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HP 37717C manual Optical interfaces options, SONET/SDH binary interfaces option

Models: 37717C

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Option

code

7.Optical interfaces options

Tick

one

Choose one option (if required). All optical interfaces receive at 1310 and 1550 nm.

Provides optical interfaces. Must also order STM-0e/STM-1e option A3R (section 2), and appropriate optical adaptor options (section 12).

STM-1 optical interfaces only (for testing STM-1 only)*

 

 

 

 

 

 

● 155 Mb/s optical interface: 1310 nm, −9 dBm output

UH1

reserved

 

 

 

 

 

 

 

 

optical

 

 

 

 

 

 

 

 

STM-4/OC-12c test and optical interfaces

 

slot

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Provides optical interfaces, plus optical power measurement and STM-4 test

 

 

 

 

 

 

functionality, ie, for STM-4 overhead access. Must also order 52/155 Mb/s

 

 

 

 

 

 

option A3R or 120 (section 2), and appropriate optical adaptor options (section 12).

 

 

 

 

 

 

● 622/155/52 Mb/s optical interfaces: Dual wavelength at 1310 nm, −10 dBm

130†

 

 

 

 

 

 

 

 

 

 

output plus 1550 nm, −1 dBm output; includes STM-4/OC-12c, overhead access,

 

 

 

 

 

 

 

 

 

 

 

 

thru mode and optical power measurement.

 

 

 

 

 

 

● 622/155/52 Mb/s optical interfaces: 1310 nm, −10 dBm output; includes

131†

 

 

 

 

 

 

 

 

 

 

STM-4c/OC-12c, overhead access, thru mode and optical power measurement.

 

 

 

 

 

 

 

 

 

 

 

 

† Option 130/131 does not support option UKZ at present.

 

 

 

 

 

 

Please refer to module interworking section (pages 6 and 7).

 

 

 

 

 

 

STM-4 test and optical interfaces

 

 

 

 

 

 

Provides optical interfaces. Must also order STM-1e option A1T (section 2),

 

 

 

 

 

 

and appropriate optical adaptor options (section 12).

 

 

 

 

 

 

622/155 Mb/s optical interfaces: Dual wavelength at 1310 nm, 1550 nm

USN*

 

 

 

 

 

 

 

 

 

 

−10 dBm output plus 1550 nm, −1 dBm output; includes overhead access,

 

 

 

 

 

 

thru mode and optical power measurement.

 

 

 

 

 

 

622/155 Mb/s optical interfaces: 1310 nm, −10 dBm output;

UKT*

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

includes overhead access, thru mode and optical power measurement

 

 

 

 

 

 

 

 

 

 

 

 

(easily upgradeable to dual wavelength).

 

 

 

 

 

 

* Available with ATM options 0YK, USL, UKZ only. When option UKZ (and A1T)

 

 

 

 

 

 

are present, these interfaces also provide OC-3c capability.

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Option

No of

Tick if

 

code

slots

required

 

 

 

 

 

 

 

8. SONET/SDH binary interfaces option

 

 

 

 

 

 

 

 

 

 

 

 

 

Choose if required. Must also order STM-4 test and optical interfaces

 

 

 

 

 

 

option 130 or 131 (section 7).

 

 

 

 

 

 

● 622/155 Mb/s NRZ interfaces. 50 ohm ECL Tx data and Tx clock outputs, plus

0YH

1

 

 

 

 

 

 

Rx data and Rx clock inputs.

 

 

 

 

 

 

 

 

 

 

 

 

10

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HP 37717C manual Optical interfaces options, SONET/SDH binary interfaces option, STM-4 test and optical interfaces
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37717C specifications

The HP 37717C is a high-performance modular test and measurement instrument designed to provide unparalleled accuracy and versatility for a wide range of applications. Targeted primarily at engineers and researchers in communications and signal processing, this instrument offers essential features and advanced technologies that cater to the evolving demands of modern testing environments.

One of the main features of the HP 37717C is its exceptional frequency coverage. With the ability to operate from a few hertz up to a staggering 2.65 GHz, it can effectively handle various signals, from low-frequency audio to high-frequency RF applications. This broad range is crucial for telecommunications testing, as it allows engineers to assess components such as amplifiers, mixers, and modulators accurately.

The HP 37717C incorporates state-of-the-art digital signal processing (DSP) technology, allowing for real-time analysis and measurements. This technology enhances the accuracy and speed of data acquisition, making it efficient for both time-sensitive applications and complex signal analyses. Furthermore, it is equipped with advanced error detection capabilities that help identify and correct signal distortions, ensuring the integrity of the data being processed.

Another standout characteristic of the HP 37717C is its modular design. This instrument can be easily integrated into larger test systems, facilitating seamless upgrades and expansions. Users can customize their setups based on specific testing needs, whether that involves adding new measurement capabilities or incorporating additional channels for multi-channel testing.

The instrument also features a user-friendly interface, complete with an intuitive graphical display that enables quick navigation through its wide array of functions and settings. This ease of use enhances productivity and reduces the learning curve for new users, allowing them to focus on their testing objectives rather than struggling with complex controls.

Moreover, the HP 37717C supports various communication protocols and standards, making it adaptable for different industries ranging from aerospace and defense to consumer electronics. Its versatile capabilities ensure that it remains relevant as technology progresses and new standards emerge.

In summary, the HP 37717C stands out in the realm of test and measurement instruments due to its strategic combination of extensive frequency range, advanced DSP technology, modular design, and user-friendly interface. These features make it an indispensable tool for engineers and researchers striving for precision in their testing endeavors.