PRODUCT SPECIFICATIONS

 

SSD-DXXX(X)-5000 DATA SHEET [PRELIMINARY]

RELIABILITY

 

 

 

 

 

 

 

 

 

Table 3: Reliability

 

 

 

 

 

 

 

 

 

 

 

MTBF (@ 25ºC)

3,000,000 hours

 

 

 

 

 

Bit Error Rate

Bit Error Rate: <1 non-recoverable error in 1016 bits read

 

 

Data Retention

10 years

 

 

 

 

PROJECTED OPERATIONAL LIFE SPAN

 

 

 

 

 

 

 

Table 4: Operational Life Span

 

 

 

 

 

 

 

 

 

SiliconDrive Part#

Capacity

Service Life*

 

GB Written per Day

 

 

 

 

 

 

 

SSD-D0120Px-5000

120GB

19.5 Years

@

1687.5GB

 

 

 

 

 

 

 

SSD-D0090Px-5000

90GB

14.6 Years

@

1687.5GB

 

 

 

 

 

 

 

SSD-D0060Px-5000

60GB

9.7 Years

@

1687.5GB

 

 

 

 

 

 

 

SSD-D0030Px-5000

30GB

4.9 Years

@

1687.5GB

 

 

 

 

 

 

 

 

*There are unlimited read cycles. Service life is determined using SiliconSystems’ LifeEST calculation at 100% duty cycle with 25% write cycles.

LifeEST is a comprehensive measurement that considers numerous factors to determine the projected life span of a SiliconDrive. A white paper that describes the benefits of LifeEST and how to calculate it can be found at http:/ /www.siliconsystems.com/resources/Documents/Whitepaper/ SiliconSystems_NAND_Evolution.pdf.

The actual life of a SiliconDrive is dependant on the customer usage model. SiSMART is a patented technology of SiliconSystems that enables host systems to monitor actual usage of a SiliconDrive in real time. SiSMART measures and reports the remaining life of a SiliconDrive. For more information on SiSMART, refer to the Eliminating Unscheduled Downtime by Forecasting Useable Life white paper at http://www.siliconsystems.com/ technology/pdfs/SiliconDrive_SiSMART.pdf.

SILICONSYSTEMS PROPRIETARY

This document and the information contained within it is confidential and proprietary to SiliconSystems, Inc.

All unauthorized use and/or reproduction is prohibited.

5000D-00DSR PRELIMINARY

PAGE 4

MARCH 16, 2009

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Silicon Valley Peripherals SSD-D0120PI-5000 manual Reliability, Operational Life Span