Allied Telesis AT-2916LX10/LC manual B2. BD Sram Test, B3. DMA Sram Test, B4. Mbuf Sram Test

Chapter 11: DOS Diagnostics

data, the program reads back data again to insure data stays the same.

WalkingOne bit Test: For each address, data one is written and read back for testing. Then shift the data left one bit, so the data becomes two and perform the same test again. It repeats for 32 times until the test bit is shifted out of test data. The same is test is repeated for entire test range.

Pseudo Random Data Test: A pre-calculated pseudo random data is used to write a unique data into each test RAM. After the first pass the test, the program reads back one more time to insure data stays correct.

Default: Enabled

B2. BD SRAM Test

Function: This test tests the BD SRAM. This performs exact the same way of testing as described in B1. Scratch Pad Test.

Default: Enabled

B3. DMA SRAM Test

Function: It tests DMA SRAM by performing the tests described in test

B1. The Scratch Pad Test.

Default: Enabled

B4. MBUF SRAM Test

Function: It tests DMA SRAM by performing the tests described in test

B1. The Scratch Pad Test.

Default: Enabled

B5. MBUF SRAM via DMA Test

Function: Eight test pattern data are used in the test. They are described below. A 0x1000 sized data buffer is used for this test. Before each pattern test, the buffer is initialized and filled with the test pattern. It then performs size 0x1000 transmit DMA from host buffer to NIC MBUF memory. Verify the data integrity in MBUF against host memory and repeat the DMA for the entire MBUF buffer. Then it performs receive DMA from NIC to host. The 0x1000-byte test buffer is cleared to zero before each receive-DMA. Verify the data integrity and test is repeated for the entire MBUF SRAM range. See Table 8 on page 125.

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