Agilent Technologies E4350B, E4351B service manual Foreword, Areas of Difference

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Addendum A - SERVICE MANUAL

Agilent Technologies Model E4350B and E4351B Solar Array Simulators - P/N 5962-8233 For units with serial numbers:

E4350B US37410101 and up

E4351B US37430101 and up

Foreword

This addendum contains information for troubleshooting and repairing the Agilent E4350B and E4351B Solar Array Simulators. The standard Service Manual for the Agilent Series 665xA DC Power Supplies (P/N 5959-3376), together with this Service Addendum, is shipped with the Solar Array Simulators when ordered with Option 910.

Note This addendum is to be used along with the standard Service Manual for the Agilent Series 665xA DC Power Supplies. When troubleshooting the Agilent E4350B/E4351B Solar Array Simulators, start by following the procedures outlined in the standard Service Manual. This addendum documents only the differences between the standard troubleshooting procedures and the troubleshooting procedures for a Solar Array Simulator.

Areas of Difference

From a service point of view, the main difference between the SAS unit and the Agilent Series 665xA dc power supply is the addition of a Digital Signal Processor (DSP) board located over the main A1 board. This DSP board includes the portions of CV, CC, OV, and OC control circuits such as the programming DAC circuits, as well as a microprocessor and programmable gate array that is used to generate the output I-V curve. The output I-V curve simulates the output characteristics of a solar array.

The areas in the standard service manual that are changed by this addendum are:

Test Equipment Required (Table 2-1)

Basic Test Setup (Figure 2-1)

Voltage and Current Values (Table 2-3)

CC RMS Noise Measurement Setup (Figure 2-3)

Performance Test Record (Table 2-15)

Self-Test Error Codes/Messages (Table 3-2)

Troubleshooting Flowcharts (Figures 3-2, 3-5 through 3-9)

Initialization Program Listing (Figure 3-17)

Cable and Connector Locations (Figure 3-18)

Disassembly Procedures for A5 DSP Board (page 3-50)

Digital Signal Processor (DSP) Board (page 4-14)

Simplified Power/Control/DSP Circuits (Figure 4-9)

Parts list (Tables 5-6, 5-7, 5-9 through 5-12)

Test Points (Table 6-3)

Schematic Diagrams (Figures 6-5, 6-6, 6-7, 6-10, 6-11, 6-12)

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Service Addendum

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Contents Areas of Difference ForewordTable of Contents Test Equipment Required Firmware RevisionsMeasurement Techniques Basic Test SetupCC RMS Noise Measurement Test Setup Transient Recovery TimeVoltage and Current Values Load Effect Source Effect Pard Ripple & Noise Performance Test RecordCurrent Sink 0.9A Readback Accuracy Pard Ripple & Noise Signature Analysis Self-Test Error Codes/MessagesOverall Troubleshooting sheet 1 Overall Troubleshooting sheetOverall Troubleshooting sheet 2 Overall Troubleshooting sheet 3 Overall Troubleshooting sheet 4 OV & OC Flow ChartsNo Display Troubleshooting No Display TroubleshootingOV Will Not Fire Start OV Will Not Fire TroubleshootingOV at Turn-On Start OV at Turn-On TroubleshootingOutput Held Low Start Output Held Low Troubleshooting sheetOutput Held Low Troubleshooting Sheet 2 Output Held High Start Output Held High TroubleshootingClear Screen Case Else Next 18. Cable and Connector Locations for E4350B/E4351B Cable and Connector LocationsDSP Board Digital Signal Processor DSP Board DSP Simplified Diagram of DSP CircuitsChassis -Mechanical Page Page Page Page Mosfet Page Page Page Page STUD-STD-PRS-IN Service Addendum FET Q303 1855-0849 FET Mechanical Test Points Signal Measurement and Conditions A4A1/A4A3 Left Tunnel Boards Figure Adapter Board and Phone Adapter Board Figures 6-11 A1 Main Board Assembly Diagram and Test Points for E4350B A1 Main Board Schematic Diagram for E4350B sheet 1 A1 Main Board Schematic Diagram for E4350B sheet 2 A1 Main Board Schematic Diagram for E4350B sheet 3 A1 Main Board Schematic Diagram for E4350B sheet 4 A4 Left Tunnel Circuit Component Locations for E4350B A4A1/A4A3 Left Tunnel Circuit Schematic Diagram for E4350B A4A2/A4A4 Right Tunnel Circuit Schematic Diagram for E4350B 10. A5 DSP Board Test Points 11. A6 Adapter Board Schematic Diagram

E4351B, E4350B specifications

Agilent Technologies, a leader in electronic measurement, offers a range of advanced solutions, including the E4350B and E4351B switching systems. These models are specifically designed to meet the increasing demands of modern testing environments, providing high reliability and precision for a variety of applications.

The Agilent E4350B is known for its low resistance switching capabilities, making it an ideal choice for applications requiring accurate and repeatable measurements. It supports up to 16 channels of low resistance testing, allowing engineers to simulate complex electrical paths and identify potential issues in circuit designs. With an optional temperature measurement capability, users can monitor the thermal performance of components directly during tests.

On the other hand, the E4351B model enhances flexibility with a modular design, offering an extensive range of input and output configurations. This instrument is particularly well-suited for automated test systems, providing the ability to connect multiple devices and manage them seamlessly. Its high-speed switching technology enables quick toggling between channels, ensuring that large datasets can be acquired swiftly without compromising accuracy.

Both models employ advanced contact technology, which minimizes the potential for signal degradation, ensuring that users receive reliable data with minimal noise interference. This feature is crucial in applications where signal integrity is paramount, such as in research and development or quality assurance processes.

Enhanced user interfaces simplify operations for both novice and experienced technicians. The built-in touchscreen and intuitive navigation allow for easy setup and operation, significantly reducing the learning curve. Furthermore, the comprehensive software support provided by Agilent facilitates integration with various programming environments, allowing for custom test sequences tailored to specific needs.

Moreover, both E4350B and E4351B systems are built with durability in mind. The robust construction ensures long-term reliability, reducing downtime and maintenance costs. This makes them ideal candidates for both laboratory settings and field operations where consistent performance is critical.

In summary, Agilent Technologies’ E4350B and E4351B models are distinguished by their precision, flexibility, and robust performance. Their advanced features and user-friendly design make them suitable for a wide variety of applications, from routine testing to complex R&D projects. By leveraging modern switching technologies, these systems set a high standard for electronic measurement, aiding engineers in developing reliable electronic solutions.