Agilent Technologies Agilent 35670A manual Supplemental Operator’s Guide

Page 2

AGILENT 35670A

Supplemental Operator’s Guide

SECTION 1 : TURNING ON THE AGILENT 35670A

1

SECTION 2 : MEASUREMENT STATE AFTER TURN-ON

2

SECTION 3 : MEASURING WITH TRANSDUCERS

3

USING ICP-TYPETRANSDUCERS WITH THE AGILENT 35670A

3

USING TRANSDUCERS WITH EXTERNAL PREAMPLIFIERS

3

SPECIFYING TRANSDUCER SENSITIVITY AND UNITS

4

SECTION 4 : MEASURING A SINGLE CHANNEL POWER SPECTRUM - DISPLACEMENT

5

SELECTING SINGLE CHANNEL OPERATION

5

SETTING UP TRANSDUCER UNITS FOR DISPLACEMENT

5

SELECTING FREQUENCY SPAN

5

QUANTIFYING POWER SPECTRUM RESULTS

7

SECTION 5 : IMPROVING MEASUREMENT RESULTS

8

FREQUENCY ZOOMING TO INCREASE RESOLUTION

8

MAXIMIZING DYNAMIC RANGE

8

AVERAGING TO REDUCE MEASUREMENT VARIANCE

9

SECTION 6 : MEASURING A SINGLE CHANNEL TIME WAVEFORM

11

SELECTING SINGLE CHANNEL OPERATION

11

SELECTING TIME RECORD LENGTH

12

DISPLAYING TIME WAVEFORMS

12

USING MANUAL ARM TO CAPTURE A SINGLE TIME WAVEFORM

12

EVENT TRIGGERING

13

QUANTIFYING TIME TRACE RESULTS

14

SECTION 7 : MEASURING DUAL CHANNEL SPECTRA

15

PRESETTING THE ANALYZER

15

SELECTING DUAL CHANNEL OPERATION

15

SELECTING FREQUENCY SPAN

15

DISPLAYING DUAL-CHANNELPOWER SPECTRUM MEASUREMENTS

15

USING MARKERS WITH DUAL CHANNEL MEASUREMENTS

16

COUPLED MARKERS

17

COUPLED MARKERS WITH PEAK TRACKING

17

SECTION 8 : IMPROVING DUAL CHANNEL MEASUREMENT RESULTS

18

MAXIMIZING DYNAMIC RANGE

18

DUAL CHANNEL AVERAGING

18

SECTION 9 : MEASURING DUAL CHANNEL TIME WAVEFORMS

20

SELECTING DUAL CHANNEL OPERATION

20

SELECTING TIME RECORD LENGTH

20

DISPLAYING DUAL TIME WAVEFORMS

20

ARMING DUAL CHANNEL TIME MEASUREMENTS

21

TRIGGERING A DUAL-CHANNELTIME MEASUREMENT

21

TRIGGER DELAY

22

USING MARKERS WITH DUAL CHANNEL TIME MEASUREMENTS

23

SECTION 10 : MEASURING DUAL CHANNEL SPECTRA AND TIME WAVEFORMS

23

Page 1 Page 3
Image 2
Page 1 Page 3
Contents Print Date December David ForrestSeattle Sound and Vibration, inc ÃSeattle Sound and Vibration, incAgilent 35670A Supplemental Operator’s GuideHammer Test Setup Without a Force Transducer Recalling Trace Data from 3.5 Disk or NON-VOLATILE Memory Turning On the Agilent 35670A Typical Display After Turn-on SequenceMeasurement State After Turn-on WindowTo set up Channel 2 for an ICP transducer Using ICP-Type Transducers with the Agilent 35670ATo set up Channel 1 for an ICP-type transducer Using Transducers with External PreamplifiersSpecifying Transducer Sensitivity and Units Press Xdcr Unit CH2 Setup softkey F8Press Xdcr Unit CH1 Setup softkey F8 Selecting Single Channel Operation Measuring a Single Channel Power Spectrum DisplacementSetting Up Transducer Units for Displacement Selecting Frequency SpanTo automatically scale the display to fit the data Quantifying Power Spectrum Results CH4To set a new, lower span Frequency Zooming to Increase ResolutionImproving Measurement Results To return to baseband measurementsAveraging to Reduce Measurement Variance Enter softkey F1AVG Then set the instrument mode to single channel as above Measuring a Single Channel Time WaveformDisplaying Time Waveforms Using Manual Arm to Capture a Single Time WaveformSelecting Time Record Length Then to arm a single time recordAnalyzer should show in highlighted text above the trace Event TriggeringTo start the data acquisition Quantifying Time Trace Results CH4Measuring Dual Channel Spectra Presetting the AnalyzerDisplaying Dual-Channel Power Spectrum Measurements Selecting Dual Channel OperationUsing Markers with Dual Channel Measurements To acquire dual channel spectraCoupled Markers Coupled Markers with Peak TrackingDual Channel Averaging To set up the same fixed range on all channelsImproving Dual Channel Measurement Results Avg Type RMS Number Displaying Dual Time Waveforms Measuring Dual Channel Time WaveformsThis always returns the analyzer to dual-channel operation Arming Dual Channel Time Measurements Triggering a Dual-Channel Time MeasurementTrigger Delay FFTUsing Markers with Dual Channel Time Measurements Measuring Dual Channel Spectra and Time Waveforms0Hz CH2 Pwr Spec X60 Y88.5405 mVrms 100 MVrms LogMag UVrms Wait for the analyzer to finish its preset routine Modal Testing Using a Hammer and AccelerometerSetting Up the Transducer Parameters Set up the force transducer parameters as followsChoosing a Preliminary Frequency Span Setting Up Input RangeUse CH* Auto UP only as the autorange routine as follows Specifying Trigger ParametersPress the Windowed Time CH 1 softkey F5 Setting Up Time DisplaysNow to check that the trigger parameters are correct Press the Windowed Time