Agilent Technologies E4351B, E4350B service manual No Display Troubleshooting

Page 14

No Display Troubleshooting

"No Display"

Start

Turn on the supply and try to program it from the front panel. While measuring the voltage at the output terminals, program the voltage and current to full scale. Toggle the ON/OFF key while observing the external voltmeter.

No display but output

 

No

 

OK

 

 

?

 

 

Yes

Turn off supply, remove front panel assembly to access circuits on the A3 front panel board. Turn on the supply.

Check 5V bias at R1-6, display voltages: 1.1V at R1-14, 2.2V at R1-2 and 3.3V at R1-16 (meter common at R1-3). See Fig. 6-4.

Check the A2 GPIB board, bias circuits, PCLR (test points 1 - 4 Table 6-3) and cable W9

 

 

 

 

Check A3C1,

Display and bias

 

No

 

 

 

A3R1 and A3RT1.

voltages OK

 

 

 

 

 

 

 

 

 

 

?

 

 

 

 

 

 

 

 

Yes

 

 

Check 10MHz Clock signal at

 

 

A3J2-9. See Fig. 6-9.

 

 

 

 

Yes

 

 

Check A3Y1,

Display and bias

No

A3C3, A3C4 and

voltages OK

 

A3U3.

?

 

 

Program voltage and current fron the front panel. Measure the voltage at the output terminals. In case the output is disabled press the output ON/OFF key while observing the output with an external voltmeter.

A3U3, A3U4 or A3U8

 

 

 

 

 

 

 

 

 

defective. Perform

 

 

 

 

 

 

 

 

 

 

 

No

 

 

Output Voltage present

front panel SA. See

 

 

 

 

 

 

 

 

?

 

 

 

 

 

 

Table 3-4.

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Yes

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

LCD or cable W19 defective.

 

 

 

 

 

 

 

 

 

 

Figure 3-5. No Display Troubleshooting

14

Service Addendum

Image 14
Contents Foreword Areas of DifferenceTable of Contents Firmware Revisions Test Equipment RequiredBasic Test Setup Measurement TechniquesVoltage and Current Values Transient Recovery TimeCC RMS Noise Measurement Test Setup Performance Test Record Load Effect Source Effect Pard Ripple & NoiseCurrent Sink 0.9A Readback Accuracy Pard Ripple & Noise Self-Test Error Codes/Messages Signature AnalysisOverall Troubleshooting sheet Overall Troubleshooting sheet 1Overall Troubleshooting sheet 2 Overall Troubleshooting sheet 3 Overall Troubleshooting sheet 4 Flow Charts OV & OCNo Display Troubleshooting No Display TroubleshootingOV Will Not Fire Troubleshooting OV Will Not Fire StartOV at Turn-On Troubleshooting OV at Turn-On StartOutput Held Low Troubleshooting sheet Output Held Low StartOutput Held Low Troubleshooting Sheet 2 Output Held High Troubleshooting Output Held High StartClear Screen Case Else Next Cable and Connector Locations 18. Cable and Connector Locations for E4350B/E4351BDSP Board Digital Signal Processor DSP Board Simplified Diagram of DSP Circuits DSPChassis -Mechanical Page Page Page Page Mosfet Page Page Page Page STUD-STD-PRS-IN Service Addendum FET Q303 1855-0849 FET Mechanical Test Points Signal Measurement and Conditions A4A1/A4A3 Left Tunnel Boards Figure Adapter Board and Phone Adapter Board Figures 6-11 A1 Main Board Assembly Diagram and Test Points for E4350B A1 Main Board Schematic Diagram for E4350B sheet 1 A1 Main Board Schematic Diagram for E4350B sheet 2 A1 Main Board Schematic Diagram for E4350B sheet 3 A1 Main Board Schematic Diagram for E4350B sheet 4 A4 Left Tunnel Circuit Component Locations for E4350B A4A1/A4A3 Left Tunnel Circuit Schematic Diagram for E4350B A4A2/A4A4 Right Tunnel Circuit Schematic Diagram for E4350B 10. A5 DSP Board Test Points 11. A6 Adapter Board Schematic Diagram

E4351B, E4350B specifications

Agilent Technologies, a leader in electronic measurement, offers a range of advanced solutions, including the E4350B and E4351B switching systems. These models are specifically designed to meet the increasing demands of modern testing environments, providing high reliability and precision for a variety of applications.

The Agilent E4350B is known for its low resistance switching capabilities, making it an ideal choice for applications requiring accurate and repeatable measurements. It supports up to 16 channels of low resistance testing, allowing engineers to simulate complex electrical paths and identify potential issues in circuit designs. With an optional temperature measurement capability, users can monitor the thermal performance of components directly during tests.

On the other hand, the E4351B model enhances flexibility with a modular design, offering an extensive range of input and output configurations. This instrument is particularly well-suited for automated test systems, providing the ability to connect multiple devices and manage them seamlessly. Its high-speed switching technology enables quick toggling between channels, ensuring that large datasets can be acquired swiftly without compromising accuracy.

Both models employ advanced contact technology, which minimizes the potential for signal degradation, ensuring that users receive reliable data with minimal noise interference. This feature is crucial in applications where signal integrity is paramount, such as in research and development or quality assurance processes.

Enhanced user interfaces simplify operations for both novice and experienced technicians. The built-in touchscreen and intuitive navigation allow for easy setup and operation, significantly reducing the learning curve. Furthermore, the comprehensive software support provided by Agilent facilitates integration with various programming environments, allowing for custom test sequences tailored to specific needs.

Moreover, both E4350B and E4351B systems are built with durability in mind. The robust construction ensures long-term reliability, reducing downtime and maintenance costs. This makes them ideal candidates for both laboratory settings and field operations where consistent performance is critical.

In summary, Agilent Technologies’ E4350B and E4351B models are distinguished by their precision, flexibility, and robust performance. Their advanced features and user-friendly design make them suitable for a wide variety of applications, from routine testing to complex R&D projects. By leveraging modern switching technologies, these systems set a high standard for electronic measurement, aiding engineers in developing reliable electronic solutions.