Roper Photometric manual Charge Transfer

Page 36

A thin layer of silicon dioxide is grown on a section of silicon and a conductive gate structure is applied over the oxide. Applying a positive electrical potential to the gate creates a depletion region where the free electrons generated by incoming photons can be stored. A potential well collects electronic charge from any source until the well is filled. Practical potential well capacities range up to a million electrons. Depletion depths range from a few micrometers up to tens of micrometers in specially prepared silicon.

Electrons freed by thermal agitation and by high-energy particles are indistinguishable from those generated by photon interaction. These dark electrons can have an adverse effect on the detection limits for photon-induced charge.

Charge Transfer The charge collected in a potential well must be brought to an output amplifier. When a series of oxide and conductive gate structures is fabricated with multiple phases, potential wells can be propagated through a silicon sheet.

This charge transfer concept is essential to understanding charge-coupled devices. When an appropriate sequence of potentials is applied to the gates, the potential wells are propagated in the direction shown in the figure Charge Transfer. Any charge that has been collected is carried along in the wells, and the charge packets in each potential well remain separated. Charge packets can be transferred thousands of times without significant loss of charge.

Charge Transfer

Direction of Charge Transfer

Phase 1

Phase 2

Phase 3

Gate

SiO2layer

 

 

 

 

 

 

 

 

 

t0

Q 2

 

Q 1

t1

 

 

 

Q 1

Q 2

t2

Q 2

 

Q 1

t3

 

 

 

Q 1

Q 2

t4

 

 

 

Q 1

Q 2

 

 

 

 

The illustration is simplified to emphasize the concept. To ensure effective charge transfer, charge propagation actually occurs in a channel buried just below the surface, where there is no interference from interface states. The gates actually overlap, to create the drift field required for efficient charge transfer.

30Advanced Camera Operation Manual

Image 36
Contents Page Rev C1 Limited Warranty Roper Scientific Analytical Instrumentation Your Responsibility Table of Contents Index Introduction DescriptionSoftware Roper Scientific Customer Service BeneluxICL Following parameters are illegal Multiple Parameter FunctionsICL Function Syntax Readout / Display Function Definitions ClearparallelclearcountClearuntiltrig Exposeuntiltrig ExposewhiletrigclearfirstLoopend Pixeldisplayx,yPixelreadoutsoffset, ssize, sbin, psize, pbin Scriptbegin ScriptendcontinclearShiftimagetostorage Shiftmodeis ShiftmodeisaltShiftmodeism ShiftmodeismaltShutteropen Example Scripts Open the ShutterSingle Image TDI Time Delay Integration Panorama Ratio Imaging 2-Frame Ratio Ratio Imaging Multi-Frame Ratio CCD ESignal to Begin the Experiment Color SequenceIntermittent Exposure Good Exposure TimeHigh-Speed Spectroscopy Done EXPOSING, NOW ReadoutError Codes Man Pages Class 101 ICL Plexpdisplayscript101Class 101 ICL Plexpinitscript101 Boolean plexpinitscriptvoidClass 101 ICL Plexplisterrscript101 Class 101 ICL Plexpsetupscript101 Class 101 ICL Plexpstartscript101 Boolean Plexpstartscriptint16 hcam, voidptr pixelstreamClass 101 ICL Plexpuninitscript101 Boolean plexpuninitscript voidICL This page intentionally left blank Introduction Theory of Operation Potential WellsCharge Transfer Typical CCD Imager CCD Readout Subarray Readout Binned Readout CCD Architectures CCD ArchitecturesFrame Transfer Variations Resolution Sensitivity CCD Camera ImplementationsThick and Thinned CCDs Sources of Noise FiberopticsSNR Additional Reading This page intentionally left blank Index Page Index Benelux France Germany Japan