CH 2 softkey F5Using Force/Response Windows FFTDisplaying Hammer Test Results Press the Force Expo Setup softkey F6To view the effects of theForce/Response window AveragingTo start taking measurements FFTDelay = 01.T ForceWidth = T ExponentialDecay = T Changing Frequency SpanHammer Test Setup Without a Force Transducer Setting Up the Hammer Test Without a Force TransducerPrepare the order results list as follows Order Domain Results in List ModePrepare the order display as follows To start taking measurements Displaying Dual-Channel Spectra Compared with Recalled Data Comparing Two-Channel Real-Time Spectra with Recalled DataSelecting Measurement Parameters Press the UPPR/LOWR FRNT/BACK softkey F5Into D1 softkey F1 Recalling the Spectra from DiskRecalling the Spectra from Non-Volatile RAM Into D2 softkey F2Scaling the Displays Press the Y PER DIV Decades softkey F6Using Markers to Compare Waterfall Spectra at Time Intervals Setting Up the Waterfall DisplayContinuing to set up a waterfall display Press the PWR Spec Channel 1 softkey F3Setting Up Time Step Arm Using Slice Markers with Waterfall DataPress the Save and Disp Data softkey F5 Then specify the total number of spectra to be collectedPress the Waterfall Markers softkey F5 Waterfall Spectra at RPM Intervals Setting Up the TachometerThis starts the measurement when 1000 RPM Specifying the Start RPMStarting and Pausing a Measurement Scaling the DisplayProperly Scaled, RPM Triggered Waterfall Display Two-Channel Absolute and Differential Amplitude Measurement Accelerometer PolaritySet up triggering on Channel 1 to 5% of range Measuring Amplitudes, Differential Amplitude, and PhaseFor accelerometers with the same polarity Set up the Agilent 35670AUsing a Math Function to Measure Differential Motion For accelerometers with opposite polarityPut the math function of the differential motion in Trace c Set up displaySet up trace coordinates as peak-to-peak mil Press the PWR Spec Channel 2 softkey F3Start measurement Set up the shaker Measuring Frequency Response Using Impact ExcitationMeasuring Frequency Response Using Broadband Excitation Measuring Frequency Response with the Agilent 35670AEnter Channel 1 input parameters Preset the Agilent 35670AConnect the transducers Enter Channel 2 input parametersPress the Freq Resp 2 / 1 softkey F6 Set up display parametersSupplemental Operator’s Guide Choose measurement parameters Set up the trigger Viewing Frequency Response Results with a Nyquist DiagramViewing Results Using Real and Imaginary Traces Assessing Measurement Quality Two Spectral Traces Showing Mils and Ips while EU is G Set up transducer parameters for a 10 mV/g accelerometerSet up Trace B to measure velocity in inch/s 0-pk MV/EU softkey F2Agilent 35670A Specify measurement parameters Set up display format to measure peak amplitudePeak Hold During a Machine Run-up and Coast-Down When the run-up and run-down is completed Press the yellow Pause/Cont hardkey and examine resultsCharacterizing the External Trigger Using an External Trigger for Time AveragingSpecify User Levels for Triggering Press the Unfilterd Time CH 1 softkey F6Set up a non-TTL trigger as follows Characterize the Trigger SignalSetting Up External Trigger Set up measurement parameters Measuring Time Averaged Spectrums with External TriggeringConfirming Contents of 3.5 Disk File Saving Trace to 3.5 DiskConfirming Contents of NV-RAM Saving Trace to Non-Volatile RAM NV-RAMRecall Trace Data from Non-Volatile RAM NV-RAM Recalling Trace Data From 3.5 Disk or Non-Volatile MemoryRecall Trace From 3.5 Disk Into D2 softkey F2 Enter a plot title if desired Plotting and Printing Trace DataGenerating Output with the Agilent 35670A Plotting the DisplayPrinting the Display Check the Plot/Print DestinationPlot the Trace Print over Parallel Interface to Raster DeviceDetermining if MS Word Has HP-GL Graphics Import Filter Installing the MS Word HP-GL Graphics Import FilterImporting Plots into Microsoft Word It should now be an import optionPlot to a File Using the Agilent 35670A Plot to file P1.HGLPrecautions to Prevent Loss of Data Running a Single Calibration Test on CommandReturning the Agilent 35670A to a Preset Condition Transducer Unit Conversion with the Agilent 35670A Measuring Acceleration, Displaying DisplacementPress the Front END CH1 Setup softkey F7 Specify an averaged measurementMath Functions and Xdcr Unit Convert Converting Frequency Response Units to ComplianceNow display the function F1 on Trace B Press the Constant K1-K5 softkey F3Agilent 35670A Agilent 35670A Section Measuring a Single Channel Spectrum Section Measuring Frequency Response with the Agilent 35670A

