Agilent Technologies Agilent 35670A Comparing Two-Channel Real-Time Spectra with Recalled Data

Page 39

AGILENT 35670A

Supplemental Operator’s Guide

Section 14 : Comparing Two-Channel Real-Time Spectra with Recalled Data

Compare two channels of real-time data with spectra stored in registers using the UPPR/LOWR FRNT/BACK display format of the AGILENT 35670A. Note that the real-time data should be measured with the same frequency and resolution as the stored data if valid, direct comparisons are desired.

Preset the analyzer as follows:

•Press the green [Preset] hardkey

•Press [DO PRESET] softkey (F1).

•Press the yellow [Pause/Cont] hardkey if desired.

Selecting Measurement Parameters

Refer to the section entitled “Measuring Dual Channel Spectra” to set up span, ranges, coupling, averaging, and windowing. Transducer parameters set up is described in the section “Measuring with Transducers.”

Displaying Dual-Channel Spectra Compared with Recalled Data

The results of a dual-channel measurement are compared to recalled spectra in data registers via the following steps:

•Press the [Disp Format] hardkey.

•Press the [UPPR/LOWR FRNT/BACK] softkey (F5).

•Press the [Active Trace] hardkey.

•Press the [A] softkey (F1).

•Press the [Meas Data] hardkey.

•

Press the

[CHANNEL 1 2 3 4] softkey (F1) until 1 is highlighted.

•

Press the

[PWR SPEC CHANNEL 1] softkey (F3)

•Press the [Active Trace] hardkey again.

•Press the [B] softkey (F2).

•Press the [Meas Data] hardkey.

•Press the [MORE CHOICES] softkey (F9).

•Press the [DATA REGISTER] softkey (F8).

•Press the [D1] softkey (F1).

•Press the [Active Trace] hardkey.

•Press the [C] softkey (F1).

•Press the [Meas Data] hardkey.

•

Press the

[CHANNEL 1 2 3 4] softkey (F1) until 2 is highlighted.

•

Press the

[PWR SPEC CHANNEL 2] softkey (F3).

•Press the [Active Trace] hardkey again.

•Press the [D] softkey (F2).

•Press the [Meas Data] hardkey.

