STK16C88-3

AC Switching Characteristics

 

 

 

 

 

SRAM Read Cycle

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Parameter

Description

 

35 ns

Unit

Cypress

 

Alt

Min

 

Max

Parameter

 

 

 

 

 

 

 

 

 

 

 

 

tACE

 

tELQV

Chip Enable Access Time

 

 

35

ns

tRC [5]

 

tAVAV, tELEH

Read Cycle Time

35

 

 

ns

tAA [6]

 

tAVQV

Address Access Time

 

 

35

ns

tDOE

 

tGLQV

Output Enable to Data Valid

 

 

15

ns

tOHA [6]

 

tAXQX

Output Hold After Address Change

5

 

 

ns

tLZCE [7]

 

tELQX

Chip Enable to Output Active

5

 

 

ns

tHZCE [7]

 

tEHQZ

Chip Disable to Output Inactive

 

 

13

ns

tLZOE [7]

 

tGLQX

Output Enable to Output Active

0

 

 

ns

tHZOE [7]

 

tGHQZ

Output Disable to Output Inactive

 

 

13

ns

tPU [4]

 

tELICCH

Chip Enable to Power Active

0

 

 

ns

tPD [3, 4]

 

tEHICCL

Chip Disable to Power Standby

 

 

35

ns

Switching Waveforms

Figure 5. SRAM Read Cycle 1: Address Controlled [5, 6]

$''5(66

W5&

W$$

W2+$

'4 '$7$287

'$7$9$/,'

Figure 6. SRAM Read Cycle 2: CE and OE Controlled [5]

$''5(66

&(

2(

'4 '$7$287

,&&

W5&

W$&(

W/=&(

W'2(

W/=2(

W38 $&7,9(

67$1'%<

W3'

W+=&(

W+=2(

'$7$9$/,'

Notes

5.WE must be HIGH during SRAM Read Cycles.

6.I/O state assumes CE and OE < VIL and WE > VIH; device is continuously selected.

7.Measured ±200 mV from steady state output voltage.

Document Number: 001-50594 Rev. **

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Cypress STK16C88-3 manual AC Switching Characteristics, Switching Waveforms, Sram Read Cycle