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Document #: 38-05673 Rev. *B Page 9 of 16
Capacitance[10]
Parameter Description Test Conditions 100 TQFP
Max. Unit
CIN Input Capacitance TA = 25°C, f = 1 MHz,
VDD = 3.3V
VDDQ = 2.5V
5pF
CCLK Clock Input Capacitance 5 pF
CI/O Input/Output Capacitance 5 pF
Thermal Resistance[10]
Parameter Description Test Conditions 100 TQFP
Package Unit
ΘJA Thermal Resistance
(Junction to Ambient) Test conditions follow standard test
methods and procedures for
measuring thermal impedance, per
EIA/JESD51
30.32 °C/W
ΘJC Thermal Resistance
(Junction to Case) 6.85 °C/W
AC Test Loads and Waveforms
OUTPUT
R = 317Ω
R = 351Ω
5pF
INCLUDING
JIG AND
SCOPE
(a) (b)
OUTPUT
RL= 50Ω
Z0= 50Ω
V
T
= 1.5V
3.3V ALL INPUT PULSES
VDDQ
GND
90%
10% 90%
10%
≤1 ns ≤1 ns
(c)
OUTPUT
R = 1667Ω
R =1538Ω
5pF
INCLUDING
JIG AND
SCOPE
(a) (b)
OUTPUT
RL= 50Ω
Z0= 50Ω
VT= 1.25V
2.5V ALL INPUT PULSES
VDDQ
GND
90%
10% 90%
10%
≤1 ns ≤1 ns
(c)
3.3V I/O Test Load
2.5V I/O Test Load
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