35

Page 38 Page 40
Image 39
Page 38 Page 40
Contents ÃSeattle Sound and Vibration, inc David ForrestSeattle Sound and Vibration, inc Print Date DecemberSupplemental Operator’s Guide Agilent 35670AHammer Test Setup Without a Force Transducer Recalling Trace Data from 3.5 Disk or NON-VOLATILE Memory Typical Display After Turn-on Sequence Turning On the Agilent 35670AWindow Measurement State After Turn-onUsing Transducers with External Preamplifiers Using ICP-Type Transducers with the Agilent 35670ATo set up Channel 1 for an ICP-type transducer To set up Channel 2 for an ICP transducerPress Xdcr Unit CH2 Setup softkey F8 Press Xdcr Unit CH1 Setup softkey F8Specifying Transducer Sensitivity and Units Selecting Frequency Span Measuring a Single Channel Power Spectrum DisplacementSetting Up Transducer Units for Displacement Selecting Single Channel OperationTo automatically scale the display to fit the data CH4 Quantifying Power Spectrum ResultsTo return to baseband measurements Frequency Zooming to Increase ResolutionImproving Measurement Results To set a new, lower spanEnter softkey F1 Averaging to Reduce Measurement VarianceAVG Measuring a Single Channel Time Waveform Then set the instrument mode to single channel as aboveThen to arm a single time record Using Manual Arm to Capture a Single Time WaveformSelecting Time Record Length Displaying Time WaveformsEvent Triggering To start the data acquisitionAnalyzer should show in highlighted text above the trace CH4 Quantifying Time Trace ResultsSelecting Dual Channel Operation Presetting the AnalyzerDisplaying Dual-Channel Power Spectrum Measurements Measuring Dual Channel SpectraTo acquire dual channel spectra Using Markers with Dual Channel MeasurementsCoupled Markers with Peak Tracking Coupled MarkersTo set up the same fixed range on all channels Improving Dual Channel Measurement ResultsDual Channel Averaging Avg Type RMS Number Measuring Dual Channel Time Waveforms This always returns the analyzer to dual-channel operationDisplaying Dual Time Waveforms Triggering a Dual-Channel Time Measurement Arming Dual Channel Time MeasurementsFFT Trigger DelayMeasuring Dual Channel Spectra and Time Waveforms Using Markers with Dual Channel Time Measurements0Hz CH2 Pwr Spec X60 Y88.5405 mVrms 100 MVrms LogMag UVrms Set up the force transducer parameters as follows Modal Testing Using a Hammer and AccelerometerSetting Up the Transducer Parameters Wait for the analyzer to finish its preset routineSpecifying Trigger Parameters Setting Up Input RangeUse CH* Auto UP only as the autorange routine as follows Choosing a Preliminary Frequency SpanPress the Windowed Time CH 2 softkey F5 Setting Up Time DisplaysNow to check that the trigger parameters are correct Press the Windowed Time CH 1 softkey F5FFT Using Force/Response WindowsAveraging Press the Force Expo Setup softkey F6To view the effects of theForce/Response window Displaying Hammer Test ResultsFFT To start taking measurementsChanging Frequency Span Delay = 01.T ForceWidth = T ExponentialDecay = TSetting Up the Hammer Test Without a Force Transducer Hammer Test Setup Without a Force TransducerOrder Domain Results in List Mode Prepare the order display as followsPrepare the order results list as follows To start taking measurements Press the UPPR/LOWR FRNT/BACK softkey F5 Comparing Two-Channel Real-Time Spectra with Recalled DataSelecting Measurement Parameters Displaying Dual-Channel Spectra Compared with Recalled DataInto D2 softkey F2 Recalling the Spectra from DiskRecalling the Spectra from Non-Volatile RAM Into D1 softkey F1Press the Y PER DIV Decades softkey F6 Scaling the DisplaysUsing Markers to Compare Press the PWR Spec Channel 1 softkey F3 Setting Up the Waterfall DisplayContinuing to set up a waterfall display Waterfall Spectra at Time IntervalsUsing Slice Markers with Waterfall Data Setting Up Time Step ArmThen specify the total number of spectra to be collected Press the Waterfall Markers softkey F5Press the Save and Disp Data softkey F5 Specifying the Start RPM Setting Up the TachometerThis starts the measurement when 1000 RPM Waterfall Spectra at RPM IntervalsScaling the Display Starting and Pausing a MeasurementProperly Scaled, RPM Triggered Waterfall Display Accelerometer Polarity Two-Channel Absolute and Differential Amplitude MeasurementMeasuring Amplitudes, Differential Amplitude, and Phase Set up triggering on Channel 1 to 5% of rangeFor accelerometers with opposite polarity Set up the Agilent 35670AUsing a Math Function to Measure Differential Motion For accelerometers with the same polarityPress the PWR Spec Channel 2 softkey F3 Set up displaySet up trace coordinates as peak-to-peak mil Put the math function of the differential motion in Trace cStart measurement Measuring Frequency Response with the Agilent 35670A Measuring Frequency Response Using Impact ExcitationMeasuring Frequency Response Using Broadband Excitation Set up the shakerEnter Channel 2 input parameters Preset the Agilent 35670AConnect the transducers Enter Channel 1 input parametersSet up display parameters Supplemental Operator’s Guide Choose measurement parametersPress the Freq Resp 2 / 1 softkey F6 Viewing Frequency Response Results with a Nyquist Diagram Set up the triggerViewing Results Using Real and Imaginary Traces Assessing Measurement Quality MV/EU softkey F2 Set up transducer parameters for a 10 mV/g accelerometerSet up Trace B to measure velocity in inch/s 0-pk Two Spectral Traces Showing Mils and Ips while EU is GAgilent 35670A Set up display format to measure peak amplitude Peak Hold During a Machine Run-up and Coast-DownSpecify measurement parameters Press the yellow Pause/Cont hardkey and examine results When the run-up and run-down is completedPress the Unfilterd Time CH 1 softkey F6 Using an External Trigger for Time AveragingSpecify User Levels for Triggering Characterizing the External TriggerCharacterize the Trigger Signal Setting Up External TriggerSet up a non-TTL trigger as follows Measuring Time Averaged Spectrums with External Triggering Set up measurement parametersSaving Trace to 3.5 Disk Confirming Contents of 3.5 Disk FileSaving Trace to Non-Volatile RAM NV-RAM Confirming Contents of NV-RAMRecalling Trace Data From 3.5 Disk or Non-Volatile Memory Recall Trace From 3.5 DiskRecall Trace Data from Non-Volatile RAM NV-RAM Into D2 softkey F2 Plotting the Display Plotting and Printing Trace DataGenerating Output with the Agilent 35670A Enter a plot title if desiredPrint over Parallel Interface to Raster Device Check the Plot/Print DestinationPlot the Trace Printing the DisplayIt should now be an import option Installing the MS Word HP-GL Graphics Import FilterImporting Plots into Microsoft Word Determining if MS Word Has HP-GL Graphics Import FilterPlot to file P1.HGL Plot to a File Using the Agilent 35670ARunning a Single Calibration Test on Command Returning the Agilent 35670A to a Preset ConditionPrecautions to Prevent Loss of Data Specify an averaged measurement Measuring Acceleration, Displaying DisplacementPress the Front END CH1 Setup softkey F7 Transducer Unit Conversion with the Agilent 35670AConverting Frequency Response Units to Compliance Math Functions and Xdcr Unit ConvertPress the Constant K1-K5 softkey F3 Now display the function F1 on Trace BAgilent 35670A Agilent 35670A Section Measuring a Single Channel Spectrum Section Measuring Frequency Response with the Agilent 35670A

