Philips ISP1521 18. Test information

Philips Semiconductors ISP1521

Hi-Speed USB hub controller

Product data Rev. 03 — 24 November 2004 47 of 53

18. Test information

(1) Transmitter: connected to 50 Ω inputs of a high-speed differential oscilloscope.

Receiver: connected to 50 Ω outputs of a high-speed differential data generator.

Fig 21. High-speed transmitter and receiver test circuit.

(1) CL= 50pF for full-speed.

Fig 22. Full-speed test circuit.

mdb273

DMn

DPn

50 Ω coax

DUT

GND

V

143 Ω

15.8 Ω

143 Ω

(1)

D−

D+

L(1)

(1)

15 kΩ

DPn

DMn

RPU

3.3 V

1.5 kΩ ± 5%

DUT

mdb274

L(1) 15 kΩ

test point

full-

speed

test point

Contents

Main ISP1521 Hi-Speed Universal Serial Bus hub controller Universal Serial Bus Specication Rev.2.0 Rev. 03 24 November 2004 Product data 1. General description 2. Features Universal Serial Bus Specication Rev.2.0 3. Applications 4. Abbreviations 5. Ordering information Product data Rev. 03 24 November 2004 4 of 53 6. Block diagram Fig 1. Block diagram. ISP1521 Philips Semiconductors ISP1521 Product data Rev. 03 24 November 2004 5 of 53 7. Pinning information Fig 2. Pin conguration. 7.2 Pin description 7.1 Pinning ISP1521BE Page ISP1521 Hub Demo Board Users Guide Page Page 8. Functional description 8.3 Phase-locked loop clock multiplier 8.4 I2C-bus controller 8.5 Overcurrent detection circuit 8.6 GoodLink 8.7 Power-on reset Fig 4. External clock with respect to power-on reset. Fig 3. Power-on reset timing. Stable external clock is to be available at A. 9. Conguration selections 9.1 Conguration through I/O pins Philips Semiconductors ISP1521 pull-up Fig 6. Typical voltage drop components in the self-powered mode using global overcurrent detection. PSWn_N pins have integrated weak pull-up resistors inside the chip. (1) Includes PCB traces, ferrite beads, and so on. Page 9.2 Device descriptors and string descriptors settings using I2C-bus The I C-bus specication Page 9.2.3 ROM or EEPROM map Page Philips Semiconductors ISP1521 Page Page 10. Hub controller description 11. Descriptors Page Page 12. Hub requests Tab le 23 shows the suppor ted standard USB requests. 12.1 Standard USB requests 12.2 Hub class requests Tab le 24 shows the hub class requests. 12.3 Detailed responses to hub requests Page Page 12.4 Various get descriptors bmRequestType 10000000B bmRequest GET_DESCRIPTOR = 6 13. Limiting values 14. Recommended operating conditions In accordance with the Absolute Maximum Rating System (IEC 60134). 15. Static characteristics Page Page 16. Dynamic characteristics C; test circuit Figure 21; unless otherwise specied. Page TPERIOD is the bit duration corresponding with the USB data rate. Fig 11. Source differential data-to-EOP transition skew and EOP width. TPERIOD is the bit duration corresponding with the USB data rate. tJR is the jitter reference point. Fig 13. Receiver SE0 width tolerance. Fig 12. Receiver differential data jitter. Fig 14. Hub differential data delay and SOP distortion. Fig 15. Hub EOP delay and EOP skew. and T within recommended operating range; V =5V; V =V ; V 17. Application information 17.1 Descriptor conguration selection ISP1521 Fig 18. Adjusting analog overcurrent detection limit (optional). . . 17.3 Self-powered hub congurations ISP1521 Fig 19. Self-powered hub; individual port power switching; individual overcurrent detection. Fig 20. Self-powered hub; ganged port power switching; global overcurrent detection. ISP1521 18. Test information DMn D Fig 22. Full-speed test circuit. Fig 21. High-speed transmitter and receiver test circuit. 19. Package outline LQFP80: plastic low profile quad flat package; 80 leads; body 12 x 12 x 1.4 mm SOT315-1 Fig 23. LQFP80 package outline. 20. Soldering 20.1 Introduction to soldering surface mount packages Data Handbook IC26; Integrated Circuit Packages 20.2 Reow soldering 20.3 Wave soldering 21. Revision history Philips Semiconductors ISP1521 Contact information 22. Data sheet status 23. Denitions 24. Disclaimers 25. Licenses 26. Trademarks Contents