Glossary
Glossary–4 TDS 684A, TDS 744A, & TDS 784A User Manual
Fall time
A measurement of the time it takes for the trailing edge of a pulse to fall
from a HighRef value (typically 90%) to a LowRef value (typically 10%) of
its amplitude.
Frequency
A timing measurement that is the reciprocal of the period. Measured in Hertz
(Hz) where 1 Hz = 1 cycle per second.
Gated Measurements
A feature that lets you limit automated measurements to a specified portion
of the waveform. You define the area of interest using the vertical cursors.
General purpose knob
The large front-panel knob with an indentation. You can use it to change the
value of the assigned parameter.
Glitch positive trigger
Triggering occurs if the oscilloscope detects positive spike widths less than
the specified glitch time.
Glitch negative trigger
Triggering occurs if the oscilloscope detects negative spike widths less than
the specified glitch time.
Glitch either trigger
Triggering occurs if the oscilloscope detects either positive or negative spike
widths less than the specified glitch time.
GPIB (General Purpose Interface Bus)
An interconnection bus and protocol that allows you to connect multiple
instruments in a network under the control of a controller. Also known as
IEEE 488 bus. It transfers data with eight parallel data lines, five control
lines, and three handshake lines.
Graticule
A grid on the display screen that creates the horizontal and vertical axes. You
can use it to visually measure waveform parameters.
Ground (GND) coupling
Coupling option that disconnects the input signal from the vertical system.
Hardcopy
An electronic copy of the display in a format useable by a printer or plotter.
Hi Res acquisition mode
TDS 700A Models Only: An acquisition mode in which the oscilloscope
averages all samples taken during an acquisition interval to create a record
point. That average results in a higher-resolution, lower-bandwidth wave-
form. That mode only works with real-time, non-interpolated sampling.