Option

No of

Tick

code

slots

one

1.PDH/DSn and ATM test and interfaces options

Choose one option (if required). All options provide PDH interfaces and

PDH test capability.

Unstructured PDH testing: 0.7, 2, 8, 34 and 140 Mb/s interfaces plus an error output

UKK

2

Structured PDH testing: 2, 8, 34 and 140 Mb/s interfaces (64 kb/s and n × 64 kb/s testing)

UKJ

2

ATM cell generation and analysis: 2, 34 and 140 Mb/s interfaces†

UKN

2

– includes all capability of option UKJ (structured PDH testing).

 

 

Structured DSn/PDH testing: DS1, DS3, E1 and E3 interfaces

110

2

(64 kb/s, 56 kb/s, n x 64 kb/s and n x 56 kb/s testing)

 

 

ATM cell generation and analysis: DS1, DS3, E1 and E3 interfaces

UKZ*

2

(equivalent to 1.5 Mb/s, 45 Mb/s, 2 Mb/s, 34 Mb/s)‡.

 

 

If you need ATM cell generation and analysis at STM-1, then also order STM-0e/STM-1e option A3R (section 2).

If you need OC-3c, then also order STM-1e option A1T (section 2) and appropriate optical interfaces and adaptor options (sections 7 and 12).

*Option UKZ does not support option A3R or 120 at present. Please refer to module interworking section (pages 6 and 7).

Option

No of

Tick

code

slots

one

2.SONET/SDH test and interfaces options

Choose one option (if required). These options provide SDH electrical interfacing and SDH test capability.

SDH test module: STM-0e (52 Mb/s) and STM-1e (155 Mb/s) electrical interfaces, ........................ A3R*

2

 

 

 

 

STM-0/STM-1 overhead access,thru mode and pointer sequence generation, TU-12,

 

 

 

 

 

 

TU-2, VC-3 and VC-4 mappings plus frequency offset generation, alarm and error

 

 

 

 

 

 

generation/detection plus an error output, SDH alarm and BIP scan, tributary scan

 

 

 

 

 

 

and protection switch times.

 

 

 

 

 

SONET/SDH test module: STS-1/STM-0e (52 Mb/s) and STS-3/STM-1e (155 Mb/s) .......................... 120†

2

 

 

 

 

 

 

 

electrical interfaces, overhead access,thru mode and pointer sequence

 

 

 

 

 

 

 

 

 

 

 

 

generation, VT1.5/TU-11, VT2/TU-12, VT6/TU-2, STS-1/VC-3 SPE and STS-3c/VC-4 SPE

 

 

 

 

 

 

mappings plus frequency offset generation, alarm and error generation/detection

 

 

 

 

 

 

plus an error output, offset generation and BIP scan, tributary scan and protection switch times

 

 

 

 

 

plus frequency and BIP scan.

 

 

 

 

 

*

Option A3R does not support option UKZ at present.

 

 

 

 

 

 

Please refer to module interworking section (pages 6 and 7).

 

 

 

 

 

Option 120 does not support option UKZ and UHC at present.

 

 

 

 

 

 

Please refer to module interworking section (pages 6 and 7).

 

 

 

 

 

 

STM-1e (155 Mb/s) electrical interface: As per option A3R but without

A1T

2

 

 

 

 

 

 

 

 

STM-0e (52 Mb/s)capability, and without an error output.

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Option

No of

Tick

 

 

code

slots

one

3.Wander and jitter generation options

Choose on option (if required). For PDH jitter generation, also order PDH/DSn

 

 

option (section 1). For SDH jitter generation, also order SONET/SDH option (section 2)

 

plus appropriate optical interfaces and adaptor options (sections 7 and 12).

 

 

PDH jitter generation: 2, 8, 34 and 140 Mb/s up to 80 UI (2 Mb/s)

140†

1

SDH jitter generation: STM-1 (155 Mb/s) and STM-4 (622 Mb/s) up to 200 UI (STM-4).

 

 

All the capability of option 140 plus wander generation: 2 Mb/s, STM-1 (155 Mb/s)

A3K

1

and STM-4 (622 Mb/s) up to 14400 UI (STM-4).

 

 

8 and 140 Mb/s jitter generation requires a PDH option with 8 and 140 Mb/s interface to be fitted

8

Page 8
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HP 37717C PDH/DSn and ATM test and interfaces options, SONET/SDH test and interfaces options, Option Tick Code Slots One

37717C specifications

The HP 37717C is a high-performance modular test and measurement instrument designed to provide unparalleled accuracy and versatility for a wide range of applications. Targeted primarily at engineers and researchers in communications and signal processing, this instrument offers essential features and advanced technologies that cater to the evolving demands of modern testing environments.

One of the main features of the HP 37717C is its exceptional frequency coverage. With the ability to operate from a few hertz up to a staggering 2.65 GHz, it can effectively handle various signals, from low-frequency audio to high-frequency RF applications. This broad range is crucial for telecommunications testing, as it allows engineers to assess components such as amplifiers, mixers, and modulators accurately.

The HP 37717C incorporates state-of-the-art digital signal processing (DSP) technology, allowing for real-time analysis and measurements. This technology enhances the accuracy and speed of data acquisition, making it efficient for both time-sensitive applications and complex signal analyses. Furthermore, it is equipped with advanced error detection capabilities that help identify and correct signal distortions, ensuring the integrity of the data being processed.

Another standout characteristic of the HP 37717C is its modular design. This instrument can be easily integrated into larger test systems, facilitating seamless upgrades and expansions. Users can customize their setups based on specific testing needs, whether that involves adding new measurement capabilities or incorporating additional channels for multi-channel testing.

The instrument also features a user-friendly interface, complete with an intuitive graphical display that enables quick navigation through its wide array of functions and settings. This ease of use enhances productivity and reduces the learning curve for new users, allowing them to focus on their testing objectives rather than struggling with complex controls.

Moreover, the HP 37717C supports various communication protocols and standards, making it adaptable for different industries ranging from aerospace and defense to consumer electronics. Its versatile capabilities ensure that it remains relevant as technology progresses and new standards emerge.

In summary, the HP 37717C stands out in the realm of test and measurement instruments due to its strategic combination of extensive frequency range, advanced DSP technology, modular design, and user-friendly interface. These features make it an indispensable tool for engineers and researchers striving for precision in their testing endeavors.