CY7C199
Maximum Ratings
(Above which the useful life may be impaired. For user guide- lines, not tested.)
Storage Temperature | |
Ambient Temperature with | |
Power Applied | |
Supply Voltage to Ground Potential |
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(Pin 28 to Pin 14) |
DC Voltage Applied to Outputs |
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in High Z State[1] | |
DC Input Voltage[1] | |
| CC |
Output Current into Outputs (LOW) | 20 mA |
Static Discharge Voltage | >2001V |
(per |
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>200 mA |
Operating Range
Range | Ambient Temperature[2] | VCC | |
Commercial | 0° C to +70° C | 5V ± | 10% |
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Industrial | 5V ± | 10% | |
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Military | 5V ± | 10% | |
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Electrical Characteristics Over the Operating Range[3]
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Parameter | Description | Test Conditions | Min. | Max. | Min. | Max. | Min. | Max. | Min. | Max. | Unit | |
VOH | Output HIGH | VCC = Min., | 2.4 |
| 2.4 |
| 2.4 |
| 2.4 |
| V | |
| Voltage |
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VOL | Output LOW | VCC = Min., IOL=8.0 mA |
| 0.4 |
| 0.4 |
| 0.4 |
| 0.4 | V | |
| Voltage |
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VIH | Input HIGH |
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| 2.2 | VCC | 2.2 | VCC | 2.2 | VCC | 2.2 | VCC | V |
| Voltage |
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| +0.3V |
| +0.3V |
| +0.3V |
| +0.3V |
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VIL | Input LOW |
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| 0.8 | 0.8 | 0.8 | 0.8 | V | ||||
| Voltage |
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IIX | Input Load | GND < VI < VCC |
| +5 | +5 | +5 | +5 | ∝ A | ||||
| Current |
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IOZ | Output Leakage | GND < VO < VCC, |
| +5 | +5 | +5 | +5 | ∝ A | ||||
| Current | Output Disabled |
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ICC | VCC Operating | VCC = Max., | Com’l |
| 120 |
| 110 |
| 160 |
| 155 | mA |
| Supply Current | IOUT = 0 mA, | L |
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| 85 |
| 85 |
| 100 | mA |
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| f = fMAX = 1/tRC |
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| Mil |
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| 180 | mA | |
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ISB1 | Automatic CE | Max. VCC, | Com’l |
| 5 |
| 5 |
| 30 |
| 30 | mA |
| CE > VIH, | L |
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| 5 |
| 5 |
| 5 | mA | |
| Current— TTL | VIN > VIH or |
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| Inputs | VIN < VIL, f = fMAX |
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ISB2 | Automatic CE | Max. VCC, | Com’l |
| 0.5 |
| 0.5 |
| 10 |
| 10 | mA |
| CE > VCC – 0.3V | L |
| 0.05 |
| 0.05 |
| 0.05 |
| 0.05 | mA | |
| Current— CMOS | VIN > VCC – 0.3V |
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| Mil |
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| 15 | mA | ||
| Inputs | or VIN < 0.3V, f = 0 |
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Shaded area contains advance information.
Notes:
1.VIL (min.) =
2.TA is the “instant on” case temperature.
3.See the last page of this specification for Group A subgroup testing information.
Document #: | Page 2 of 16 |
