Chapter 3 Differences

Signature Analysis

Signature analysis (SA) troubleshooting for the secondary circuits on the A1 main circuit board is ++NOT++ available for the Agilent E4350B unit. However, GPIB and front panel signature analysis is available as described

in chapter 3 of the Service Manual.

Self-Test Error Codes/Messages

Table 3-2. Self-Test Error Codes/Messages

Code/Message

Description

Probable Cause

E1 FP RAM

E2 FP ROM

E3 EE CHKSUM

E4 PRI XRAM

E5 PRI IRAM

E6 PRI ROM

E7 GPIB

E8 SEC RAM

E9 SEC ROM

E10 SEC 5 V

E11 TEMP

E12 DACS

E30 SEC DAC

E31 SEC DAC

E32 SEC DAC

E45 SEC IO

E46 SEC NVRAM

Front panel RAM test failed

Front panel ROM test failed

Front panel EEPROM checksum failed

Primary interface external RAM test failed Primary interface internal RAM test failed Primary interface DOM test failed

GPIB interface test failed Secondary interface RAM test failed Secondary interface ROM test failed Secondary interface 5 volt readback test failed Ambient temperature readback test failed CV or CC DAC test failed

Secondary interface DAC test failed Secondary interface DAC test failed Secondary interface DAC test failed Secondary interface I/O test failed Secondary interface nonvolatile RAM test failed

Microprocessor A3U3 defective

ROM A3U4 or address latch A3U8 defective

Possibly due to power loss during a write operation. See checksum Error Recovery on page 3-3 in the Operating manual. If power loss is not the problem, EEPROM A3U6 could be defective (after replacing U6, supply must be initialized and calibrated).

A2 GPIB board defective

A2 GPIB board defective

A2 GPIB board defective

Talker/Listener chip A2U117 defective

A5 DSP board defective

A5 DSP board defective

A5 DSP board defective

A5 DSP board defective

A5 DSP board defective

A5 DSP board defective

A5 DSP board defective

A5 DSP board defective

A5 DSP board defective

A5 DSP board defective

Note: The following error messages can appear due to a failure occurring either while the power supply is operating or during self test.

SERIAL TIMEOUT

Serial data line failure on GPIB board

A2

GPIB board defective

SERIAL DOWN

Serial data line failure on GPIB board

A2

GPIB board defective

UART PARITY

Uart failed on GPIB board

A2

GPIB board defective

UART FRAMING

Uart failed on GPIB board

A2

GPIB board defective

UART OVERRUN

Uart failed on GPIB board

A2

GPIB board defective

SBUF OVERRUN

Serial buffer failure on GPIB board

A2

GPIB board defective

SBUF FULL

Serial buffer failure on GPIB board

A2

GPIB board defective

STK OVERFLOW

Stack overflow failure on DSP board

A5

DSP board defective

EE WRITE ERR

EEPROM write failure on front panel board

EEPROM A3U6 defective or calibration error

SECONDARY DN

Serial data line failure on DSP board

A5

DSP board defective

8

Service Addendum

Page 8
Image 8
Agilent Technologies E4351B, E4350B service manual Signature Analysis, Self-Test Error Codes/Messages

E4351B, E4350B specifications

Agilent Technologies, a leader in electronic measurement, offers a range of advanced solutions, including the E4350B and E4351B switching systems. These models are specifically designed to meet the increasing demands of modern testing environments, providing high reliability and precision for a variety of applications.

The Agilent E4350B is known for its low resistance switching capabilities, making it an ideal choice for applications requiring accurate and repeatable measurements. It supports up to 16 channels of low resistance testing, allowing engineers to simulate complex electrical paths and identify potential issues in circuit designs. With an optional temperature measurement capability, users can monitor the thermal performance of components directly during tests.

On the other hand, the E4351B model enhances flexibility with a modular design, offering an extensive range of input and output configurations. This instrument is particularly well-suited for automated test systems, providing the ability to connect multiple devices and manage them seamlessly. Its high-speed switching technology enables quick toggling between channels, ensuring that large datasets can be acquired swiftly without compromising accuracy.

Both models employ advanced contact technology, which minimizes the potential for signal degradation, ensuring that users receive reliable data with minimal noise interference. This feature is crucial in applications where signal integrity is paramount, such as in research and development or quality assurance processes.

Enhanced user interfaces simplify operations for both novice and experienced technicians. The built-in touchscreen and intuitive navigation allow for easy setup and operation, significantly reducing the learning curve. Furthermore, the comprehensive software support provided by Agilent facilitates integration with various programming environments, allowing for custom test sequences tailored to specific needs.

Moreover, both E4350B and E4351B systems are built with durability in mind. The robust construction ensures long-term reliability, reducing downtime and maintenance costs. This makes them ideal candidates for both laboratory settings and field operations where consistent performance is critical.

In summary, Agilent Technologies’ E4350B and E4351B models are distinguished by their precision, flexibility, and robust performance. Their advanced features and user-friendly design make them suitable for a wide variety of applications, from routine testing to complex R&D projects. By leveraging modern switching technologies, these systems set a high standard for electronic measurement, aiding engineers in developing reliable electronic solutions.