Option UH3
Option 0YH

Module interworking section

The following three tables indicate which modules are capable of networking with each other. Choose one from each category (if required)†

PDH/SDH and ATM cell layer supported configurations

PDH/ATM cell test and PDH interfaces

Option UKK

Page 8

Unstructured PDH: 0.7, 2, 8,

34 and 140 Mb/s.

 

Option UKJ

Page 8

Structured PDH: 2, 8, 34 and

140 Mb/s.

 

Option UKN

Page 8

ATM cell: 2, 34 and 140 Mb/s (includes all capability of option UKJ).

Page 9 Binary (NRZ) clock and data plus external clock input.

Must also order option UKK, UKJ or UKN.

Option UHCPage 11

Three additional 2, 8, 34 and 140 Mb/s outputs. Must also order option UKK, UKJ or UKN.

STM-0e/STM-1e test

and interfaces

Option A3R Page 8

STM-0e (52 Mb/s) and STM-1e (155 Mb/s) electrical interface: STM-0/STM-1 overhead access, thru mode and pointer sequences , TU-12, TU-2, VC-3 and VC-4 mappings.

Optical

interfaces

Option UH1

Page 10

155 Mb/s (1310 nm).

Option 130

Page 10

622/155/52 Mb/s (1310 and

1550 nm), optical power

measurement.

 

Option 131

Page 10

622/155/52 Mb/s (1310 nm), optical power measurement.

Page 10

622/155/52 Mb/s binary (NRZ) interfaces. Must also order option 130 or 131.

Jitter, wander and slips

testing – generation

Option A3K

Page 9

PDH and SDH jitter and

wander generation.

 

Option 140

Page 9

PDH and SDH jitter

 

generation.

 

Jitter, wander and slips testing – measurement

Option UHN Page 9

PDH jitter measurement: 2, 8, 34 and 140 Mb/s.

Option A3L Page 9

STM-1e line and PDH jitter measurement: 2, 8, 34, 140 and 155 Mb/s.

Option A3V

Page 9

STM-1o, STM-1e line and PDH jitter measurement: 2, 8, 34, 140 Mb/s and 155 Mb/s.

Option A3N Page 9

STM-4o, STM-1o, STM-1e line and PDH jitter measurement: 2, 8, 34, 140 Mb/s, 155 Mb/s and 622 Mb/s.

Dual standard SONET/SDH and DSn/PDH supported configurations

PDH/DSn interfaces

Option 110

Page 8

Structured PDH: DS1, DS3,

E1, E3.

 

Option UKK

Page 8

Unstructured PDH: 0.7, 2, 8,

34 and 140 Mb/s.

 

Option UKJ

Page 8

Structured PDH: 2, 8, 34 and

140 Mb/s.

 

Option UKN

Page 8

ATM cell: 2, 34 and 140 Mb/s (includes all capability of option UKJ).

Option UH3Page 9

Binary (NRZ) clock and data plus external clock input. Must also order option UKK, UKJ, UKN or 110.

SONET/SDH

test and interfaces

Option 120 Page 8

STS-1/STM-0e (52 Mb/s) and STS-3/STM-1e (155 Mb/s) electrical interface: Overhead access, thru mode and pointer sequences. VT1.5/TU-11, VT2/TU-12, VT6/TU-2, VC-3/STS-1 SPE and VC-4/STS-3c SPE mappings.

Optical

interfaces

Option UH1

Page 10

155 Mb/s (1310 nm).

Option 130

Page 10

622/155/52 Mb/s optical

interface (1310 and

 

1550 nm), optical power

measurement.

 

Option 131

Page 10

622/155/52 Mb/s optical interface (1310 nm), optical power measurement.

Option 0YHPage 10

622/155/52 Mb/s binary (NRZ) interfaces. Must also order option 130 or 131.

Jitter, wander and slips

testing – generation*

Option A3K Page 9

PDH, 155 Mb/s, 622 Mb/s jitter and wander generation.

Option 140 Page 9

As option A3K, but without wander generation.

Jitter, wander and slips testing – measurement*

Option UHN

Page 9

PDH jitter measurement.

Option A3L

Page 9

155 Mb/s electrical and PDH jitter measurement.

Option A3V Page 9

155 Mb/s optical, electrical and PDH jitter measurement.

Option A3N Page 9

622 Mb/s and 155 Mb/s optical, electrical and PDH jitter measurement.

6

Page 6
Image 6
HP 37717C manual Module interworking section, PDH/SDH and ATM cell layer supported configurations, Sonet/Sdh

37717C specifications

The HP 37717C is a high-performance modular test and measurement instrument designed to provide unparalleled accuracy and versatility for a wide range of applications. Targeted primarily at engineers and researchers in communications and signal processing, this instrument offers essential features and advanced technologies that cater to the evolving demands of modern testing environments.

One of the main features of the HP 37717C is its exceptional frequency coverage. With the ability to operate from a few hertz up to a staggering 2.65 GHz, it can effectively handle various signals, from low-frequency audio to high-frequency RF applications. This broad range is crucial for telecommunications testing, as it allows engineers to assess components such as amplifiers, mixers, and modulators accurately.

The HP 37717C incorporates state-of-the-art digital signal processing (DSP) technology, allowing for real-time analysis and measurements. This technology enhances the accuracy and speed of data acquisition, making it efficient for both time-sensitive applications and complex signal analyses. Furthermore, it is equipped with advanced error detection capabilities that help identify and correct signal distortions, ensuring the integrity of the data being processed.

Another standout characteristic of the HP 37717C is its modular design. This instrument can be easily integrated into larger test systems, facilitating seamless upgrades and expansions. Users can customize their setups based on specific testing needs, whether that involves adding new measurement capabilities or incorporating additional channels for multi-channel testing.

The instrument also features a user-friendly interface, complete with an intuitive graphical display that enables quick navigation through its wide array of functions and settings. This ease of use enhances productivity and reduces the learning curve for new users, allowing them to focus on their testing objectives rather than struggling with complex controls.

Moreover, the HP 37717C supports various communication protocols and standards, making it adaptable for different industries ranging from aerospace and defense to consumer electronics. Its versatile capabilities ensure that it remains relevant as technology progresses and new standards emerge.

In summary, the HP 37717C stands out in the realm of test and measurement instruments due to its strategic combination of extensive frequency range, advanced DSP technology, modular design, and user-friendly interface. These features make it an indispensable tool for engineers and researchers striving for precision in their testing endeavors.