Agilent Technologies Agilent 35670A manual Recalling the Spectra from Disk, Into D1 softkey F1

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AGILENT 35670A

Supplemental Operator’s Guide

•Press the [MORE CHOICES] softkey (F9).

•Press the [DATA REGISTER] softkey (F8).

•Press the [D2] softkey (F2).

Recalling the Spectra from Disk

Use data registers D1 and D2 to contain the spectra used for comparison. D1 is compared to Channel 1 real-time data, and D2 is compared to Channel 2 real-time data. Comparison data must either be measured, then stored into data registers D1 and D2, or recalled into registers D1 and D2 from disk or non-volatile RAM. For instructions on how to store spectra to disk, see the section “Storing Data to a Disk File.” For instructions on how to store spectra to data registers, see the section “Storing Data in Data Registers.”

For this section, the comparison data is assumed to be stored in the disk file

“COMPARE1.DAT” and “COMPARE2.DAT.” To recall these spectra into D1 and D2, respectively, follow these steps:

•Insert the 3.5” disk containing the files “COMPARE1.DAT” and “COMPARE2.DAT.”

•Press the [Save/Recall] hardkey.

•Press the [RECALL DATA] softkey (F4).

•

Press the

[RCL TRACE

AND SCALE] softkey (F1).

•

Press the

[FROM FILE

INTO D1] softkey (F1).

•Press the [CLEAR ENTRY] softkey (F9).

•Enter COMPARE1.DAT and press the [ENTER] softkey (F1).

Data from the file “COMPARE1.DAT” now appears in data register D1. Next, recall “COMPARE2.DAT” into dataregister D2 as follows:

•Press the [Save/Recall] hardkey.

•Press the [RECALL DATA] softkey (F4).

•

Press the

[RCL TRACE

AND SCALE] softkey (F1).

•

Press the

[FROM FILE

INTO D2] softkey (F2).

•Press the [CLEAR ENTRY] softkey (F9).

•Enter COMPARE2.DAT and press the [ENTER] softkey (F1).

Recalling the Spectra from Non-Volatile RAM

The comparison data files “COMPARE1.DAT” and “COMPARE2.DAT” are stored in the non-volatile RAM. To recall these spectra into D1 and D2, respectively, follow these steps:

•Press the [Save/Recall] hardkey.

•Press the [DEFAULT DISK] softkey (F9).

•Press the [NON VOL RAM DISK] softkey (F1).

