Agilent Technologies E4350B, E4351B service manual

Page 31

Table 5-7. Parts List for Main PC Board Assembly A1(Continued)

Reference

 

 

 

Designator

Model

Part Number

Description

C722

E4351B

0180-4311

Capacitor1200UF 250V

C722

E4350B

0180-4263

Capacitor 4000uF 125V

C723

 

0160-0168

Capacitor .1uF 10%

C724

 

0160-5422

Capacitor .047 uF 20%

C725

E4350B

0160-5422

Capacitor .047 uF 20%

CR700

 

5060-3376

SCR/Diode Assembly

D401

 

1901-0033

Diode

D402

 

1901-0033

Diode

D403

 

1901-0033

Diode

D404

 

1901-0033

Diode

D405

 

1901-0033

Diode

D406

 

1901-1128

Diode

D407

 

1901-1128

Diode

D408

 

1901-0033

Diode

D409

 

1901-0033

Diode

D410

 

1901-1098

Diode

D411

 

1901-1098

Diode

D413

 

1901-1098

Diode

D415

 

1901-0518

Diode

D416

 

1901-0050

Diode

D417

 

1901-0050

Diode

D418

 

1901-0033

Diode

D419

 

1901-1098

Diode

D420

 

1901-1098

Diode

D421

 

1901-1098

Diode

D422

 

1901-0050

Diode

D423

 

1901-0050

Diode

D424

 

1901-1098

Diode

D425

 

1901-1098

Diode

D426

 

1901-0050

Diode

D427

 

1901-0050

Diode

D428

 

1901-0731

Diode

D429

 

1901-0731

Diode

D430

 

1901-0050

Diode

D431

 

1901-0050

Diode

D601

 

1901-0050

Diode

D602

 

1901-0050

Diode

D603

 

1901-0050

Diode

D604

 

1901-0050

Diode

D605

 

1901-0050

Diode

D606

 

1901-0731

Diode

D607

 

1901-0050

Diode

D608

 

1901-0050

Diode

D609

 

1901-1214

Diode

D700

 

1901-1098

Diode

D701

 

1901-1098

Diode

D702

 

1901-0719

Diode

D703

 

1901-0719

Diode

D704

 

1901-0719

Diode

D705

 

1901-0719

Diode

 

 

 

 

Service Addendum

31

Image 31
Contents Areas of Difference ForewordTable of Contents Test Equipment Required Firmware RevisionsMeasurement Techniques Basic Test SetupCC RMS Noise Measurement Test Setup Transient Recovery TimeVoltage and Current Values Load Effect Source Effect Pard Ripple & Noise Performance Test RecordCurrent Sink 0.9A Readback Accuracy Pard Ripple & Noise Signature Analysis Self-Test Error Codes/MessagesOverall Troubleshooting sheet 1 Overall Troubleshooting sheetOverall Troubleshooting sheet 2 Overall Troubleshooting sheet 3 Overall Troubleshooting sheet 4 OV & OC Flow ChartsNo Display Troubleshooting No Display TroubleshootingOV Will Not Fire Start OV Will Not Fire TroubleshootingOV at Turn-On Start OV at Turn-On TroubleshootingOutput Held Low Start Output Held Low Troubleshooting sheetOutput Held Low Troubleshooting Sheet 2 Output Held High Start Output Held High TroubleshootingClear Screen Case Else Next 18. Cable and Connector Locations for E4350B/E4351B Cable and Connector LocationsDSP Board Digital Signal Processor DSP Board DSP Simplified Diagram of DSP CircuitsChassis -Mechanical Page Page Page Page Mosfet Page Page Page Page STUD-STD-PRS-IN Service Addendum FET Q303 1855-0849 FET Mechanical Test Points Signal Measurement and Conditions A4A1/A4A3 Left Tunnel Boards Figure Adapter Board and Phone Adapter Board Figures 6-11 A1 Main Board Assembly Diagram and Test Points for E4350B A1 Main Board Schematic Diagram for E4350B sheet 1 A1 Main Board Schematic Diagram for E4350B sheet 2 A1 Main Board Schematic Diagram for E4350B sheet 3 A1 Main Board Schematic Diagram for E4350B sheet 4 A4 Left Tunnel Circuit Component Locations for E4350B A4A1/A4A3 Left Tunnel Circuit Schematic Diagram for E4350B A4A2/A4A4 Right Tunnel Circuit Schematic Diagram for E4350B 10. A5 DSP Board Test Points 11. A6 Adapter Board Schematic Diagram

E4351B, E4350B specifications

Agilent Technologies, a leader in electronic measurement, offers a range of advanced solutions, including the E4350B and E4351B switching systems. These models are specifically designed to meet the increasing demands of modern testing environments, providing high reliability and precision for a variety of applications.

The Agilent E4350B is known for its low resistance switching capabilities, making it an ideal choice for applications requiring accurate and repeatable measurements. It supports up to 16 channels of low resistance testing, allowing engineers to simulate complex electrical paths and identify potential issues in circuit designs. With an optional temperature measurement capability, users can monitor the thermal performance of components directly during tests.

On the other hand, the E4351B model enhances flexibility with a modular design, offering an extensive range of input and output configurations. This instrument is particularly well-suited for automated test systems, providing the ability to connect multiple devices and manage them seamlessly. Its high-speed switching technology enables quick toggling between channels, ensuring that large datasets can be acquired swiftly without compromising accuracy.

Both models employ advanced contact technology, which minimizes the potential for signal degradation, ensuring that users receive reliable data with minimal noise interference. This feature is crucial in applications where signal integrity is paramount, such as in research and development or quality assurance processes.

Enhanced user interfaces simplify operations for both novice and experienced technicians. The built-in touchscreen and intuitive navigation allow for easy setup and operation, significantly reducing the learning curve. Furthermore, the comprehensive software support provided by Agilent facilitates integration with various programming environments, allowing for custom test sequences tailored to specific needs.

Moreover, both E4350B and E4351B systems are built with durability in mind. The robust construction ensures long-term reliability, reducing downtime and maintenance costs. This makes them ideal candidates for both laboratory settings and field operations where consistent performance is critical.

In summary, Agilent Technologies’ E4350B and E4351B models are distinguished by their precision, flexibility, and robust performance. Their advanced features and user-friendly design make them suitable for a wide variety of applications, from routine testing to complex R&D projects. By leveraging modern switching technologies, these systems set a high standard for electronic measurement, aiding engineers in developing reliable electronic solutions.