Agilent 35670A specifications

Agilent Technologies Agilent 35670A is a prominent and versatile dynamic signal analyzer designed for various applications in vibration testing, structural analysis, and noise measurement. Engineered to meet the rigorous demands of engineers and researchers, the 35670A is especially valued for its advanced features and functionalities that facilitate detailed analysis and troubleshooting.

One of the primary features of the Agilent 35670A is its ability to perform real-time signal analysis. The instrument is equipped with a powerful processing engine that handles large amounts of data efficiently, providing fast and accurate results. This real-time capability is critical for dynamic testing applications, allowing engineers to monitor and analyze signals as they occur, thereby facilitating quicker decision-making and problem identification.

The Agilent 35670A employs advanced Fast Fourier Transform (FFT) algorithms, which provide high-resolution spectral analysis. This feature is essential for engineers needing to identify frequency components in complex signals, making it particularly useful in the fields of acoustics and mechanical engineering. The analyzer supports various types of measurements, such as magnitude and phase, enabling users to delve deeply into their data.

Another key technology embedded in the Agilent 35670A is its ability to perform multi-channel measurements. The instrument can connect to a variety of external sensors and testing devices, making it a flexible choice for users who need to analyze multiple signals simultaneously. This multi-channel feature is particularly advantageous in automotive testing, aerospace applications, and structural health monitoring.

The device also comes equipped with a user-friendly graphical interface, enhancing the overall user experience. The interface facilitates easy navigation and access to various measurement modes, settings, and data visualizations. Additionally, the Agilent 35670A supports automated measurements, allowing users to save time and reduce human error in repetitive testing scenarios.

Furthermore, the Agilent 35670A offers extensive connectivity options, including GPIB and USB interfaces, making it easy to integrate into existing laboratory setups and automated testing systems. This flexibility ensures that users can adapt the analyzer to their specific needs and workflow processes.

In summary, the Agilent 35670A stands out as a sophisticated dynamic signal analyzer that combines advanced signal processing technologies with user-friendly features. Its real-time analysis, multi-channel capabilities, and extensive connectivity options make it an invaluable tool for professionals in various engineering fields, dedicated to achieving precision in their analyses and solutions.
Top Page Image Contents