Agilent Technologies Agilent 35670A manual Measuring Dual Channel Time Waveforms

Page 24

AGILENT 35670A

Supplemental Operator’s Guide

Section 9 : Measuring Dual Channel Time Waveforms

This section contains procedures for setting up and measuring a single channel time waveform using an AGILENT 35670A Dynamic Signal Analyzer. Included are steps to select single channel operation, set up the trace time length, and set up triggering to capture a transient event. Instructions will also be presented to scale the time trace.

Selecting Dual Channel Operation

To measure a single-channel spectrum, turn on the AGILENT 35670A. The default instrument mode is dual-channel operation.

Note: if the AGILENT 35670A was already turned on and in an unknown state, then preset the analyzer by doing the following:

•Press the green [Preset] hardkey.

•Press [DO PRESET] softkey (F1).

This always returns the analyzer to dual-channel operation.

Selecting Time Record Length

Time record length can be entered directly or indirectly. It is entered directly under the [Freq] hardkey as follows (this example sets up a 0.25 second time record):

•Press the [Freq] hardkey

•Press the [RECORD LENGTH] softkey (F8)

•Enter 0.25 and then press the [S] softkey (F1)

Time record length can also be specified indirectly by entering frequency and resolution in lines. The relationship between time record length (T), lines of resolution (N), and frequency (F) is:

T = N (1024.F )

For 400 lines of resolution (default) and 1600 Hz span, the time record length should be 400/(1.024*1600) ≈ 0.25 seconds. The table showing the relationship between lines, span, and time record length can be found in the section on Single Channel Time Waveforms.

Displaying Dual Time Waveforms

Dual time waveforms can be shown in the UPPER/LOWER display format, with AUTO SCALE turned ON, as follows:

•Press the [Disp Format] hardkey.

•Press the [UPPER/LOWER] softkey (F3).

•Press the [Active Trace] hardkey.

•Press the [A] softkey (F1)

•Press the [Meas Data] hardkey.

