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| PRELIMINARY | CY7C1333H |
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Capacitance[11] |
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Parameter |
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| Test Conditions | 100 TQFP Package | Unit |
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CIN | Input Capacitance |
| TA = 25°C, f = 1 MHz, | 5 | pF |
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| VDD = 3.3V |
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CCLOCK | Clock Input Capacitance |
| 5 | pF |
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| VDDQ=3.3V |
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CI/O | I/O Capacitance |
| 5 | pF |
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AC Test Loads and Waveforms
3.3V I/O Test Load
OUTPUT |
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| 3.3V |
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| R = 317Ω |
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| ALL INPUT PULSES | ||||||||||||||||||||
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| VDDQ |
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| Z0 | = 50Ω |
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| OUTPUT |
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| RL | = 50Ω |
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| 10% |
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| 90% |
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| 5 pF |
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| R = 351Ω | GND |
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| ≤ 1 ns |
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| VL = 1.5V |
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| (c) | ||||
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| (a) | JIG AND |
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| SCOPE |
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Switching Characteristics Over the Operating Range [12, 13]
90%
10%
≤ 1 ns
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| 133 MHz | 100 MHz |
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Parameter | Description | Min. | Max. | Min. | Max. | Unit |
tPOWER | VDD(Typical) to the First Access[14] | 1 |
| 1 |
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Clock |
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tCYC | Clock Cycle Time | 7.5 |
| 10 |
tCH | Clock HIGH | 2.5 |
| 4.0 |
tCL | Clock LOW | 2.5 |
| 4.0 |
Output Times |
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ns
ns
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tCDV
tDOH
tCLZ
tCHZ
tOEV
tOELZ
tOEHZ
Data Output Valid after CLK Rise |
| 6.5 |
| 8.0 | ns | ||
Data Output Hold after CLK Rise | 2.0 |
| 2.0 |
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Clock to | 0 |
| 0 |
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Clock to |
| 3.5 |
| 3.5 | ns | ||
OE |
| LOW to Output Valid |
| 3.5 |
| 3.5 | ns |
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| LOW to Output | 0 |
| 0 |
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OE |
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| HIGH to Output |
| 3.5 |
| 3.5 | ns | |
OE |
Set-up Times
tAS |
| Address | 1.5 |
| 2.0 | ||||||
tALS |
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ADV/LD |
| 1.5 |
| 2.0 | |||||||
tWES |
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| [A:D] | 1.5 |
| 2.0 | ||
WE, | BW | ||||||||||
tCENS |
| CEN | 1.5 |
| 2.0 | ||||||
tDS |
| Data Input | 1.5 |
| 2.0 | ||||||
tCES |
| Chip Enable | 1.5 |
| 2.0 |
Notes:
12.Timing reference level is 1.5V when VDDQ=3.3V
13.Test conditions shown in (a) of AC Test Loads, unless otherwise noted.
ns
ns
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ns
ns
ns
14.This part has a voltage regulator internally; tPOWER is the time that the power needs to be supplied above VDD minimum initially before a Read or Write operation can be initiated.
15.tCHZ, tCLZ,tOELZ, and tOEHZ are specified with AC test conditions shown in part (b) of AC Test Loads. Transition is measured ± 200 mV from
16.At any given voltage and temperature, tOEHZ is less than tOELZ and tCHZ is less than tCLZ to eliminate bus contention between SRAMs when sharing the same data bus. These specifications do not imply a bus contention condition, but reflect parameters guaranteed over worst case user conditions. Device is designed to achieve
17.This parameter is sampled and not 100% tested.
Document #: | Page 8 of 12 |
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