

 

 

 

 

 

 

Input-

Global Write Enable Input, active LOW. When asserted LOW on the rising edge of CLK, a

 

 

GW

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Synchronous

global Write is conducted (ALL bytes are written, regardless of the values on BW[A:B] and BWE).

 

 

 

 

 

 

 

 

 

 

 

Input-

Byte Write Enable Input, active LOW. Sampled on the rising edge of CLK. This signal must

 

 

BWE

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Synchronous

be asserted LOW to conduct a Byte Write.

 

 

CLK

Input-Clock

Clock Input. Used to capture all synchronous inputs to the device. Also used to increment the

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

burst counter when ADV is asserted LOW, during a burst operation.

 

 

 

1

 

 

 

Input-

Chip Enable

1

Input, active LOW. Sampled on the rising edge of CLK. Used

in

conjunction

 

 

CE

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Synchronous

with CE2 and CE3 to select/deselect the device. ADSP is ignored if CE1 is HIGH. CE1 is sampled

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

only when a new external address is loaded.

 

 

CE2

Input-

Chip Enable 2 Input, active HIGH. Sampled on the rising edge of CLK. Used in conjunction

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Synchronous

with CE1 and CE3 to select/deselect the device. CE2 is sampled only when a new external

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

address is loaded.

 

 

 

3

 

 

 

Input-

Chip Enable 3 Input, active LOW. Sampled on

the

rising edge of CLK. Used in conjunction

 

 

CE

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Synchronous

with CE1 and CE2 to select/deselect the device. CE3 is sampled only when a new external

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

address is loaded.

 

 

 

 

 

 

 

 

Input-

Output Enable, asynchronous input, active LOW. Controls the direction of the I/O pins.

 

 

OE

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Asynchronous

When LOW, the I/O pins behave as outputs. When deasserted HIGH, I/O pins are tri-stated,

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

and act as input data pins. OE is masked during the first clock of a Read cycle when emerging

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

from a deselected state.

 

 

 

 

 

 

 

 

 

 

Input-

Advance Input signal, sampled on the rising edge of CLK. When asserted, it automatically

 

 

ADV

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Synchronous

increments the address in a burst cycle.

 

 

 

 

 

 

 

 

 

 

 

 

Input-

Address Strobe from Processor, sampled on the rising edge of CLK, active LOW. When

 

 

ADSP

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Synchronous

asserted LOW, addresses presented to the device are captured in the address registers.

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

A[1:0]

are also loaded into the burst counter. When ADSP and ADSC are both asserted,

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

only ADSP is recognized. ASDP is ignored when CE1 is deasserted HIGH

 

 

 

 

 

 

 

 

 

 

 

 

Input-

Address Strobe from Controller, sampled on the rising edge of CLK, active LOW. When

 

 

ADSC

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Synchronous

asserted LOW, addresses presented to the device are captured in the address registers.

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

A[1:0]

are also loaded into the burst counter. When ADSP and ADSC are both asserted,

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

only ADSP is recognized.

 

 

ZZ

Input-

ZZ “sleep” Input, active HIGH. When asserted HIGH places the device in a non-time-critical

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Asynchronous

“sleep” condition with data integrity preserved. For normal operation, this pin has to be LOW or

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

left floating. ZZ pin has an internal pull-down.

 

 

DQs

I/O-

Bidirectional Data I/O Lines. As inputs, they feed into an on-chip data register that is triggered

 

 

DQPA, DQPB

Synchronous

by the rising edge of CLK. As outputs, they deliver the data contained in the memory location

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

specified by the addresses presented during the previous clock rise of the Read cycle. The

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

direction of the pins is controlled by OE. When OE is asserted LOW, the pins behave as outputs.

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

When HIGH, DQs and DQP[A:B] are placed in a tri-state condition.

 

 

VDD

Power

Power supply inputs to the core of the device.

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Supply

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

VSS

Ground

Ground for the device.

 

 

VDDQ

I/O Power

Power supply for the I/O circuitry.

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Supply

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

MODE

Input-

Selects Burst Order. When tied to GND selects linear burst sequence. When tied to VDD or

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Static

left floating selects interleaved burst sequence. This is a strap pin and should remain static

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

during device operation. Mode Pin has an internal pull-up.

 

 

NC

 

 

 

No Connects. Not Internally connected to the die. 4M, 9M, 18M, 72M, 144M, 288M, 576M, and

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

1G are address expansion pins and are not internally connected to the die.

Document #: 001-00208 Rev. *B

 

 

 

 

 

 

 

 

 

 

 

Page 3 of 15

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Contents Cypress Semiconductor Corporation FeaturesLogic Block Diagram Functional Description1133 MHz Unit Pin ConfigurationsSelection Guide 15CY7C1324HPin Definitions Functional Overview Sleep ModeInterleaved Burst Address Table Mode = Floating or VDD Linear Burst Address Table Mode = GNDCycle Description Used ZZ Mode Electrical CharacteristicsParameter Description Test Conditions Min Max Unit AddressTruth Table for Read/Write 2 FunctionBWE Maximum Ratings Operating RangeAmbient Range Capacitance8 Thermal Resistance8AC Test Loads and Waveforms Switching Characteristics Over the Operating Range9 Read Cycle Timing15 Timing DiagramsDON’T Care Write Cycle Timing15Burst Read Read/Write Timing15, 17Adsp Adsc AddressZZ Mode Timing19 Package Diagram Ordering InformationPin Tqfp 14 x 20 x 1.4 mm Issue Date Orig. Description of Change Document HistoryREV ECN no

CY7C1324H specifications

The Cypress CY7C1324H is a high-performance SRAM (Static Random Access Memory) device that plays a crucial role in various applications requiring fast and efficient data access. This device is part of the CY7C family of SRAM products and stands out for its advanced features, robust performance metrics, and versatility in operation.

One of the most notable features of the CY7C1324H is its 32 megabit (4M x 8) memory capacity, which allows for significant data storage and retrieval capabilities. This memory is organized as a 4M word by 8 bits, making it suitable for a wide range of applications, from automotive to telecommunications and industrial control systems.

The CY7C1324H operates at a speed of 20 nanoseconds, making it an ideal choice for systems that require rapid read and write cycles. The device supports both asynchronous read and write operations, allowing for flexible interfacing with various microcontrollers and digital signal processors. This speed enhances overall system performance, especially when handling time-critical data.

In terms of technologies, the CY7C1324H employs high-speed CMOS (Complementary Metal-Oxide-Semiconductor) technology, which contributes to its low power consumption and high reliability. The device operates at a voltage range of 2.7V to 3.6V, making it suitable for battery-powered applications where energy efficiency is paramount. The integration of advanced CMOS technology also facilitates a higher degree of integration, enabling more compact designs in electronic circuits.

The device features a simple and straightforward interface, with a single enable (E) control pin that allows for easy access to memory contents. Additionally, the CY7C1324H supports both byte-wide and word-wide data accesses, making it highly adaptable for various application requirements.

Another important characteristic of the CY7C1324H is its low pin count, consisting of only 32 pins, which aids in minimizing board space and simplifying design layouts. The packaging comes in a 44-lead Thin Quad Flat Pack (TQFP), further optimizing space usage in compact electronic designs.

In summary, the Cypress CY7C1324H is a versatile, high-speed SRAM solution that offers a combination of large memory capacity, rapid access times, and low power operation. Its robust features make it an excellent choice for a broad spectrum of electronic applications, paving the way for enhanced performance and efficiency in modern electronic systems.