Agilent Technologies Agilent 35670A manual Set up the trigger

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AGILENT 35670A

Supplemental Operator’s Guide

•Turn up the level control on the shaker amplifier until the excitation is noticeable, but does not buzz or rattle. If buzzing or rattling is heard, then either the level is too high or the structure is loose and must be quieted.

•Press the [MORE CHOICES] softkey (F9)

•Press the [BURST RANDOM] softkey (F2)

Set up the trigger

•Press the [Trigger] hardkey.

•Press the [SOURCE TRIGGER] softkey (F4).

To acquire a burst random frequency response of the structure:

•Press the yellow [Start] hardkey.

Avg

Type: RMS

Number: 10

[FFT]

Update Rt: 5

Overlap: 0 %

Date: 10-02-96 Time: 09:49:00 PM

 

 

 

A: Freq Resp2/1

X:0

Hz

 

Y:84.6724 e-3

1

 

 

 

 

 

LogMag

 

 

 

 

 

3

 

 

 

 

 

decades

 

 

 

 

 

1

 

 

 

 

 

e-3

 

 

 

 

 

0Hz

 

 

AVG:

10

400Hz

B: Freq Resp2/1

X:0

Hz

 

Y:0

deg

180

 

 

 

 

 

deg

 

 

 

 

 

Phase

 

 

 

 

 

36

 

 

 

 

 

deg

 

 

 

 

 

/div

 

 

 

 

 

-180

 

 

 

 

 

deg

 

 

 

 

 

0Hz

 

 

AVG:

10

400Hz

Viewing Frequency Response Results with a Nyquist Diagram

The previous display shows frequency response results with Log Magnitude and Phase traces. Other trace coordinates are available. To examine results in a Nyquist Diagram, proceed as follows:

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Contents Seattle Sound and Vibration, inc David ForrestPrint Date December ÃSeattle Sound and Vibration, incSupplemental Operator’s Guide Agilent 35670AHammer Test Setup Without a Force Transducer Recalling Trace Data from 3.5 Disk or NON-VOLATILE Memory Typical Display After Turn-on Sequence Turning On the Agilent 35670AWindow Measurement State After Turn-onTo set up Channel 1 for an ICP-type transducer Using ICP-Type Transducers with the Agilent 35670ATo set up Channel 2 for an ICP transducer Using Transducers with External PreamplifiersPress Xdcr Unit CH2 Setup softkey F8 Press Xdcr Unit CH1 Setup softkey F8Specifying Transducer Sensitivity and Units Setting Up Transducer Units for Displacement Measuring a Single Channel Power Spectrum DisplacementSelecting Single Channel Operation Selecting Frequency SpanTo automatically scale the display to fit the data CH4 Quantifying Power Spectrum ResultsImproving Measurement Results Frequency Zooming to Increase ResolutionTo set a new, lower span To return to baseband measurementsEnter softkey F1 Averaging to Reduce Measurement VarianceAVG Measuring a Single Channel Time Waveform Then set the instrument mode to single channel as aboveSelecting Time Record Length Using Manual Arm to Capture a Single Time WaveformDisplaying Time Waveforms Then to arm a single time recordEvent Triggering To start the data acquisitionAnalyzer should show in highlighted text above the trace CH4 Quantifying Time Trace ResultsDisplaying Dual-Channel Power Spectrum Measurements Presetting the AnalyzerMeasuring Dual Channel Spectra Selecting Dual Channel OperationTo acquire dual channel spectra Using Markers with Dual Channel MeasurementsCoupled Markers with Peak Tracking Coupled MarkersTo set up the same fixed range on all channels Improving Dual Channel Measurement ResultsDual Channel Averaging Avg Type RMS Number Measuring Dual Channel Time Waveforms This always returns the analyzer to dual-channel operationDisplaying Dual Time Waveforms Triggering a Dual-Channel Time Measurement Arming Dual Channel Time MeasurementsFFT Trigger DelayMeasuring Dual Channel Spectra and Time Waveforms Using Markers with Dual Channel Time Measurements0Hz CH2 Pwr Spec X60 Y88.5405 mVrms 100 MVrms LogMag UVrms Setting Up the Transducer Parameters Modal Testing Using a Hammer and AccelerometerWait for the analyzer to finish its preset routine Set up the force transducer parameters as followsUse CH* Auto UP only as the autorange routine as follows Setting Up Input RangeChoosing a Preliminary Frequency Span Specifying Trigger ParametersNow to check that the trigger parameters are correct Setting Up Time DisplaysPress the Windowed Time CH 1 softkey F5 Press the Windowed Time CH 2 softkey F5FFT Using Force/Response WindowsTo view the effects of theForce/Response window Press the Force Expo Setup softkey F6Displaying Hammer Test Results AveragingFFT To start taking measurementsChanging Frequency Span Delay = 01.T ForceWidth = T ExponentialDecay = TSetting Up the Hammer Test Without a Force Transducer Hammer Test Setup Without a Force TransducerOrder Domain Results in List Mode Prepare the order display as followsPrepare the order results list as follows To start taking measurements Selecting Measurement Parameters Comparing Two-Channel Real-Time Spectra with Recalled DataDisplaying Dual-Channel Spectra Compared with Recalled Data Press the UPPR/LOWR FRNT/BACK softkey F5Recalling the Spectra from Non-Volatile RAM Recalling the Spectra from DiskInto D1 softkey F1 Into D2 softkey F2Press the Y PER DIV Decades softkey F6 Scaling the DisplaysUsing Markers to Compare Continuing to set up a waterfall display Setting Up the Waterfall DisplayWaterfall Spectra at Time Intervals Press the PWR Spec Channel 1 softkey F3Using Slice Markers with Waterfall Data Setting Up Time Step ArmThen specify the total number of spectra to be collected Press the Waterfall Markers softkey F5Press the Save and Disp Data softkey F5 This starts the measurement when 1000 RPM Setting Up the TachometerWaterfall Spectra at RPM Intervals Specifying the Start RPMScaling the Display Starting and Pausing a MeasurementProperly Scaled, RPM Triggered Waterfall Display Accelerometer Polarity Two-Channel Absolute and Differential Amplitude MeasurementMeasuring Amplitudes, Differential Amplitude, and Phase Set up triggering on Channel 1 to 5% of rangeUsing a Math Function to Measure Differential Motion Set up the Agilent 35670AFor accelerometers with the same polarity For accelerometers with opposite polaritySet up trace coordinates as peak-to-peak mil Set up displayPut the math function of the differential motion in Trace c Press the PWR Spec Channel 2 softkey F3Start measurement Measuring Frequency Response Using Broadband Excitation Measuring Frequency Response Using Impact ExcitationSet up the shaker Measuring Frequency Response with the Agilent 35670AConnect the transducers Preset the Agilent 35670AEnter Channel 1 input parameters Enter Channel 2 input parametersSet up display parameters Supplemental Operator’s Guide Choose measurement parametersPress the Freq Resp 2 / 1 softkey F6 Viewing Frequency Response Results with a Nyquist Diagram Set up the triggerViewing Results Using Real and Imaginary Traces Assessing Measurement Quality Set up Trace B to measure velocity in inch/s 0-pk Set up transducer parameters for a 10 mV/g accelerometerTwo Spectral Traces Showing Mils and Ips while EU is G MV/EU softkey F2Agilent 35670A Set up display format to measure peak amplitude Peak Hold During a Machine Run-up and Coast-DownSpecify measurement parameters Press the yellow Pause/Cont hardkey and examine results When the run-up and run-down is completedSpecify User Levels for Triggering Using an External Trigger for Time AveragingCharacterizing the External Trigger Press the Unfilterd Time CH 1 softkey F6Characterize the Trigger Signal Setting Up External TriggerSet up a non-TTL trigger as follows Measuring Time Averaged Spectrums with External Triggering Set up measurement parametersSaving Trace to 3.5 Disk Confirming Contents of 3.5 Disk FileSaving Trace to Non-Volatile RAM NV-RAM Confirming Contents of NV-RAMRecalling Trace Data From 3.5 Disk or Non-Volatile Memory Recall Trace From 3.5 DiskRecall Trace Data from Non-Volatile RAM NV-RAM Into D2 softkey F2 Generating Output with the Agilent 35670A Plotting and Printing Trace DataEnter a plot title if desired Plotting the DisplayPlot the Trace Check the Plot/Print DestinationPrinting the Display Print over Parallel Interface to Raster DeviceImporting Plots into Microsoft Word Installing the MS Word HP-GL Graphics Import FilterDetermining if MS Word Has HP-GL Graphics Import Filter It should now be an import optionPlot to file P1.HGL Plot to a File Using the Agilent 35670ARunning a Single Calibration Test on Command Returning the Agilent 35670A to a Preset ConditionPrecautions to Prevent Loss of Data Press the Front END CH1 Setup softkey F7 Measuring Acceleration, Displaying DisplacementTransducer Unit Conversion with the Agilent 35670A Specify an averaged measurementConverting Frequency Response Units to Compliance Math Functions and Xdcr Unit ConvertPress the Constant K1-K5 softkey F3 Now display the function F1 on Trace BAgilent 35670A Agilent 35670A Section Measuring a Single Channel Spectrum Section Measuring Frequency Response with the Agilent 35670A

