Intel® X18-M/X25-M SATA SSD
Intel® X18-M/X25-M SATA Solid State Drive
Advance Product Manual July 2008
10 Order Number: 319765-002US
Intel® X18-M/X25-M SATA SSD

3.4.5 Electromagnetic Immunity

Electromagnetic Immunity tests assume the SSD is properly installed in the

representative host system. The drive will operate properly without errors or

degradation in performance when subjected to radio frequency (RF) environments

defined in the following table:

Notes:
1. Performance Criteria A = The device shall continue to operate as intended, i.e., normal unit operation with no
degradation of performance.
2. Performance Criteria B = The device shall continue to operate as intended after completion of the test. However, du ring
the test, some degradation of performance is allowed as long as there is no data loss operator intervention to restore
device function.
3. Performance Criteria C = temporary loss of function is allowed. Operator intervention is acceptable to restore device
function.
4. Contact electostatic discharge applied to drive enclosure.
3.5 Reliability

3.5.1 Nonrecoverable Read Errors

The nonrecoverable read error rate will not exceed one sector in the specified number

of bits read. In the extremely unlikely event of a nonrecoverable read error, the drive

will report it as a read failure to the host; the sector in error is considered corrupt and

is not returned to the host.

Table 10. Radio Frequency Specifications

Test Description Performance
Criteria Reference Standard
Electrostatic discharge Contact, HCP, VCP: ±8kV; Air: ± 15 kV B EN 61000-4-2: 95
Radiated RF immunity
80 to 1,000 MHz, 3 V/m,
80% AM with 1 kHz sine
900 MHz, 3 V/m, 50% pulse modulation at
200 Hz
AEN 61000-4-3: 96
ENV 50204: 95
Electrical fast transient ± 1 kV on AC mains, ± 0.5 kV on external
I/O B EN 61000-4-4: 95
Surge immunity ± 1 kV differential, ± 2 kV common, AC
mains B EN 61000-4-5: 95
Conducted RF immunity 150 kHz to 80 MHz, 3 Vrms, 80% AM with 1
kHz sine A EN 61000-4-6: 97
Voltage dips, interrupts
0% open, 5 seconds
0% short, 5 seconds
40%, 0.10 seconds
70%, 0.01 seconds
C
C
C
B
EN 61000-4-11: 94

Table 11. Reliability Specifications

Parameter Value
Nonrecoverable read errors 1 sector in 1015 bits read, max
Mean Time between Failure (MTBF) 1,200,000 hours
Power On/Off Cycles 50,000 cycles
Minimum Useful Life 5 years