Agilent Technologies E4351B, E4350B service manual Table of Contents

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Table of Contents

 

Addendum A - SERVICE MANUAL

1

Foreword

1

Areas of Difference

1

Table of Contents

2

Chapter 1 Differences

3

Chapter 2 Differences

3

Test Equipment Required

3

Measurement Techniques

4

Basic Test Setup

4

Voltage and Current Values

5

Transient Recovery Time

5

CC RMS Noise Measurement Test Setup

5

Performance Test Record

6

Chapter 3 Differences

8

Signature Analysis

8

Self-Test Error Codes/Messages

8

Overall Troubleshooting (sheet 1)

9

Overall Troubleshooting (sheet 2)

10

Overall Troubleshooting (sheet 3)

11

Overall Troubleshooting – sheet 4

12

Overall Troubleshooting (sheet 5)

13

Flow Charts -

13

No Display Troubleshooting

14

OV Will Not Fire Troubleshooting

15

OV at Turn-On Troubleshooting

16

Output Held Low Troubleshooting (sheet 1)

17

Output Held Low Troubleshooting (sheet 2)

18

Output Held High Troubleshooting

19

Initialization and Factory Preset Replacement Program Listing (sheet 1)

20

Initialization and Factory Preset Replacement Program Listing (sheet 2)

21

Initialization and Factory Preset Replacement Program Listing – (sheet 3)

22

Cable and Connector Locations

23

Chapter 4 Differences

25

Digital Signal Processor (DSP) Board

25

Simplified Diagram of DSP Circuits

26

Chapter 5 Differences

27

Chapter 6 Differences

43

Test Points

43

Figure 6-5. A1 Main Board Component Location Coordinates for E4350B

47

Figure 6-5. A1 Main Board Assembly Drawing and Test Points for E4350B

47

Figure 6-5. A1 Main Board Schematic Diagram for E4350B (sheet 1 of 4)

47

Figure 6-5. A1 Main Board Schematic Diagram for E4350B (sheet 2 of 4)

47

Figure 6-5. A1 Main Board Schematic Diagram for E4350B (sheet 3 of 4)

47

Figure 6-5. A1 Main Board Schematic Diagram for E4350B (sheet 4 of 4)

47

Figure 6-6. A4 Left Tunnel Circuit Component Locations for E4350B

47

Figure 6-6. A4A1/A4A3 Left Tunnel Circuit Schematic Diagrams for E4350B

47

Figure 6-7. A4 Right Tunnel Circuit Component Locations for E4350B

47

Figure 6-7. A4A2/A4A4 Right Tunnel Circuit Schematic Diagrams for E4350B

47

Figure 6-10 A5 DSP Board Test Points

47

Figure 6-11 A6 Adapter Board Schematic Diagram

47

Figure 6-12 A7 Phone Adapter Board Component Location and Schematic Diagram

47

2

Service Addendum

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Contents Foreword Areas of DifferenceTable of Contents Firmware Revisions Test Equipment RequiredBasic Test Setup Measurement TechniquesVoltage and Current Values Transient Recovery TimeCC RMS Noise Measurement Test Setup Performance Test Record Load Effect Source Effect Pard Ripple & NoiseCurrent Sink 0.9A Readback Accuracy Pard Ripple & Noise Self-Test Error Codes/Messages Signature AnalysisOverall Troubleshooting sheet Overall Troubleshooting sheet 1Overall Troubleshooting sheet 2 Overall Troubleshooting sheet 3 Overall Troubleshooting sheet 4 Flow Charts OV & OCNo Display Troubleshooting No Display TroubleshootingOV Will Not Fire Troubleshooting OV Will Not Fire StartOV at Turn-On Troubleshooting OV at Turn-On StartOutput Held Low Troubleshooting sheet Output Held Low StartOutput Held Low Troubleshooting Sheet 2 Output Held High Troubleshooting Output Held High StartClear Screen Case Else Next Cable and Connector Locations 18. Cable and Connector Locations for E4350B/E4351BDSP Board Digital Signal Processor DSP Board Simplified Diagram of DSP Circuits DSPChassis -Mechanical Page Page Page Page Mosfet Page Page Page Page STUD-STD-PRS-IN Service Addendum FET Q303 1855-0849 FET Mechanical Test Points Signal Measurement and Conditions A4A1/A4A3 Left Tunnel Boards Figure Adapter Board and Phone Adapter Board Figures 6-11 A1 Main Board Assembly Diagram and Test Points for E4350B A1 Main Board Schematic Diagram for E4350B sheet 1 A1 Main Board Schematic Diagram for E4350B sheet 2 A1 Main Board Schematic Diagram for E4350B sheet 3 A1 Main Board Schematic Diagram for E4350B sheet 4 A4 Left Tunnel Circuit Component Locations for E4350B A4A1/A4A3 Left Tunnel Circuit Schematic Diagram for E4350B A4A2/A4A4 Right Tunnel Circuit Schematic Diagram for E4350B 10. A5 DSP Board Test Points 11. A6 Adapter Board Schematic Diagram

E4351B, E4350B specifications

Agilent Technologies, a leader in electronic measurement, offers a range of advanced solutions, including the E4350B and E4351B switching systems. These models are specifically designed to meet the increasing demands of modern testing environments, providing high reliability and precision for a variety of applications.

The Agilent E4350B is known for its low resistance switching capabilities, making it an ideal choice for applications requiring accurate and repeatable measurements. It supports up to 16 channels of low resistance testing, allowing engineers to simulate complex electrical paths and identify potential issues in circuit designs. With an optional temperature measurement capability, users can monitor the thermal performance of components directly during tests.

On the other hand, the E4351B model enhances flexibility with a modular design, offering an extensive range of input and output configurations. This instrument is particularly well-suited for automated test systems, providing the ability to connect multiple devices and manage them seamlessly. Its high-speed switching technology enables quick toggling between channels, ensuring that large datasets can be acquired swiftly without compromising accuracy.

Both models employ advanced contact technology, which minimizes the potential for signal degradation, ensuring that users receive reliable data with minimal noise interference. This feature is crucial in applications where signal integrity is paramount, such as in research and development or quality assurance processes.

Enhanced user interfaces simplify operations for both novice and experienced technicians. The built-in touchscreen and intuitive navigation allow for easy setup and operation, significantly reducing the learning curve. Furthermore, the comprehensive software support provided by Agilent facilitates integration with various programming environments, allowing for custom test sequences tailored to specific needs.

Moreover, both E4350B and E4351B systems are built with durability in mind. The robust construction ensures long-term reliability, reducing downtime and maintenance costs. This makes them ideal candidates for both laboratory settings and field operations where consistent performance is critical.

In summary, Agilent Technologies’ E4350B and E4351B models are distinguished by their precision, flexibility, and robust performance. Their advanced features and user-friendly design make them suitable for a wide variety of applications, from routine testing to complex R&D projects. By leveraging modern switching technologies, these systems set a high standard for electronic measurement, aiding engineers in developing reliable electronic solutions.