Hitachi HTS541640J9SA00 manual Status, Error, LBA Mid, LBA High, Smart Selective self-test routine

Page 135

Travelstar 5K160 (SATA) Hard Disk Drive Specification

Off-line mode: The device executes command completion before executing the specified routine. During execution of the routine the device will not set BSY nor clear DRDY. If the device is in the process of performing its routine and is interrupted by a new command from the host, the device will abort or suspend its routine and service the host within two seconds after receipt of the new command. After servicing the interrupting command, the device will resume its routine automatically or not start its routine depending on the interrupting command.

Captive mode: When executing self-test in captive mode, the device sets BSY to one and executes the specified self-test routine after receipt of the command. At the end of the routine, the device sets the execution result in the Self-test execution status byte and ATA registers as below and executes command completion.

Status

Set ERR to one when self-test has failed

Error

Set ABRT to one when self-test has failed

LBA Mid

Set to F4h when self-test has failed

LBA High

Set to 2Ch when self-test has failed

SMART Selective self-test routine

When the value in the LBA Low register is 4 or 132, the Selective self-test routine shall be performed. This self-test routine shall include the initial tests performed by the Extended self-test routine plus a selectable read scan. The host shall not write the Selective self-test log while the execution of a Selective self-test command is in progress.

The user may choose to do read scan only on specific areas of the media. To do this, user shall set the test spans desired in the Selective self-test log and set the flags in the Feature flags field of the Selective self-test log to indicate do not perform off-line scan. In this case, the test spans defined shall be read scanned in their entirety. The Selective self-test log is updated as the self-test proceeds indicating test progress. When all specified test spans have been completed, the test is terminated and the appropriate self-test execution status is reported in the S.M.A.R.T. READ DATA response depending on the occurrence of errors. Figure 88 shows an example of a Selective selftest definition with three test spans defined. In this example, the test terminates when all three test spans have been scanned.

Figure 81 Selective self-test test span example

After the scan of the selected spans described above, a user may wish to have the rest of media read scanned as an off-line scan. In this case, the user shall set the flag to enable off-line scan in addition to the other settings. If an error occurs during the scanning of the test spans, the error is reported in the self-test execution status in the S.M.A.R.T. READ DATA response and the off-line scan is not executed. When the test spans defined have been scanned, the device shall then set the offline scan pending and active flags in the Selective self-test log to one, the span under test to a value greater than five, the self-test execution status in the S.M.A.R.T. READ DATA response to 00h, set a value of 03h in the off-line data collection status in the S.M.A.R.T. READ DATA response and shall

