Agilent Technologies 8510C manual Instrument and firmware upgrades Upgrades for 8510A

Page 13

Upgrades for 85106C-001 and 85106C-002(added 8517B, replaced 83621A/B with 83651A/B, and replaced 8350B/83540A with 83621A/B)

85106D-001(added 8517B and replaced 83621B with 83651B)

85109C-002(replaced 8350B/83540A with 83621A/B Upgrade consists of two test heads and a millime- ter test set. It does not include calibration kits, test port cables or rack.

E7347A upgrade to an 8510XF 85 GHz system

E7357A upgrade to an 8510XF 110 GHz system

The following options are available for both upgrades:

E73x7A-STDStandard configuration

E73x7A-005Add 45 MHz to 2 GHz low frequency extension

E73x7A-006Add RF pass thru (provides coupled output of 50 GHz source for additional test sets. Additional test set(s) must have option 001 installed.)

E73x7A-056Add both low frequency extension and RF pass thru

Instrument and firmware upgrades

Upgrades for 8510A

8510C Upgrade (includes on-site installation by Agilent Customer Engineer)

85103E 8510A to 8510C upgrade (replaces the top unit on the 8510A)

85103E-001adds rack modification kit (for sys- tems mounted in an 85043A system rack)

85103E-002adds 8360 series source compatibility kit for 8517A/B test sets

85103E-003adds 8360 series source compatibility kit for the 8514/15 and 85110A test sets

85103E-004adds 8360 source compatibility kit for the 85110L test set

Time domain upgrade

85012A time domain (Option 010) upgrade for

8510A (customer installed)

Upgrades for 8510B

8510C Upgrade (includes on-site installation by Agilent Customer Engineer)

85103F 8510B to 8510C upgrade (replaces the top unit on the 8510B)

85103F-001adds rack modification kit (for sys- tems mounted in a 85043A system rack)

85103F-002adds 8360 series source compatibility kit for 8517A/B test sets

85103F-003adds 8360 series source compatibility kit for the 8514/15 and 85110A test sets

85103F-004adds 8360 source compatibility kit for the 85110L test set

Upgrades for 8510C

Wideband IF detector upgrade (reference to 85108A for additional hardware requirements)

85111B pulsed-RF measurement capability upgrade for the 8510C (upgrade adds circuitry to the 8510C and includes on-site installation by Agilent Customer Engineer)

Time domain upgrade

85012C time domain (Option 010) upgrade for

8510C (customer installed)

Firmware upgrades for 8510C

11575J revision 7.xx upgrade (customer installed)

For any revision of 8510C firmware currently installed.

11575J-002adds 8360 series source compatibility kit for 8517A/B test sets

11575J-003adds 8360 series source compatibility kit for the 8514/15 and 85110A test sets

11575J-004adds 8360 source compatibility kit for the 85110L test set

13

Image 13
Contents MHz to 110 GHz FeaturesComplete systems Test set optionsSource options AccessoriesCalibration kit options select one Test set attenuation optionsFrequency range select one Frequency range select one 85108A-STD 2 20 GHz System components Sources Millimeter-wave test sets and controllers85105A millimeter-wave test set controller 83623L synthesized sweeper 45 MHz to 20 GHz forCommon options for RF sources Measurement accessories85052C 045 to Calibration kitsTest port cables and adapters Verification kitsFor Agilent 85110L test sets Mm rugged test port connectors Test configuration accessories Upgrades for 85107B and 85109C System upgradesUpgrades for 8510B Instrument and firmware upgrades Upgrades for 8510AUpgrades for 8510C Time domain upgradeMiscellaneous compatibility upgrades Test set upgradesRelated Agilent literature Agilent Email Updates
Related manuals
Manual 41 pages 24.69 Kb

8510C specifications

Agilent Technologies 8510C is a sophisticated network analyzer renowned for its high performance and precision in measuring small signals. Renowned in the electronic test and measurement industry, the 8510C is particularly suited for applications in microwave and RF engineering. This versatile instrument excels in characterizing both passive and active devices, making it indispensable for engineers working on circuit design, antenna measurement, and RF component testing.

One of the main features of the 8510C is its frequency coverage, which spans from 10 MHz to 50 GHz, allowing users to test a wide range of devices and components. This broad frequency range enables the analyzer to address various applications involving microwave frequencies, such as satellite communications and radar systems. Additionally, the device provides exceptional dynamic range, enabling accurate measurements of weak signals alongside more robust signals, a critical feature for today’s complex systems.

The 8510C utilizes state-of-the-art frequency synthesis technology, which enhances its signal stability and allows for precise frequency sweeps. It employs direct signal sampling techniques to improve measurement accuracy and reduce noise, providing engineers with reliable data to support their designs. The instrument boasts a high-resolution display that aids in visualizing S-parameter measurements, enhancing the analysis of transmission and reflection characteristics of devices under test.

Another prominent characteristic of the 8510C is its ability to perform automated measurements, greatly improving productivity in the lab. The device supports multiple measurement formats, including time domain and frequency domain measurements, broadening its application range. Additionally, it can be integrated with other Agilent instruments, offering seamless interconnectivity and advanced measurement capabilities.

The intuitive user interface simplifies operation, allowing engineers to focus on measurement tasks rather than navigating complex controls. The 8510C is compatible with several software packages, including Agilent’s ADS (Advanced Design System), facilitating comprehensive data analysis and modeling.

In summary, the Agilent Technologies 8510C is a cutting-edge network analyzer characterized by its extensive frequency coverage, remarkable dynamic range, accurate measurements, and user-friendly interface. This instrument empowers engineers to achieve high levels of precision and efficiency in their testing processes, making it a cornerstone in the field of RF and microwave engineering.