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Contents David Forrest Seattle Sound and Vibration, incPrint Date December ÃSeattle Sound and Vibration, incAgilent 35670A Supplemental Operator’s GuideHammer Test Setup Without a Force Transducer Recalling Trace Data from 3.5 Disk or NON-VOLATILE Memory Turning On the Agilent 35670A Typical Display After Turn-on SequenceMeasurement State After Turn-on WindowUsing ICP-Type Transducers with the Agilent 35670A To set up Channel 1 for an ICP-type transducerTo set up Channel 2 for an ICP transducer Using Transducers with External PreamplifiersPress Xdcr Unit CH1 Setup softkey F8 Press Xdcr Unit CH2 Setup softkey F8Specifying Transducer Sensitivity and Units Measuring a Single Channel Power Spectrum Displacement Setting Up Transducer Units for DisplacementSelecting Single Channel Operation Selecting Frequency SpanTo automatically scale the display to fit the data Quantifying Power Spectrum Results CH4Frequency Zooming to Increase Resolution Improving Measurement ResultsTo set a new, lower span To return to baseband measurementsAveraging to Reduce Measurement Variance Enter softkey F1AVG Then set the instrument mode to single channel as above Measuring a Single Channel Time WaveformUsing Manual Arm to Capture a Single Time Waveform Selecting Time Record LengthDisplaying Time Waveforms Then to arm a single time recordTo start the data acquisition Event TriggeringAnalyzer should show in highlighted text above the trace Quantifying Time Trace Results CH4Presetting the Analyzer Displaying Dual-Channel Power Spectrum MeasurementsMeasuring Dual Channel Spectra Selecting Dual Channel OperationUsing Markers with Dual Channel Measurements To acquire dual channel spectraCoupled Markers Coupled Markers with Peak TrackingImproving Dual Channel Measurement Results To set up the same fixed range on all channelsDual Channel Averaging Avg Type RMS Number This always returns the analyzer to dual-channel operation Measuring Dual Channel Time WaveformsDisplaying Dual Time Waveforms Arming Dual Channel Time Measurements Triggering a Dual-Channel Time MeasurementTrigger Delay FFTUsing Markers with Dual Channel Time Measurements Measuring Dual Channel Spectra and Time Waveforms0Hz CH2 Pwr Spec X60 Y88.5405 mVrms 100 MVrms LogMag UVrms Modal Testing Using a Hammer and Accelerometer Setting Up the Transducer ParametersWait for the analyzer to finish its preset routine Set up the force transducer parameters as followsSetting Up Input Range Use CH* Auto UP only as the autorange routine as followsChoosing a Preliminary Frequency Span Specifying Trigger ParametersSetting Up Time Displays Now to check that the trigger parameters are correctPress the Windowed Time CH 1 softkey F5 Press the Windowed Time CH 2 softkey F5Using Force/Response Windows FFTPress the Force Expo Setup softkey F6 To view the effects of theForce/Response windowDisplaying Hammer Test Results AveragingTo start taking measurements FFTDelay = 01.T ForceWidth = T ExponentialDecay = T Changing Frequency SpanHammer Test Setup Without a Force Transducer Setting Up the Hammer Test Without a Force TransducerPrepare the order display as follows Order Domain Results in List ModePrepare the order results list as follows To start taking measurements Comparing Two-Channel Real-Time Spectra with Recalled Data Selecting Measurement ParametersDisplaying Dual-Channel Spectra Compared with Recalled Data Press the UPPR/LOWR FRNT/BACK softkey F5Recalling the Spectra from Disk Recalling the Spectra from Non-Volatile RAMInto D1 softkey F1 Into D2 softkey F2Scaling the Displays Press the Y PER DIV Decades softkey F6Using Markers to Compare Setting Up the Waterfall Display Continuing to set up a waterfall displayWaterfall Spectra at Time Intervals Press the PWR Spec Channel 1 softkey F3Setting Up Time Step Arm Using Slice Markers with Waterfall DataPress the Waterfall Markers softkey F5 Then specify the total number of spectra to be collectedPress the Save and Disp Data softkey F5 Setting Up the Tachometer This starts the measurement when 1000 RPMWaterfall Spectra at RPM Intervals Specifying the Start RPMStarting and Pausing a Measurement Scaling the DisplayProperly Scaled, RPM Triggered Waterfall Display Two-Channel Absolute and Differential Amplitude Measurement Accelerometer PolaritySet up triggering on Channel 1 to 5% of range Measuring Amplitudes, Differential Amplitude, and PhaseSet up the Agilent 35670A Using a Math Function to Measure Differential MotionFor accelerometers with the same polarity For accelerometers with opposite polaritySet up display Set up trace coordinates as peak-to-peak milPut the math function of the differential motion in Trace c Press the PWR Spec Channel 2 softkey F3Start measurement Measuring Frequency Response Using Impact Excitation Measuring Frequency Response Using Broadband ExcitationSet up the shaker Measuring Frequency Response with the Agilent 35670APreset the Agilent 35670A Connect the transducersEnter Channel 1 input parameters Enter Channel 2 input parametersSupplemental Operator’s Guide Choose measurement parameters Set up display parametersPress the Freq Resp 2 / 1 softkey F6 Set up the trigger Viewing Frequency Response Results with a Nyquist DiagramViewing Results Using Real and Imaginary Traces Assessing Measurement Quality Set up transducer parameters for a 10 mV/g accelerometer Set up Trace B to measure velocity in inch/s 0-pkTwo Spectral Traces Showing Mils and Ips while EU is G MV/EU softkey F2Agilent 35670A Peak Hold During a Machine Run-up and Coast-Down Set up display format to measure peak amplitudeSpecify measurement parameters When the run-up and run-down is completed Press the yellow Pause/Cont hardkey and examine resultsUsing an External Trigger for Time Averaging Specify User Levels for TriggeringCharacterizing the External Trigger Press the Unfilterd Time CH 1 softkey F6Setting Up External Trigger Characterize the Trigger SignalSet up a non-TTL trigger as follows Set up measurement parameters Measuring Time Averaged Spectrums with External TriggeringConfirming Contents of 3.5 Disk File Saving Trace to 3.5 DiskConfirming Contents of NV-RAM Saving Trace to Non-Volatile RAM NV-RAMRecall Trace From 3.5 Disk Recalling Trace Data From 3.5 Disk or Non-Volatile MemoryRecall Trace Data from Non-Volatile RAM NV-RAM Into D2 softkey F2 Plotting and Printing Trace Data Generating Output with the Agilent 35670AEnter a plot title if desired Plotting the DisplayCheck the Plot/Print Destination Plot the TracePrinting the Display Print over Parallel Interface to Raster DeviceInstalling the MS Word HP-GL Graphics Import Filter Importing Plots into Microsoft WordDetermining if MS Word Has HP-GL Graphics Import Filter It should now be an import optionPlot to a File Using the Agilent 35670A Plot to file P1.HGLReturning the Agilent 35670A to a Preset Condition Running a Single Calibration Test on CommandPrecautions to Prevent Loss of Data Measuring Acceleration, Displaying Displacement Press the Front END CH1 Setup softkey F7Transducer Unit Conversion with the Agilent 35670A Specify an averaged measurementMath Functions and Xdcr Unit Convert Converting Frequency Response Units to ComplianceNow display the function F1 on Trace B Press the Constant K1-K5 softkey F3Agilent 35670A Agilent 35670A Section Measuring a Single Channel Spectrum Section Measuring Frequency Response with the Agilent 35670A

