CY7C1353GDocument #: 38-05515 Rev. *E Page 7 of 13
Maximum Ratings
Exceeding maximum ratings may impair the useful life of the
device. These user guidelines are not tested.
Storage Temperature .................................–65°C to +150°C
Ambient Temperature with
Power Applied.............................................–55°C to +125°C
Supply Voltage on VDD Relative to GND........–0.5V to +4.6V
Supply Voltage on VDDQ Relative to GND......–0.5V to +VDD
DC Voltage Applied to Outputs
in tri-state............................................ –0.5V to VDDQ + 0.5V
DC Input Voltage...................................–0.5V to VDD + 0.5V
Current into Outputs (LOW).........................................20 mA
Static Discharge Voltage.......................................... > 2001V
(MIL-STD-883, Method 3015)
Latch up Current.................................................... > 200 mA
Operating Range
Range
Ambient
Temperature (TA) VDD VDDQ
Commercial 0°C to +70°C 3.3V – 5%/+10% 2.5V – 5%
to VDD
Industrial −40°C to +85°C
Electrical Characteristics Over the Operating Range [10,11]
Parameter Description Test Conditions Min Max Unit
VDD Power Supply Voltage 3.135 3.6 V
VDDQ IO Supply Voltage 2.375 VDD V
VOH Output HIGH Voltage for 3.3V IO, IOH = –4.0 mA 2.4 V
for 2.5V IO, IOH = –1.0 mA 2.0 V
VOL Output LOW Voltage for 3.3V IO, IOH = 8.0 mA 0.4 V
for 2.5V IO, IOH = 1.0 mA 0.4 V
VIH Input HIGH Voltage for 3.3V IO 2.0 VDD + 0.3V V
Input HIGH Voltage for 2.5V IO 1.7 VDD + 0.3V V
VIL Input LOW Voltage[10] for 3.3V IO –0.3 0.8 V
Input LOW Voltage[10] for 2.5V IO –0.3 0.7 V
IXInput Leakage Current
except ZZ and MODE
GND ≤ VI ≤ VDDQ −55µA
Input Current of MODE Input = VSS –30 µA
Input = VDD 5µA
Input Current of ZZ Input = VSS –5 µA
Input = VDD 30 µA
IOZ Output Leakage Current GND ≤ VI ≤ VDDQ, Output Disabled –5 5 µA
IDD VDD Operating Supply
Current
VDD = Max., IOUT = 0 mA,
f = fMAX= 1/tCYC
7.5-ns cycle, 133 MHz 225 mA
10-ns cycle, 100 MHz 205 mA
ISB1 Automatic CE Power down
Current—TTL Inputs
VDD = Max, Device Deselected,
VIN ≥ VIH or VIN ≤ VIL, f = fMAX,
inputs switching
7.5-ns cycle, 133 MHz 90 mA
10-ns cycle, 100 MHz 80 mA
ISB2 Automatic CE Power down
Current—CMOS Inputs
VDD = Max, Device Deselected,
VIN ≥ VDD – 0.3V or VIN ≤ 0.3V,
f = 0, inputs static
All speeds 40 mA
ISB3 Automatic CE Power down
Current—CMOS Inputs
VDD = Max, Device Deselected,
VIN ≥ VDDQ – 0.3V or VIN ≤ 0.3V,
f = fMAX, inputs switching
7.5-ns cycle, 133 MHz 75 mA
10-ns cycle, 100 MHz 65 mA
ISB4 Automatic CE Power down
Current—TTL Inputs
VDD = Max, Device Deselected,
VIN ≥ VDD – 0.3V or VIN ≤ 0.3V,
f = 0, inputs static
All speeds 45 mA
Notes:
10.Overshoot: VIH(AC) < VDD +1.5V (Pulse width less than tCYC/2), undershoot: VIL(AC)> –2V (Pulse width less than tCYC/2).
11.T Power-up: Assumes a linear ramp from 0V to VDD (min.) within 200 ms. During this time VIH < VDD and VDDQ < VDD.
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