Versatile observation methods to handle a wide range of applic
Display
●Brightfield observation
Color information can be obtained from brightfield (color) observation. Therefore, brightfield observation can be used effectively to observe a flaw on a color filter or to locate the position of an area of corrosion on metal.
Laser printer toner
●DIC (Differential Interference Contrast) observation
In DIC observation, it is possible to observe a scratch or flaw as small as a few nanometers in height that could not be observed in a brightfield observation.
Reverse face of a wafer
●Laser confocal
Observation with a much higher level of resolution impracticable with conventional microscopes is now possible through a combination of a 408 nm laser and confocal optics.
Circuits patterns on wafer
Confocal image | Non confocal image |
●Laser confocal DIC
Microscopic unevenness on a surface can be observed in three dimensions in real time, which is impossible with conventional laser microscopes. Observation of surface conditions with the level of dimensional reality comparable to that of an SEM has been made fully possible, opening up a new dimension in surface profile observation.
Polymeric film
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