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U Series CE Family Product Manual, Rev. A

1.10 Electromagnetic immunity

When properly installed in a representative host system, the drive operates without errors or degradation in performance when subjected to the radio frequency (RF) environments defined in the following table:

Test

Description

Performance

Reference

 

 

Level

Standard

 

 

 

 

 

 

 

 

Electrostatic

Contact, HCP, VCP: ± 4 kV; Air:

B

EN 61000-4-2: 95

discharge

± 8 kV

 

 

 

 

 

 

Radiated RF

80 to 1,000 MHz, 3 V/m,

A

EN 61000-4-3: 96

immunity

80% AM with 1 kHz sine

 

ENV 50204: 95

 

900 MHz, 3 V/m, 50% pulse

 

 

 

modulation @ 200 Hz

 

 

 

 

 

 

Electrical fast

± 1 kV on AC mains, ± 0.5 kV

B

EN 61000-4-4: 95

transient

on external I/O

 

 

 

 

 

 

Surge

± 1 kV differential, ± 2 kV com-

B

EN 61000-4-5: 95

immunity

mon, AC mains

 

 

 

 

 

 

Conducted

150 kHz to 80 MHz, 3 Vrms,

A

EN 61000-4-6: 97

RF

80% AM with 1 kHz sine

 

 

immunity

 

 

 

 

 

 

 

Voltage dips,

0% open, 5 seconds

C

EN 61000-4-11: 94

interrupts

0% short, 5 seconds

C

 

 

40%, 0.10 seconds

C

 

 

70%, 0.01 seconds

B

 

 

 

 

 

1.11 Reliability

Nonrecoverable read errors

1 per 1013 bits read, max

Mean time between failures

600,000 power-on hours (nominal power,

 

25°C ambient temperature)

Contact start-stop cycles

50,000 cycles

 

(at nominal voltage and temperature, with

 

60 cycles per hour and a 50% duty cycle)

Preventive maintenance

None required

1.12Agency certification 1.12.1 Safety certification

The drives are recognized in accordance with UL 1950 and CSA C22.2

(950)and meet all applicable sections of IEC950 and EN 60950 as tested by TUV North America.

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Seagate ST340810ACE, ST320410ACE Electromagnetic immunity, Reliability, Agency certification 1.12.1 Safety certification