Agilent 35670A specifications

Agilent Technologies Agilent 35670A is a prominent and versatile dynamic signal analyzer designed for various applications in vibration testing, structural analysis, and noise measurement. Engineered to meet the rigorous demands of engineers and researchers, the 35670A is especially valued for its advanced features and functionalities that facilitate detailed analysis and troubleshooting.

One of the primary features of the Agilent 35670A is its ability to perform real-time signal analysis. The instrument is equipped with a powerful processing engine that handles large amounts of data efficiently, providing fast and accurate results. This real-time capability is critical for dynamic testing applications, allowing engineers to monitor and analyze signals as they occur, thereby facilitating quicker decision-making and problem identification.

The Agilent 35670A employs advanced Fast Fourier Transform (FFT) algorithms, which provide high-resolution spectral analysis. This feature is essential for engineers needing to identify frequency components in complex signals, making it particularly useful in the fields of acoustics and mechanical engineering. The analyzer supports various types of measurements, such as magnitude and phase, enabling users to delve deeply into their data.

Another key technology embedded in the Agilent 35670A is its ability to perform multi-channel measurements. The instrument can connect to a variety of external sensors and testing devices, making it a flexible choice for users who need to analyze multiple signals simultaneously. This multi-channel feature is particularly advantageous in automotive testing, aerospace applications, and structural health monitoring.

The device also comes equipped with a user-friendly graphical interface, enhancing the overall user experience. The interface facilitates easy navigation and access to various measurement modes, settings, and data visualizations. Additionally, the Agilent 35670A supports automated measurements, allowing users to save time and reduce human error in repetitive testing scenarios.

Furthermore, the Agilent 35670A offers extensive connectivity options, including GPIB and USB interfaces, making it easy to integrate into existing laboratory setups and automated testing systems. This flexibility ensures that users can adapt the analyzer to their specific needs and workflow processes.

In summary, the Agilent 35670A stands out as a sophisticated dynamic signal analyzer that combines advanced signal processing technologies with user-friendly features. Its real-time analysis, multi-channel capabilities, and extensive connectivity options make it an invaluable tool for professionals in various engineering fields, dedicated to achieving precision in their analyses and solutions.
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