Agilent Technologies E4351B, E4350B service manual Clear Screen

Page 20

Initialization and Factory Preset Replacement Program Listing (sheet 1)

10 ! Program to initialize EEPROM data in Models E4350B and E4351B 20 ! RE-STORE "INIT_435X"

30 ! Rev A.00.00 dated Nov, 17,1998

40 !

50DIM Init_data(1:49),Model$[6],Idn$[21]

60INTEGER Addr(1:49),Length(1:49)

70

ASSIGN @Ps TO 705

! Supply must be at address 705

80

CLEAR SCREEN

 

90

!

 

100 Eprom_data_addr:

! Data address

110DATA 2,6,10,14,18,19,20,24,28,32

120DATA 36,37,38,42,46,50,54,55,56,57

130DATA 64,68,72,76,80,84,88,92,96,100

140DATA 136,137,138,139,140,142,146,148,149,150

150DATA 151,152,153,154,155,156,157,158,160

160!

170 Eprom_data_len:

! Data for word length

180DATA 4,4,4,4,1,1,4,4,4,4

190DATA 1,1,4,4,4,4,1,1,1,1

200DATA 4,4,4,4,4,4,4,4,4,4

210DATA 1,1,1,1,2,4,2,1,1,1

220DATA 1,1,1,1,1,1,1,2,1

230!

240 Eprom_data_50B: !

! EEPROM data for E4350B

250DATA 56.71,76.42,61.5,0,82,0,409.6,148.05,8.16,0

260DATA 99,3,9.321,27,73,0,83,255,20,10

270DATA 4350,54.39,167,436.44,167,0,10.0,10.0,65,1600

280DATA 5,255,0,0,17,4350,0,20,160,20

290DATA 160,156,37,98,115,15,20,0,96

300!

310 Eprom_data_51B: !

! EEPROM data for E4351B

320DATA 28.36,40.96,123.0,0,0,82,0,819.2,283.57,4.08,0

330DATA 99,3,5.121,27,140,0,83,255,20,10

340DATA 4351,27.19,167,872.89,167,0,5.0,5.0,130,400

350DATA 5,255,0,0,17,4351,0,20,160,20

360DATA 160,156,37,98,115,15,20,0,96

370!

380RESTORE Eprom_data_addr

390!

400FOR I=1 TO 49

410READ Addr(I)

420NEXT I

430!

440RESTORE Eprom_data_len

450!

460FOR I=1 TO 49

470READ Length(I)

480NEXT I

490!

500INPUT "Input the model number (i.e. E4350B)",Model$

Figure 3-17. Initialization and Factory Preset Replacement Program Listing (Sheet 1 of 3)

20

Service Addendum

Image 20
Contents Foreword Areas of DifferenceTable of Contents Firmware Revisions Test Equipment RequiredBasic Test Setup Measurement TechniquesVoltage and Current Values Transient Recovery TimeCC RMS Noise Measurement Test Setup Performance Test Record Load Effect Source Effect Pard Ripple & NoiseCurrent Sink 0.9A Readback Accuracy Pard Ripple & Noise Self-Test Error Codes/Messages Signature AnalysisOverall Troubleshooting sheet Overall Troubleshooting sheet 1Overall Troubleshooting sheet 2 Overall Troubleshooting sheet 3 Overall Troubleshooting sheet 4 Flow Charts OV & OCNo Display Troubleshooting No Display TroubleshootingOV Will Not Fire Troubleshooting OV Will Not Fire StartOV at Turn-On Troubleshooting OV at Turn-On StartOutput Held Low Troubleshooting sheet Output Held Low StartOutput Held Low Troubleshooting Sheet 2 Output Held High Troubleshooting Output Held High StartClear Screen Case Else Next Cable and Connector Locations 18. Cable and Connector Locations for E4350B/E4351BDSP Board Digital Signal Processor DSP Board Simplified Diagram of DSP Circuits DSPChassis -Mechanical Page Page Page Page Mosfet Page Page Page Page STUD-STD-PRS-IN Service Addendum FET Q303 1855-0849 FET Mechanical Test Points Signal Measurement and Conditions A4A1/A4A3 Left Tunnel Boards Figure Adapter Board and Phone Adapter Board Figures 6-11 A1 Main Board Assembly Diagram and Test Points for E4350B A1 Main Board Schematic Diagram for E4350B sheet 1 A1 Main Board Schematic Diagram for E4350B sheet 2 A1 Main Board Schematic Diagram for E4350B sheet 3 A1 Main Board Schematic Diagram for E4350B sheet 4 A4 Left Tunnel Circuit Component Locations for E4350B A4A1/A4A3 Left Tunnel Circuit Schematic Diagram for E4350B A4A2/A4A4 Right Tunnel Circuit Schematic Diagram for E4350B 10. A5 DSP Board Test Points 11. A6 Adapter Board Schematic Diagram

E4351B, E4350B specifications

Agilent Technologies, a leader in electronic measurement, offers a range of advanced solutions, including the E4350B and E4351B switching systems. These models are specifically designed to meet the increasing demands of modern testing environments, providing high reliability and precision for a variety of applications.

The Agilent E4350B is known for its low resistance switching capabilities, making it an ideal choice for applications requiring accurate and repeatable measurements. It supports up to 16 channels of low resistance testing, allowing engineers to simulate complex electrical paths and identify potential issues in circuit designs. With an optional temperature measurement capability, users can monitor the thermal performance of components directly during tests.

On the other hand, the E4351B model enhances flexibility with a modular design, offering an extensive range of input and output configurations. This instrument is particularly well-suited for automated test systems, providing the ability to connect multiple devices and manage them seamlessly. Its high-speed switching technology enables quick toggling between channels, ensuring that large datasets can be acquired swiftly without compromising accuracy.

Both models employ advanced contact technology, which minimizes the potential for signal degradation, ensuring that users receive reliable data with minimal noise interference. This feature is crucial in applications where signal integrity is paramount, such as in research and development or quality assurance processes.

Enhanced user interfaces simplify operations for both novice and experienced technicians. The built-in touchscreen and intuitive navigation allow for easy setup and operation, significantly reducing the learning curve. Furthermore, the comprehensive software support provided by Agilent facilitates integration with various programming environments, allowing for custom test sequences tailored to specific needs.

Moreover, both E4350B and E4351B systems are built with durability in mind. The robust construction ensures long-term reliability, reducing downtime and maintenance costs. This makes them ideal candidates for both laboratory settings and field operations where consistent performance is critical.

In summary, Agilent Technologies’ E4350B and E4351B models are distinguished by their precision, flexibility, and robust performance. Their advanced features and user-friendly design make them suitable for a wide variety of applications, from routine testing to complex R&D projects. By leveraging modern switching technologies, these systems set a high standard for electronic measurement, aiding engineers in developing reliable electronic solutions.