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| PRELIMINARY | CY7C1333H |
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Pin Definitions |
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| Name | I/O |
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| A0, A1, A | Input- | Address Inputs used to select one of the 64K address locations. Sampled at the rising edge |
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| Synchronous | of the CLK. A[1:0] are fed to the |
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| BW | [A:D] | Input- | Byte Write Inputs, active LOW. Qualified with | WE | to conduct Writes to the SRAM. Sampled on |
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| Synchronous | the rising edge of CLK. |
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| WE |
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| Input- | Write Enable Input, active LOW. Sampled on the rising edge of CLK if | CEN | is active LOW. This |
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| Synchronous | signal must be asserted LOW to initiate a Write sequence. |
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| Input- | Advance/Load Input. Used to advance the |
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| ADV/LD |
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| Synchronous | HIGH (and CEN is asserted LOW) the internal burst counter is advanced. When LOW, a new |
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| address can be loaded into the device for an access. After being deselected, ADV/LD should be |
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| driven LOW in order to load a new address. |
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| CLK |
| Clock Input. Used to capture all synchronous inputs to the device. CLK is qualified with | CEN. | CLK |
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| is only recognized if CEN is active LOW. |
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| 1 |
| Input- | Chip Enable 1 Input, active LOW. Sampled on the rising edge of CLK. Used in conjunction with |
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| CE |
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| Synchronous | CE2, and CE3 to select/deselect the device. |
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| CE2 | Input- | Chip Enable 2 Input, active HIGH. Sampled on the rising edge of CLK. Used in conjunction with |
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| Synchronous | CE1 and CE3 to select/deselect the device. |
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| 3 |
| Input- | Chip Enable 3 Input, active LOW. Sampled on the rising edge of CLK. Used in conjunction with |
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| CE |
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| Synchronous | CE1 and CE2 to select/deselect the device. |
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| Input- | Output Enable, asynchronous input, active LOW. Combined with the synchronous logic block |
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| OE |
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| Asynchronous | inside the device to control the direction of the I/O pins. When LOW, the I/O pins are allowed to |
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| behave as outputs. When deasserted HIGH, I/O pins are |
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| OE is masked during the data portion of a Write sequence, during the first clock when emerging |
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| from a deselected state, when the device has been deselected. |
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| Input- | Clock Enable Input, active LOW. When asserted LOW the Clock signal is recognized by the |
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| CEN |
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| Synchronous | SRAM. When deasserted HIGH the Clock signal is masked. Since deasserting CEN does not |
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| deselect the device, CEN can be used to extend the previous cycle when required. |
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| ZZ | Input- | ZZ “Sleep” Input. This active HIGH input places the device in a |
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| Asynchronous | with data integrity preserved. During normal operation, this pin can be connected to VSS or left |
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| floating. |
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| DQs | I/O- | Bidirectional Data I/O Lines. As inputs, they feed into an |
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| Synchronous | by the rising edge of CLK. As outputs, they deliver the data contained in the memory location |
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| specified by address during the clock rise of the Read cycle. The direction of the pins is controlled |
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| by OE and the internal control logic. When OE is asserted LOW, the pins can behave as outputs. |
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| When HIGH, DQs are placed in a |
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| during the data portion of a Write sequence, during the first clock when emerging from a deselected |
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| state, and when the device is deselected, regardless of the state of OE. |
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| Mode | Input | Mode Input. Selects the burst order of the device. |
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| Strap Pin | When tied to Gnd selects linear burst sequence. When tied to VDD or left floating selects interleaved |
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| burst sequence. |
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| VDD | Power Supply | Power supply inputs to the core of the device. |
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| VDDQ | I/O Power | Power supply for the I/O circuitry. |
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| Supply |
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| VSS | Ground | Ground for the device. |
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| NC | – | No Connects. Not Internally connected to the die. |
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| 4M, 9M,18M,36M, 72M, 144M, 256M, 576M and 1G are address expansion pins and are not |
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| internally connected to the die. |
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Document #: | Page 3 of 12 |
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