Agilent Technologies 8510C manual Test configuration accessories

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Test configuration accessories

Power meter and power sensors

E4418A power meter and 8480 series power sensors

Required for use with test port power flatness correction feature.

Bias supply

6626A precision DC power supply

For connection to 851XA test set bias input, also order 14852A.

14852A bias interconnect cable

Bias networks

For supplying DC bias externally from the test set. Standard S-parameter test sets include bias networks.

11590B bias network Frequency options

11590B-101100 MHz - 12.4 GHz with Type-N connectors (0.5A maximum current)

11590B-001100 MHz - 18 GHz with 7mm connectors (0.5A maximum current)

11612A bias network with 3.5 mm connectors

11612A-0012 amps maximum current (400 MHz -

26.5GHz)

11612B-0020.5 amps maximum current (45 MHz -

26.5GHz)

11612B bias network (45 MHz to 50 GHz) with

2.4 mm connectors (0.5A maximum current)

Amplifier

8349B microwave amplifier (2 - 20 GHz) May be used to increase input power level to S-parameter test sets and increase system dynamic range.

8349B-001Recommended (rear panel in/out installed) for use in racked configurations

8349B-UN1Standard configuration (front panel in/out)

System rack

85043C system rack kit

132 cm (52 in.) high x 60 cm (23.6 in.) wide x

90.5cm (35.6 in.) deep. Supplied with anti-static mat (part number 85043-80013), support rails, rack mounting kits (Option 913), and power dis- tribution. Includes two 10833A GPIB cables for connecting system peripherals to 8510C.

85043C-115110/120 V line operation

85043C-230220/240 V line operation

System software

Compatible with a PC, running BASIC Rev 2.1 (85161B) or Windows (95/98/2000 ME/NT). Comes in 3.5-inch disk media.

85161B measurement automation software

85070D materials measurement software/probe kit

(PC version)

85071D materials measurement software

(PC version)

Peripherals

Hardcopy results may be output directly to a printer or plotter over the system bus (GPIB com- patible) or serial output ports (RS-232-C) without the need of an external computer. Measurement data, calibration sets and kits, and instrument states may be stored on disk using either the built- in disk drive or an external disk drive. GPIB cables must be ordered for each peripheral. Two serial interface (RS-232-C) cables are included with 8510C.

Graphics printers

HP C2678A DeskJet 1120C Color Printer HP C2679A DeskJet 1120Cse Color Printer HP C2680A DeskJet 1120Cxi Color Printer HP C5876A DeskJet 890Cxi Color Printer HP C5877A DeskJet 890Cse Color Printer HP C3941A LaserJet 5L Printer

HP C3150A LaserJet 5P Printer

GPIB cables

10833A 1-Meter GPIB cable

10833B 2-Meter GPIB cable

10833D 0.5-Meter GPIB cable

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Contents Test set options FeaturesMHz to 110 GHz Complete systemsSource options AccessoriesFrequency range select one Test set attenuation optionsCalibration kit options select one Frequency range select one 85108A-STD 2 20 GHz System components 83623L synthesized sweeper 45 MHz to 20 GHz for Millimeter-wave test sets and controllersSources 85105A millimeter-wave test set controllerCommon options for RF sources Measurement accessories85052C 045 to Calibration kitsTest port cables and adapters Verification kitsFor Agilent 85110L test sets Mm rugged test port connectors Test configuration accessories Upgrades for 85107B and 85109C System upgradesTime domain upgrade Instrument and firmware upgrades Upgrades for 8510AUpgrades for 8510B Upgrades for 8510CMiscellaneous compatibility upgrades Test set upgradesRelated Agilent literature Agilent Email Updates
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8510C specifications

Agilent Technologies 8510C is a sophisticated network analyzer renowned for its high performance and precision in measuring small signals. Renowned in the electronic test and measurement industry, the 8510C is particularly suited for applications in microwave and RF engineering. This versatile instrument excels in characterizing both passive and active devices, making it indispensable for engineers working on circuit design, antenna measurement, and RF component testing.

One of the main features of the 8510C is its frequency coverage, which spans from 10 MHz to 50 GHz, allowing users to test a wide range of devices and components. This broad frequency range enables the analyzer to address various applications involving microwave frequencies, such as satellite communications and radar systems. Additionally, the device provides exceptional dynamic range, enabling accurate measurements of weak signals alongside more robust signals, a critical feature for today’s complex systems.

The 8510C utilizes state-of-the-art frequency synthesis technology, which enhances its signal stability and allows for precise frequency sweeps. It employs direct signal sampling techniques to improve measurement accuracy and reduce noise, providing engineers with reliable data to support their designs. The instrument boasts a high-resolution display that aids in visualizing S-parameter measurements, enhancing the analysis of transmission and reflection characteristics of devices under test.

Another prominent characteristic of the 8510C is its ability to perform automated measurements, greatly improving productivity in the lab. The device supports multiple measurement formats, including time domain and frequency domain measurements, broadening its application range. Additionally, it can be integrated with other Agilent instruments, offering seamless interconnectivity and advanced measurement capabilities.

The intuitive user interface simplifies operation, allowing engineers to focus on measurement tasks rather than navigating complex controls. The 8510C is compatible with several software packages, including Agilent’s ADS (Advanced Design System), facilitating comprehensive data analysis and modeling.

In summary, the Agilent Technologies 8510C is a cutting-edge network analyzer characterized by its extensive frequency coverage, remarkable dynamic range, accurate measurements, and user-friendly interface. This instrument empowers engineers to achieve high levels of precision and efficiency in their testing processes, making it a cornerstone in the field of RF and microwave engineering.