W e l c o m e t o t h e w o r l d o f L E X T 3 D

any requirement.

Solder (after ion etching)

Because solder is very soft, years of experience and know-how are required to make specimen preparations before observing the composition of solder under a microscope. Polished surface techniques using the ion etching method have made considerable progress in recent years. The image shown below is the surface of solder processed with the ion etching method. This image shows that the tin (Sn) layer (white part) is made smoother by using the ion etching method. An SEM requires vapor deposition, whereas LEXT does not require pretreatment. Therefore, by using LEXT a specimen can be observed in its actual state.

3D image in real color

Line roughness analysis

Paper applied with an adhesive (sticky note)

Sticky notes are widely used for the convenient feature of applying, peeling and applying again. Minute spherical adhesives are distributed where an adhesive is applied to a sticky note, as shown in the image below. The way they are distributed, the thickness of an adhesive, etc., are thought to determine the ease of use (merchantability) of sticky notes. Using LEXT, such adhesives and paper (fiber) can be observed and measured without pretreatment in a noncontact manner.

Laser confocal 3D image

Cross-section measurement

Data: Courtesy of NISSAN ARC, Ltd.

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Olympus OLS3100 manual Any requirement
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OLS3100 specifications

The Olympus OLS3100 is a state-of-the-art laser scanning microscope designed for advanced surface and 3D measurements. It seamlessly combines precision optics with cutting-edge technology, making it suitable for a wide range of applications in materials science, life sciences, and electronics.

One of the most notable features of the OLS3100 is its high-resolution imaging capability. Equipped with a robust optical system and advanced laser sources, it enables users to obtain detailed surface and topographical information at nanometer resolution. The microscope employs laser scanning technology that provides rapid data acquisition while minimizing sample damage, which is particularly advantageous when working with delicate specimens.

The OLS3100 also boasts an innovative multi-functional imaging mode. Users can switch between various imaging techniques, such as brightfield, darkfield, and fluorescence, enhancing versatility for different research needs. This multifunctionality allows researchers to study samples from different perspectives, enabling deeper insights into structural and compositional properties.

Furthermore, the OLS3100 features advanced software that facilitates easy data analysis and visualization. This software integrates powerful algorithms for surface measurement and metrology, allowing for efficient processing of complex datasets. Users can create 3D reconstructions of the sample surface, conduct roughness analysis, and generate detailed reports effortlessly.

The instrument is designed for user-friendly operation, featuring an intuitive interface and customizable workflows. This enables researchers, regardless of their experience level, to operate the system effectively. The OLS3100 also supports remote access capabilities, making it an ideal choice for collaborative projects where multiple users may need to access and analyze data from different locations.

In terms of durability, the OLS3100 is built with high-quality materials that ensure long-term reliability. The robust construction minimizes vibrations and other environmental interferences, resulting in consistent performance over time.

In conclusion, the Olympus OLS3100 is a versatile and powerful tool that combines high-resolution imaging, multifunctional capabilities, and user-friendly software for comprehensive surface analysis. This advanced laser scanning microscope is an excellent choice for researchers looking to advance their work in various scientific fields while ensuring precision, efficiency, and reliability. Its innovative features make it a valuable asset in any laboratory, pushing the boundaries of what is possible in microscopy today.
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