Tektronix TDS 684A, TDS 744A, TDS 784A Measuring Waveforms

TDS 684A, TDS 744A, & TDS 784A User Manual 3–87
Measuring Waveforms
To make the best use of the TDS Oscilloscope when taking measurements, you
need to know how to use the three types, or classes, of measurements it can take.
This section describes how to take the following classes of measurements (Fig-
ure 3–51 shows all three measurement classes):
Automated for automatically taking and displaying waveform measurements
Cursor for measuring the difference (either in time or voltage) between two
locations in a waveform record
Graticule for making quick estimates by counting graticule divisions on
screens
This section also tells you how to use Probe Cal and Signal Path Compensation
to optimize the accuracy of your measurements.
Ch 1 Period
10 ns
Automated
Measurements
Graticule
Ch 1
Frequency
100 MHz
Cursors
D: 64.0 mV
@: 32.0 mV
Cursor
Readouts
Figure 3–51: Graticule, Cursor and Automated Measurements
Taking Automated Measurements
The TDS Oscilloscope provides the feature Measure for automatically taking and
displaying waveform measurements. This subsection describes how to set up the
oscilloscope to let it do the work of taking measurements for you.
Because automatic measurements use the waveform record points, they are
generally more accurate and quicker than cursor and graticule measurements.
The oscilloscope will continuously update and display these measurements.