Cypress CY62147EV30 manual Switching Characteristics, Min Max Read Cycle, Write Cycle16

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CY62147EV30 MoBL®

Switching Characteristics

Over the Operating Range [12, 13]

Parameter

 

 

 

 

 

 

 

Description

45 ns (Ind’l/Auto-A)

55 ns (Auto-E)

Unit

 

 

 

 

 

 

 

Min

Max

Min

Max

 

 

 

 

 

 

 

 

 

 

Read Cycle

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

tRC

 

Read Cycle Time

45

 

55

 

ns

tAA

 

Address to Data Valid

 

45

 

55

ns

tOHA

 

Data Hold from Address Change

10

 

10

 

ns

tACE

 

 

 

 

LOW to Data Valid

 

45

 

55

ns

CE

 

 

tDOE

 

 

 

 

LOW to Data Valid

 

22

 

25

ns

OE

 

 

t

 

 

 

 

LOW to LOW Z[14]

5

 

5

 

ns

OE

 

 

LZOE

 

 

 

 

 

 

 

 

 

 

 

 

 

t

 

 

 

 

HIGH to High Z[14, 15]

 

18

 

20

ns

OE

 

 

HZOE

 

 

 

 

 

 

 

 

 

 

 

 

 

tLZCE

 

 

 

LOW to Low Z[14]

10

 

10

 

ns

CE

 

 

t

 

 

 

HIGH to High Z[14, 15]

 

18

 

20

ns

CE

 

 

HZCE

 

 

 

 

 

 

 

 

 

 

 

 

 

tPU

 

 

 

LOW to Power Up

0

 

0

 

ns

CE

 

 

tPD

 

 

 

HIGH to Power Down

 

45

 

55

ns

CE

 

 

tDBE

 

 

 

 

 

 

 

 

 

45

 

55

ns

BLE/BHE LOW to Data Valid

 

 

tLZBE

 

 

 

 

 

 

 

 

10

 

10

 

ns

BLE/BHE LOW to Low Z[14]

 

 

t

 

 

 

 

 

 

 

 

 

18

 

20

ns

BLE/BHE HIGH to HIGH Z[14, 15]

 

 

HZBE

 

 

 

 

 

 

 

 

 

 

 

 

 

Write Cycle[16]

 

 

 

 

 

 

 

 

 

 

 

 

 

tWC

 

Write Cycle Time

45

 

55

 

ns

tSCE

 

 

 

LOW to Write End

35

 

40

 

ns

CE

 

 

tAW

 

Address Setup to Write End

35

 

40

 

ns

tHA

 

Address Hold from Write End

0

 

0

 

ns

tSA

 

Address Setup to Write Start

0

 

0

 

ns

tPWE

 

 

 

 

Pulse Width

35

 

40

 

ns

WE

 

 

tBW

 

 

 

 

 

 

 

 

35

 

40

 

ns

BLE/BHE LOW to Write End

 

 

tSD

 

Data Setup to Write End

25

 

25

 

ns

tHD

 

Data Hold from Write End

0

 

0

 

ns

t

 

 

 

 

LOW to High-Z[14, 15]

 

18

 

20

ns

WE

 

 

HZWE

 

 

 

 

 

 

 

 

 

 

 

 

 

tLZWE

 

 

 

 

HIGH to Low-Z[14]

10

 

10

 

ns

WE

 

 

Notes

12.Test conditions for all parameters other than tri-state parameters assume signal transition time of 3 ns (1V/ns) or less, timing reference levels of VCC(typ)/2, input pulse levels of 0 to VCC(typ), and output loading of the specified IOL/IOH as shown in the AC Test Load and Waveforms on page 4.

13.AC timing parameters are subject to byte enable signals (BHE or BLE) not switching when chip is disabled. See application note AN13842 for further clarification.

14.At any temperature and voltage condition, tHZCE is less than tLZCE, tHZBE is less than tLZBE, tHZOE is less than tLZOE, and tHZWE is less than tLZWE for any device.

15.tHZOE, tHZCE, tHZBE, and tHZWE transitions are measured when the outputs enter a high impedance state.

16.The internal write time of the memory is defined by the overlap of WE, CE = VIL, BHE, BLE, or both = VIL. All signals must be active to initiate a write and any of these signals can terminate a write by going inactive. The data input setup and hold timing must be referenced to the edge of the signal that terminates the write.

Document #: 38-05440 Rev. *G

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Contents Logic Block Diagram FeaturesFunctional Description Cypress Semiconductor Corporation 198 Champion CourtProduct Portfolio Pin ConfigurationTyp2 Max CY62147EV30LL Ind’l/Auto-AMaximum Ratings Electrical CharacteristicsOperating Range CapacitanceThermal Resistance9 Data Retention CharacteristicsParameter Description Test Conditions Parameters 50V UnitParameter Description Ns Ind’l/Auto-A Ns Auto-E Unit Min Switching CharacteristicsMin Max Read Cycle Write Cycle16Data OUT Previous Data Valid Switching WaveformsAddress Data IO Write Cycle No WE Controlled1, 16, 20Write Cycle No WE Controlled, OE LOW1 Ordering Information IOs Mode PowerTruth Table Ball Vfbga 6 x 8 x 1 mm Package Diagrams51-85087-*A SYT AJUZSD NXRUSB Sales, Solutions, and Legal Information

CY62147EV30 specifications

The Cypress CY62147EV30 is a high-performance, low-power Static Random Access Memory (SRAM) device that has garnered attention in various applications due to its remarkable features and technologies. This SRAM provides a robust solution for applications requiring fast, reliable data access in a compact form factor.

One of the main features of the CY62147EV30 is its density of 1 Megabit, which is organized as 128K x 8 bits. This configuration allows for significant data storage while maintaining a small footprint, making it suitable for embedded systems and portable devices. The device operates with a voltage range of 2.7V to 3.6V, which is critical for battery-operated applications where power consumption is a key concern.

The CY62147EV30 utilizes a synchronous operation mode, which contributes to faster data transfer rates. With access times as low as 30 nanoseconds, it provides swift read and write operations, enabling quick response times in demanding computational environments. This speed is particularly beneficial for applications in telecommunications, automotive systems, and consumer electronics, where real-time data processing is essential.

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Additionally, the CY62147EV30 includes a variety of features designed to enhance reliability and data integrity. These include an automatic power-down feature that reduces power usage during inactive periods and built-in write protection to safeguard against unintended data corruption. The device also adheres to strict quality and reliability standards, making it a trustworthy choice for mission-critical applications.

In summary, the Cypress CY62147EV30 is distinguished by its 1 Megabit density, low power consumption, fast access times, and enhanced reliability features. These characteristics make it an ideal solution for a wide range of applications, from automotive systems to portable devices, where performance, efficiency, and reliability are paramount. With its advanced technological design, the CY62147EV30 continues to meet the evolving demands of modern electronic applications.