W e l c o m e t o t h e w o r l d o f L E X T 3 D

Specifications

 

 

 

 

Laser scan

 

Universal

Observation method

 

Laser

 

Laser, Laser confocal DIC, Brightfield, DIC

Microscope stand

 

Illumination

Laser

 

408 nm LD laser, Class 2

 

 

 

White light

 

White LED illumination

 

 

Z stage

Vertical movement/Maximum height of specimen

 

70 mm/100 mm

 

 

Z revolving nosepiece

Stroke/Resolution/Repeatability

 

10 mm/0.01 µm/3 σ =0.04+0.002L µm

Objective lens

 

 

 

5x, 10x, 20x, 50x, 100x

Total magnification

 

 

 

120x–14400x

Field of view

 

 

 

2560x2560–21x21 µm

Optical zoom

 

 

 

1x–6x

Stage *

 

Manual stage/Motorized stage

 

100x100 mm/150x100 mm

Frame memory

 

Intensity/Height

 

 

1024x1024x12 bit/1024x1024x16 bit

AF

 

 

 

Laser reflection type

Dimensions

 

 

 

464(W)x559(D)x620(H) mm

Weight

 

 

56.9 kg

 

57.5 kg

*300 mm x 300 mm stage is optional upon special order basis.

LEXT unit dimensions

(Unit: mm)

 

177

520 (–620)

494

279

559

464

Monitor *

406~456

190

415

PC *

353

417176

Control unit

349.5

350170

*PC & monitor have slightly different dimensions dependent on the area of region.

LEXT configuration dimensions

680

700

520

700

580

800

(Unit: mm)

14

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Image 15
Olympus OLS3100 manual Lext unit dimensions

OLS3100 specifications

The Olympus OLS3100 is a state-of-the-art laser scanning microscope designed for advanced surface and 3D measurements. It seamlessly combines precision optics with cutting-edge technology, making it suitable for a wide range of applications in materials science, life sciences, and electronics.

One of the most notable features of the OLS3100 is its high-resolution imaging capability. Equipped with a robust optical system and advanced laser sources, it enables users to obtain detailed surface and topographical information at nanometer resolution. The microscope employs laser scanning technology that provides rapid data acquisition while minimizing sample damage, which is particularly advantageous when working with delicate specimens.

The OLS3100 also boasts an innovative multi-functional imaging mode. Users can switch between various imaging techniques, such as brightfield, darkfield, and fluorescence, enhancing versatility for different research needs. This multifunctionality allows researchers to study samples from different perspectives, enabling deeper insights into structural and compositional properties.

Furthermore, the OLS3100 features advanced software that facilitates easy data analysis and visualization. This software integrates powerful algorithms for surface measurement and metrology, allowing for efficient processing of complex datasets. Users can create 3D reconstructions of the sample surface, conduct roughness analysis, and generate detailed reports effortlessly.

The instrument is designed for user-friendly operation, featuring an intuitive interface and customizable workflows. This enables researchers, regardless of their experience level, to operate the system effectively. The OLS3100 also supports remote access capabilities, making it an ideal choice for collaborative projects where multiple users may need to access and analyze data from different locations.

In terms of durability, the OLS3100 is built with high-quality materials that ensure long-term reliability. The robust construction minimizes vibrations and other environmental interferences, resulting in consistent performance over time.

In conclusion, the Olympus OLS3100 is a versatile and powerful tool that combines high-resolution imaging, multifunctional capabilities, and user-friendly software for comprehensive surface analysis. This advanced laser scanning microscope is an excellent choice for researchers looking to advance their work in various scientific fields while ensuring precision, efficiency, and reliability. Its innovative features make it a valuable asset in any laboratory, pushing the boundaries of what is possible in microscopy today.