Item (NB Cont.)

 

Features

 

 

 

• The RS880M complies with all relevant Windows Logo Program

 

 

(WLP) requirements from Microsoft for WHQL certification.

 

Test Capability Features

 

The RS880M has a variety of test modes and capabilities that provide a

 

very high fault coverage and low DPM (Defect Per Million) ratio:

 

• Full scan implementation on the digital core logic through ATPG

 

 

(Automatic Test Pattern Generation Vectors).

 

• Dedicated test logic for the on-chip custom memory macros to

 

 

provide complete coverage on these modules.

 

• A JTAG test mode to allow board level testing of neighboring

 

 

devices.

 

• An EXOR tree test mode on all the digital USB's to allow for proper

 

 

soldering verification at the board level.

 

• A VOH/VOL test mode on all digital USB¡¦s to allow for proper

 

 

verification of output high and output low values at the board level.

 

• Access to the analog modules to allow full evaluation and

 

 

characterization.

 

• IDDQ mode support to allow chip evaluation through current leakage

 

 

measurements.

 

• These test modes can be accessed through the settings on the

 

 

instruction register of the JTAG circuitry.

 

Additional Features

 

• Integrated spread spectrum PLLs on the memory and LVDS

 

 

interface.

 

 

 

Chapter 1

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Acer 553G, 5553 manual RS880M complies with all relevant Windows Logo Program