Agilent 35670A specifications

Agilent Technologies Agilent 35670A is a prominent and versatile dynamic signal analyzer designed for various applications in vibration testing, structural analysis, and noise measurement. Engineered to meet the rigorous demands of engineers and researchers, the 35670A is especially valued for its advanced features and functionalities that facilitate detailed analysis and troubleshooting.

One of the primary features of the Agilent 35670A is its ability to perform real-time signal analysis. The instrument is equipped with a powerful processing engine that handles large amounts of data efficiently, providing fast and accurate results. This real-time capability is critical for dynamic testing applications, allowing engineers to monitor and analyze signals as they occur, thereby facilitating quicker decision-making and problem identification.

The Agilent 35670A employs advanced Fast Fourier Transform (FFT) algorithms, which provide high-resolution spectral analysis. This feature is essential for engineers needing to identify frequency components in complex signals, making it particularly useful in the fields of acoustics and mechanical engineering. The analyzer supports various types of measurements, such as magnitude and phase, enabling users to delve deeply into their data.

Another key technology embedded in the Agilent 35670A is its ability to perform multi-channel measurements. The instrument can connect to a variety of external sensors and testing devices, making it a flexible choice for users who need to analyze multiple signals simultaneously. This multi-channel feature is particularly advantageous in automotive testing, aerospace applications, and structural health monitoring.

The device also comes equipped with a user-friendly graphical interface, enhancing the overall user experience. The interface facilitates easy navigation and access to various measurement modes, settings, and data visualizations. Additionally, the Agilent 35670A supports automated measurements, allowing users to save time and reduce human error in repetitive testing scenarios.

Furthermore, the Agilent 35670A offers extensive connectivity options, including GPIB and USB interfaces, making it easy to integrate into existing laboratory setups and automated testing systems. This flexibility ensures that users can adapt the analyzer to their specific needs and workflow processes.

In summary, the Agilent 35670A stands out as a sophisticated dynamic signal analyzer that combines advanced signal processing technologies with user-friendly features. Its real-time analysis, multi-channel capabilities, and extensive connectivity options make it an invaluable tool for professionals in various engineering fields, dedicated to achieving precision in their analyses and solutions.
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