Agilent 35670A specifications

Agilent Technologies Agilent 35670A is a prominent and versatile dynamic signal analyzer designed for various applications in vibration testing, structural analysis, and noise measurement. Engineered to meet the rigorous demands of engineers and researchers, the 35670A is especially valued for its advanced features and functionalities that facilitate detailed analysis and troubleshooting.

One of the primary features of the Agilent 35670A is its ability to perform real-time signal analysis. The instrument is equipped with a powerful processing engine that handles large amounts of data efficiently, providing fast and accurate results. This real-time capability is critical for dynamic testing applications, allowing engineers to monitor and analyze signals as they occur, thereby facilitating quicker decision-making and problem identification.

The Agilent 35670A employs advanced Fast Fourier Transform (FFT) algorithms, which provide high-resolution spectral analysis. This feature is essential for engineers needing to identify frequency components in complex signals, making it particularly useful in the fields of acoustics and mechanical engineering. The analyzer supports various types of measurements, such as magnitude and phase, enabling users to delve deeply into their data.

Another key technology embedded in the Agilent 35670A is its ability to perform multi-channel measurements. The instrument can connect to a variety of external sensors and testing devices, making it a flexible choice for users who need to analyze multiple signals simultaneously. This multi-channel feature is particularly advantageous in automotive testing, aerospace applications, and structural health monitoring.

The device also comes equipped with a user-friendly graphical interface, enhancing the overall user experience. The interface facilitates easy navigation and access to various measurement modes, settings, and data visualizations. Additionally, the Agilent 35670A supports automated measurements, allowing users to save time and reduce human error in repetitive testing scenarios.

Furthermore, the Agilent 35670A offers extensive connectivity options, including GPIB and USB interfaces, making it easy to integrate into existing laboratory setups and automated testing systems. This flexibility ensures that users can adapt the analyzer to their specific needs and workflow processes.

In summary, the Agilent 35670A stands out as a sophisticated dynamic signal analyzer that combines advanced signal processing technologies with user-friendly features. Its real-time analysis, multi-channel capabilities, and extensive connectivity options make it an invaluable tool for professionals in various engineering fields, dedicated to achieving precision in their analyses and solutions.
Top Page Image Contents