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Contents 167 Hitachi Travelstar 5K160Copyright Hitachi Global Storage Technologies Table of Contents 11.6 14.30 Limits of temperature and humidity Read Verify Sectors Ext Command 42h List of Tables General Introduction AbbreviationsCapacity GB 10/167 ISO11/167 12/167 Drive handling precautionsReferences General caution13/167 Outline of the drive14/167 Part 1 Functional Specification15/167 Head disk assembly dataFixed disk subsystem description Control ElectronicsLogical Layout Fixed disk characteristicsFormatted capacity by model number Description HTS541616J9SA00 HTS541612J9SA00 Physical LayoutData sheet Cylinder allocation80GB/p format Zone 18/167 Performance characteristicsCommand overhead FunctionAverage latency Mechanical positioningAverage seek time including settling Full stroke seek20/167 Drive ready timeCondition Typical sec Max. sec ReadyOperating modes Mode transition timeOperating mode at power on Adaptive power save controlWrite Cache Data loss on power offWrite safety Data integrityError recovery Data buffer testAutomatic reallocation 24/167 ECCCorrosion test SpecificationTemperature and humidity EnvironmentFrequency KHz Limits uT RMS Radiation noiseConductive noise Magnetic fieldsDC power requirements Requirements27/167 Power consumption efficiency Power consumption efficiency 28/167Capacity 160GB 120GB 80GB 40GB Failure prediction S.M.A.R.T Service life and usage conditionReliability Data reliabilityLoad/unload Preventive maintenanceRequired Power-Off Sequence Power switch design considerations31/167 Test considerationsMechanical specifications Physical dimensions and weightMounting hole locations Mounting orientation Load/unload mechanism33/167 Swept sine vibration Vibration and shockOperating vibration Random vibrationNonoperating vibration Operating shockNonoperating shock Acoustics Sound power levelWeighted Sound Power Typical Bels Maximum Bels Mode definitionsElectromagnetic compatibility Identification labelsSafety PackagingSubstance restriction requirements 39/167 Electrical interface specificationsInterface connector Cabling2 RX+ / RX Signal definitionsPlug Connector pin definition Signal 1 TX+ / TXShows the timing of COMRESET, Cominit and Comwake Out of band signaling42/167 Part 2 Interface SpecificationDevice Device indicates HTS5416XXJ9SA00 Host GeneralIntroduction TerminologyRegister naming convention Deviations from StandardPhysical Interface RegistersDevice Register Command registerError Register Device Control RegisterLBA Mid Register Features RegisterLBA High Register LBA Low RegisterStatus Register Sector Count RegisterReset Response General Operation DescriptionsRegister Initialization Diagnostic and Reset considerations Power-off considerationsExecute Device Diagnostic Emergency unload Sector Addressing ModeRequired power-off sequence Logical CHS Addressing ModePower Management Commands Power Management FeatureLBA Addressing Mode Power ModeStatus Standby/Sleep command completion timingInterface Capability for Power Modes Initial Power Mode at Power OnLow Power Idle mode Interface Power Management Mode Slumber and PartialPerformance Idle mode Active Idle mode12.8 S.M.A.R.T. Function Password Security Mode Feature Set12.8.6 S.M.A.R.T operation with power management modes Security modeOperation from POR after User Password is set Master Password Revision CodeMaster Password setting User Password setting57/167 User Password LostAttempt limit for Security Unlock command Command TableCommand table for device lock operation 59/167 Protected Area Function Read Native Max Address ‘F8’h Set Max Address ‘F9’h60/167 Capacity native 536,870,912 Example for operation In LBA modeSet Max security extension commands Word Content17-255 63/167 Seek OverlapWrite Cache Function Reassign FunctionRecovered read errors 12.14 48-bit Address Feature SetNon recovered write errors Non recovered read errorsSetting Contents Software Setting Preservation Feature SetNative Command Queuing Preserved software settingsCommand Protocol Data In Commands66/167 Non-Data Commands Data Out CommandsRead Fpdma Queued Write Fpdma Queued DMA Data Transfer CommandsFirst-parity DMA Commands Read DMA Read DMA Ext Write DMA Write DMA ExtCommand Descriptions Write Sectors Write Sectors Ext Protocol Command Code HexA.R.T. Read Attribute Thresholds A.R.T. Read Log Sector Write Log ExtCommand Subcommand Command code Feature Hex Output RegistersIndicates that the bit must be set to 71/167 72/167 Input RegistersSector Count LBA Low LBA Mid LBA High Check Power Mode E5h/98hRegister Data Feature Error See Below Device Command Status See Below Error RegisterDevice Configuration Overlay B1h Device Configuration Restore subcommand C0hDevice Configuration Freeze Lock subcommand C1h Sector count 06h = Protected area is now established Device Configuration Identify subcommand C2hDevice Configuration SET subcommand C3h LBA High 03h = word 3 is invalid LBA Mid 00h= Ultra DMA mode 0 is supported = Ultra DMA mode 3 and below are supported= Ultra DMA mode 2 and below are supported = Ultra DMA mode 1 and below are supported77/167 Execute Device Diagnostic 90hFlush Cache E7h Command Block Output RegistersLBA High Current Flush Cache Ext EAhLBA Low Current LBA Mid CurrentFormat Track 50h Vendor Specific Output Parameters To The Device LBA LowLBA High/Mid 81/167 Format Unit F7h Vendor Specific37C8h Number of heads in default translate modeIdentify Device ECh Identify Device response is complete0003H 00xxH 10-19 23-26 27-46Travelstar 5K160 Sata Hard Disk Drive Specification Sata Gen-1 speed 1.5Gbps supported Native Command Queuing