20

Page 23 Page 25
Image 24
Page 23 Page 25
Contents David Forrest Seattle Sound and Vibration, incPrint Date December ÃSeattle Sound and Vibration, incAgilent 35670A Supplemental Operator’s GuideHammer Test Setup Without a Force Transducer Recalling Trace Data from 3.5 Disk or NON-VOLATILE Memory Turning On the Agilent 35670A Typical Display After Turn-on SequenceMeasurement State After Turn-on WindowUsing ICP-Type Transducers with the Agilent 35670A To set up Channel 1 for an ICP-type transducerTo set up Channel 2 for an ICP transducer Using Transducers with External PreamplifiersPress Xdcr Unit CH2 Setup softkey F8 Press Xdcr Unit CH1 Setup softkey F8Specifying Transducer Sensitivity and Units Measuring a Single Channel Power Spectrum Displacement Setting Up Transducer Units for DisplacementSelecting Single Channel Operation Selecting Frequency SpanTo automatically scale the display to fit the data Quantifying Power Spectrum Results CH4Frequency Zooming to Increase Resolution Improving Measurement ResultsTo set a new, lower span To return to baseband measurementsAveraging to Reduce Measurement Variance Enter softkey F1AVG Then set the instrument mode to single channel as above Measuring a Single Channel Time WaveformUsing Manual Arm to Capture a Single Time Waveform Selecting Time Record LengthDisplaying Time Waveforms Then to arm a single time recordEvent Triggering To start the data acquisitionAnalyzer should show in highlighted text above the trace Quantifying Time Trace Results CH4Presetting the Analyzer Displaying Dual-Channel Power Spectrum MeasurementsMeasuring Dual Channel Spectra Selecting Dual Channel OperationUsing Markers with Dual Channel Measurements To acquire dual channel spectraCoupled Markers Coupled Markers with Peak TrackingTo set up the same fixed range on all channels Improving Dual Channel Measurement ResultsDual Channel Averaging Avg Type RMS Number Measuring Dual Channel Time Waveforms This always returns the analyzer to dual-channel operationDisplaying Dual Time Waveforms Arming Dual Channel Time Measurements Triggering a Dual-Channel Time MeasurementTrigger Delay FFTUsing Markers with Dual Channel Time Measurements Measuring Dual Channel Spectra and Time Waveforms0Hz CH2 Pwr Spec X60 Y88.5405 mVrms 100 MVrms LogMag UVrms Modal Testing Using a Hammer and Accelerometer Setting Up the Transducer ParametersWait for the analyzer to finish its preset routine Set up the force transducer parameters as followsSetting Up Input Range Use CH* Auto UP only as the autorange routine as followsChoosing a Preliminary Frequency Span Specifying Trigger ParametersSetting Up Time Displays Now to check that the trigger parameters are correctPress the Windowed Time CH 1 softkey F5 Press the Windowed Time CH 2 softkey F5Using Force/Response Windows FFTPress the Force Expo Setup softkey F6 To view the effects of theForce/Response windowDisplaying Hammer Test Results AveragingTo start taking measurements FFTDelay = 01.T ForceWidth = T ExponentialDecay = T Changing Frequency SpanHammer Test Setup Without a Force Transducer Setting Up the Hammer Test Without a Force TransducerOrder Domain Results in List Mode Prepare the order display as followsPrepare the order results list as follows To start taking measurements Comparing Two-Channel Real-Time Spectra with Recalled Data Selecting Measurement ParametersDisplaying Dual-Channel Spectra Compared with Recalled Data Press the UPPR/LOWR FRNT/BACK softkey F5Recalling the Spectra from Disk Recalling the Spectra from Non-Volatile RAMInto D1 softkey F1 Into D2 softkey F2Scaling the Displays Press the Y PER DIV Decades softkey F6Using Markers to Compare Setting Up the Waterfall Display Continuing to set up a waterfall displayWaterfall Spectra at Time Intervals Press the PWR Spec Channel 1 softkey F3Setting Up Time Step Arm Using Slice Markers with Waterfall DataThen specify the total number of spectra to be collected Press the Waterfall Markers softkey F5Press the Save and Disp Data softkey F5 Setting Up the Tachometer This starts the measurement when 1000 RPMWaterfall Spectra at RPM Intervals Specifying the Start RPMStarting and Pausing a Measurement Scaling the DisplayProperly Scaled, RPM Triggered Waterfall Display Two-Channel Absolute and Differential Amplitude Measurement Accelerometer PolaritySet up triggering on Channel 1 to 5% of range Measuring Amplitudes, Differential Amplitude, and PhaseSet up the Agilent 35670A Using a Math Function to Measure Differential MotionFor accelerometers with the same polarity For accelerometers with opposite polaritySet up display Set up trace coordinates as peak-to-peak milPut the math function of the differential motion in Trace c Press the PWR Spec Channel 2 softkey F3Start measurement Measuring Frequency Response Using Impact Excitation Measuring Frequency Response Using Broadband ExcitationSet up the shaker Measuring Frequency Response with the Agilent 35670APreset the Agilent 35670A Connect the transducersEnter Channel 1 input parameters Enter Channel 2 input parametersSet up display parameters Supplemental Operator’s Guide Choose measurement parametersPress the Freq Resp 2 / 1 softkey F6 Set up the trigger Viewing Frequency Response Results with a Nyquist DiagramViewing Results Using Real and Imaginary Traces Assessing Measurement Quality Set up transducer parameters for a 10 mV/g accelerometer Set up Trace B to measure velocity in inch/s 0-pkTwo Spectral Traces Showing Mils and Ips while EU is G MV/EU softkey F2Agilent 35670A Set up display format to measure peak amplitude Peak Hold During a Machine Run-up and Coast-DownSpecify measurement parameters When the run-up and run-down is completed Press the yellow Pause/Cont hardkey and examine resultsUsing an External Trigger for Time Averaging Specify User Levels for TriggeringCharacterizing the External Trigger Press the Unfilterd Time CH 1 softkey F6Characterize the Trigger Signal Setting Up External TriggerSet up a non-TTL trigger as follows Set up measurement parameters Measuring Time Averaged Spectrums with External TriggeringConfirming Contents of 3.5 Disk File Saving Trace to 3.5 DiskConfirming Contents of NV-RAM Saving Trace to Non-Volatile RAM NV-RAMRecalling Trace Data From 3.5 Disk or Non-Volatile Memory Recall Trace From 3.5 DiskRecall Trace Data from Non-Volatile RAM NV-RAM Into D2 softkey F2 Plotting and Printing Trace Data Generating Output with the Agilent 35670AEnter a plot title if desired Plotting the DisplayCheck the Plot/Print Destination Plot the TracePrinting the Display Print over Parallel Interface to Raster DeviceInstalling the MS Word HP-GL Graphics Import Filter Importing Plots into Microsoft WordDetermining if MS Word Has HP-GL Graphics Import Filter It should now be an import optionPlot to a File Using the Agilent 35670A Plot to file P1.HGLRunning a Single Calibration Test on Command Returning the Agilent 35670A to a Preset ConditionPrecautions to Prevent Loss of Data Measuring Acceleration, Displaying Displacement Press the Front END CH1 Setup softkey F7Transducer Unit Conversion with the Agilent 35670A Specify an averaged measurementMath Functions and Xdcr Unit Convert Converting Frequency Response Units to ComplianceNow display the function F1 on Trace B Press the Constant K1-K5 softkey F3Agilent 35670A Agilent 35670A Section Measuring a Single Channel Spectrum Section Measuring Frequency Response with the Agilent 35670A

