Chapter 11: DOS Diagnostics

Diagnostic Tests

The tests are divided into four groups: Register Tests, Memory Tests, Miscellaneous Tests, and Data Tests. They are named group ‘A’, ‘B’, ‘C’, and ‘D’.

Test Names This section lists the groups and the names of the diagnostics tests.

Group A.

A1. Indirect Register Test

A2. Control Register Test

A3. Interrupt Test

A4. BIST

A5. PCI Cfg Register Test

Group B.

B1. Scratch Pad Test

B2. BD SRAM Test

B3. DMA SRAM Test

B4. MBUF SRAM Test

B5. MBUF SRAM via DMA Test

B6. External SRAM Test

Group C.

C1. EEPROM Test

C2. CPU Test

C3. DMA Test

C4. MII Test

C5. VPD Test

C6. ASF Test

C7. ROM Expansion Test

Group D.

D1. Mac Loopback Test

D2. Phy Loopback Test

D3. RJ45 Loopback Test

D4. MII Miscellaneous Test

D5. MSI Test

Test Descriptions This section provides descriptions of the diagnostic tests.

A1. Indirect Register Test

Function: Using indirect addressing method, writing increment data into

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Allied Telesis AT-2916LX10/LC, AT-2972LX10/LC manual Diagnostic Tests

AT-2916LX10/LC, AT-2972LX10/LC specifications

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The AT-2972LX10/LC is a media converter that features two SFP (Small Form-factor Pluggable) slots, enabling users to connect to a variety of fiber optic networks. It supports a range of optical transceivers, providing flexibility in network design to suit different distance and bandwidth requirements. This media converter is particularly effective in extending the reach of Ethernet networks, capable of transmitting data up to 80 kilometers through single-mode fiber. This makes it an ideal choice for organizations with geographically dispersed locations needing robust connectivity.

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