supportedRequests Sata Gen-2 speed 3.0Gbps supported00FCH =General Purpose Logging feature set supported =IDLE Immediate with Unload Feature=WRITE DMA Queued FUA EXT command FUA EXT commands supported=READ/WRITE DMA Queued command Enabled112-118 0000H Reserved 119 4000H Maximum user LBA address for 48-bit Address feature set word Output Parameters To The Device Idle E3h/97h92/167 Idle Immediate E1h/95hInitialize Device Parameters 91h 94/167 Read Buffer E4hOutput Parameters To The Device Sector Count Read DMAC8h/C9h96/167 Read DMA Ext 25hData left by previously processed Read or Write commands Read Fpdma Queued 60h97/167 Log Address definition 98/167 Read Log Ext2FhGeneral purpose Log Directory Extended comprehensive Smart error log100/167 Error Log versionError log index Extended Error log data structureDevice error count Extended Self-test log sector101/167 Extended Self-test log descriptor entry Command ErrorSelf-test log data structure revision number Self-test descriptor index103/167 Counter Reset MechanismsPhy Event Counter Counter Identifiers104/167 Read Log Ext Log Page 11hPhy Event Counter Identifier Phy Event Counter informationRead Long 22h/23h Read Multiple C4h Read Multiple Command C4hInput Parameters From The Device LBA Low HOB=0 Read Multiple Ext 29hOutput Parameters To The Device Sector Count Current LBA Low CurrentRead Native Max Address F8h 109/167 Read Native Max Address Ext 27hRead Sectors 20h/21h Head number of the last transferred sector. L=0110/167 111/167 Read Sectors Ext 24h112/167 Error occursRead Verify Sectors 40h/41h Will be verified113/167 Read Verify Sectors Ext 42h114/167 Recalibrate 1xhSecurity Disable Password F6h 116/167 Security Erase Prepare F3hIdentifier Security Erase Unit F4hHTS541660J9SA00 HTS541616J9SA00HTS541612J9SA00 HTS541680J9SA00Security Freeze Lock F5h 19-255 Reserved Security Set Password F1h01-16 Password 32 bytes 17-18 Security level 1-Maximum, 0-HighIdentifier=User / Security level = High PasswordSecurity Level Revision CodeRegards Password as Master Password Security Unlock F2hIdentifier 1-Master, 0-User Head number of the seek Seek 7xhCylinder number of the seek Seek. L=1Sense Condition F0h vendor specific Output Parameters To The Device FeatureSet Features EFh Deepest Power Saving mode is Low power Idle Set Max Address F9h Input Parameters From The Device LBA Low 04hSet Max Address Ext 37h 130/167 Set Multiple C6h 132/167 Sleep E6h/99h133/167 14.40.1 S.M.A.R.T. Sub commands14.40.1.1S.M.A.R.T. Read Attribute Values Subcommand D0h 14.40 S.M.A.R.T Function Set B0h14.40.1.4S.M.A.R.T. Save Attribute Values Subcommand D3h LBA High ErrorStatus LBA Mid136/167 14.40.1.6S.M.A.R.T. Read Log Sector Subcommand D5h14.40.1.7S.M.A.R.T. Write Log Sector Subcommand D6h 14.40.1.8S.M.A.R.T. Enable Operations Subcommand D8h137/167 14.40.1.9S.M.A.R.T. Disable Operations Subcommand D9h14.40.1.10 S.M.A.R.T. Return Status Subcommand DAh F8h Enable Automatic Off-line F9hDevice Attributes Data Structure Data Structure Revision Number138/167 Attribute Name Individual Attribute Data StructureValue Definition Off-Line Data Collection StatusSelf-test execution status Bit Automatic Off-Line Data Collection Status14.40.2.8 S.M.A.R.T. Capability Error Logging CapabilityCurrent Segment Pointer Off-Line Data Collection CapabilityIndividual Thresholds Data Structure Device Attribute Thresholds Data StructureSelf-test completion time Data Structure ChecksumAttribute Threshold 14.40.5 S.M.A.R.T. error log sector14.40.4 S.M.A.R.T. Log Directory Attribute ID Numbers14.40.5.1 S.M.A.R.T. error log version Error log pointerError log data structure Selective self-test log data structure Self-test log data structureError Reporting Error Condition1FCh Reserved 1FEh Data structure checksum 1FFh 512 Standby E2h/96h 148/167 Standby Immediate E0h/94h149/167 Write Buffer E8hWrite DMA CAh/CBh Contains current LBA bits 24 27. L=1150/167 151/167 Write DMA Ext 35h152/167 Write DMA FUA Ext 3DhWrite Fpdma Queued 61h Output Parameters To The Device Feature Current154/167 Write Log Ext 3FhWrite Long 32h/33h Write Multiple C5h 157/167 Write Multiple Ext 39h158/167 Write Multiple FUA Ext CEh159/167 Write Sectors 30h/31h160/167 Write Sectors Ext 34hTimings Erase Unit F4h on Specific on162/167 Index Environment Mounting orientation Non-data commandsShock Signal definitions Sleep Physical dimensions PIO Data In commandsPower management features Service life Set Features166/167 149Copyright Hitachi Global Storage Technologies
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HTS541640J9SA00, HTS541616J9SA00, HTS541680J9SA00, HTS541612J9SA00, HTS541660J9SA00 specifications

The Hitachi HTS541660J9SA00, HTS541640J9SA00, HTS541616J9SA00, HTS541680J9SA00, and HTS541612J9SA00 are a series of hard disk drives that showcase Hitachi's commitment to high-performance storage solutions. These drives belong to the Travelstar series, which is designed primarily for mobile computing applications, such as laptops and external storage devices. Their compact design and reliable performance make them suitable for users seeking efficient storage in portable settings.

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In conclusion, the Hitachi HTS541660J9SA00, HTS541640J9SA00, HTS541616J9SA00, HTS541680J9SA00, and HTS541612J9SA00 hard disk drives are exemplary choices for anyone seeking reliable, efficient, and portable storage solutions. With their combination of adequate capacity, enhanced data management technologies, and robust design, these drives effectively meet the demands of today’s mobile computing needs.
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