Agilent 35670A specifications

Agilent Technologies Agilent 35670A is a prominent and versatile dynamic signal analyzer designed for various applications in vibration testing, structural analysis, and noise measurement. Engineered to meet the rigorous demands of engineers and researchers, the 35670A is especially valued for its advanced features and functionalities that facilitate detailed analysis and troubleshooting.

One of the primary features of the Agilent 35670A is its ability to perform real-time signal analysis. The instrument is equipped with a powerful processing engine that handles large amounts of data efficiently, providing fast and accurate results. This real-time capability is critical for dynamic testing applications, allowing engineers to monitor and analyze signals as they occur, thereby facilitating quicker decision-making and problem identification.

The Agilent 35670A employs advanced Fast Fourier Transform (FFT) algorithms, which provide high-resolution spectral analysis. This feature is essential for engineers needing to identify frequency components in complex signals, making it particularly useful in the fields of acoustics and mechanical engineering. The analyzer supports various types of measurements, such as magnitude and phase, enabling users to delve deeply into their data.

Another key technology embedded in the Agilent 35670A is its ability to perform multi-channel measurements. The instrument can connect to a variety of external sensors and testing devices, making it a flexible choice for users who need to analyze multiple signals simultaneously. This multi-channel feature is particularly advantageous in automotive testing, aerospace applications, and structural health monitoring.

The device also comes equipped with a user-friendly graphical interface, enhancing the overall user experience. The interface facilitates easy navigation and access to various measurement modes, settings, and data visualizations. Additionally, the Agilent 35670A supports automated measurements, allowing users to save time and reduce human error in repetitive testing scenarios.

Furthermore, the Agilent 35670A offers extensive connectivity options, including GPIB and USB interfaces, making it easy to integrate into existing laboratory setups and automated testing systems. This flexibility ensures that users can adapt the analyzer to their specific needs and workflow processes.

In summary, the Agilent 35670A stands out as a sophisticated dynamic signal analyzer that combines advanced signal processing technologies with user-friendly features. Its real-time analysis, multi-channel capabilities, and extensive connectivity options make it an invaluable tool for professionals in various engineering fields, dedicated to achieving precision in their analyses and solutions.
Top Page Image Contents