CY7C1020BN

AC Test Loads and Waveforms

R 481

5V

OUTPUT

30 pF

INCLUDING

JIG AND

SCOPE (a)

R 481

5V

OUTPUT

R2

5 pF

 

R2

 

255

 

255

 

 

INCLUDING

JIG AND

SCOPE (b)

3.0V

 

 

 

 

 

 

 

 

 

 

 

 

 

ALL INPUT PULSES

 

 

 

90%

 

 

 

 

90%

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

10%

 

 

 

 

 

 

 

 

10%

 

 

 

 

 

 

 

GND

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Rise Time: 1 V/ns

 

 

 

 

Fall Time: 1 V/ns

167

Equivalent to: THÉVENIN OUTPUT

 

 

 

 

 

 

 

 

 

 

1.73V

 

 

 

 

 

 

 

 

 

 

 

EQUIVALENT

 

 

 

 

 

 

 

30 pF

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Switching Characteristics[5] Over the Operating Range

 

 

 

 

 

 

7C1020BN-12

7C1020BN-15

 

Parameter

 

 

 

 

Description

 

 

 

 

Unit

 

 

 

 

Min.

Max.

Min.

Max.

 

 

 

 

 

 

 

 

 

 

 

Read Cycle

 

 

 

 

 

 

 

 

 

tRC

 

Read Cycle Time

12

 

15

 

ns

tAA

 

Address to Data Valid

 

12

 

15

ns

tOHA

 

Data Hold from Address Change

3

 

3

 

ns

tACE

 

 

 

 

LOW to Data Valid

 

12

 

15

ns

CE

 

 

tDOE

 

 

 

 

LOW to Data Valid

 

6

 

7

ns

OE

 

 

tLZOE

 

 

 

 

LOW to Low Z[6]

0

 

0

 

ns

OE

 

 

tHZOE

 

 

 

 

HIGH to High Z[6, 7]

 

6

 

7

ns

OE

 

 

tLZCE

 

 

 

LOW to Low Z[6]

3

 

3

 

ns

CE

 

 

tHZCE

 

 

 

HIGH to High Z[6, 7]

 

6

 

7

ns

CE

 

 

tPU

 

 

 

LOW to Power-Up

0

 

0

 

ns

CE

 

 

tPD

 

 

 

HIGH to Power-Down

 

12

 

15

ns

CE

 

 

tDBE

 

Byte Enable to Data Valid

 

6

 

7

ns

tLZBE

 

Byte Enable to Low Z

0

 

0

 

ns

tHZBE

 

Byte Disable to High Z

 

6

 

7

ns

Write Cycle[8]

 

 

 

 

 

 

 

 

 

 

tWC

 

Write Cycle Time

12

 

15

 

ns

tSCE

 

 

 

LOW to Write End

9

 

10

 

ns

CE

 

 

tAW

 

Address Set-Up to Write End

8

 

10

 

ns

tHA

 

Address Hold from Write End

0

 

0

 

ns

tSA

 

Address Set-Up to Write Start

0

 

0

 

ns

tPWE

 

 

 

 

Pulse Width

8

 

10

 

ns

WE

 

 

tSD

 

Data Set-Up to Write End

6

 

8

 

ns

tHD

 

Data Hold from Write End

0

 

0

 

ns

tLZWE

 

 

 

 

HIGH to Low Z[6]

3

 

3

 

ns

WE

 

 

tHZWE

 

 

 

 

LOW to High Z[6, 7]

 

6

 

7

ns

WE

 

 

tBW

 

Byte Enable to End of Write

8

 

9

 

ns

Notes:

5.Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V, and output loading of the specified IOL/IOH and 30-pF load capacitance.

6.At any given temperature and voltage condition, tHZCE is less than tLZCE, tHZOE is less than tLZOE, and tHZWE is less than tLZWE for any given device.

7.tHZOE, tHZBE, tHZCE, and tHZWE are specified with a load capacitance of 5 pF as in part (b) of AC Test Loads. Transition is measured ±500 mV from steady-state voltage.

8.The internal write time of the memory is defined by the overlap of CE LOW, WE LOW and BHE / BLE LOW. CE, WE and BHE / BLE must be LOW to initiate a write, and the transition of these signals can terminate the write. The input data set-up and hold timing should be referenced to the leading edge of the signal that terminates the write.

Document #: 001-06443 Rev. **

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Cypress CY7C1020BN manual AC Test Loads and Waveforms, Switching Characteristics5 Over the Operating Range, Write Cycle

CY7C1020BN specifications

The Cypress CY7C1020BN is a high-performance SRAM (Static Random Access Memory) device that is particularly well-suited for high-speed applications requiring fast access times and low power consumption. This 1 Megabit (1Mbit) SRAM is organized as 128K words by 8 bits, providing a total storage capacity that is ideal for embedded systems, networking equipment, and other devices that demand rapid data processing capabilities.

One of the standout features of the CY7C1020BN is its access time of 10 ns to 15 ns, allowing for swift data read and write operations. This speed is critical in environments where timing is essential, such as telecommunications and computing applications. The device fully supports asynchronous read and write cycles, leading to efficient performance without the need for complex control logic.

The CY7C1020BN utilizes a CMOS (Complementary Metal-Oxide-Semiconductor) technology which contributes to its low power consumption profile. It operates at a voltage of 2.7V to 5.5V, making it versatile for various system designs. The device boasts a low standby current of 1 µA, a significant advantage in battery-operated applications where power savings are crucial.

Additionally, the CY7C1020BN is designed for ease of use, featuring simple interfacing options that allow for seamless integration into existing designs. It operates using standard asynchronous control signals, making it compatible with a wide range of microcontrollers and FPGAs.

In terms of reliability, the CY7C1020BN is built to endure various environmental conditions and has a solid reputation for robust performance over time. Features such as an extended temperature range and guaranteed write endurance enhance its durability in demanding applications.

The package options for the CY7C1020BN include various pin configurations, accommodating different board layouts and space constraints. This flexibility makes it an attractive choice for designers seeking to optimize their space without compromising on performance.

In summary, the Cypress CY7C1020BN is an excellent choice for applications requiring high-speed, low-power static RAM. With its fast access times, low power consumption, versatile voltage range, and compatibility with standard control signals, it continues to be a preferred memory solution in various high-performance systems. Whether in communication devices, industrial equipment, or consumer electronics, it provides reliability and efficiency that engineers can count on.