STK11C68

AC Switching Characteristics

 

 

 

 

 

 

 

 

SRAM Read Cycle

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Parameter

Description

25 ns

35 ns

45 ns

Unit

Cypress

Alt

Min

Max

Min

Max

Min

 

Max

Parameter

 

 

 

 

 

 

 

 

 

 

 

 

 

tACE

tELQV

Chip Enable Access Time

 

25

 

35

 

 

45

ns

tRC [4]

tAVAV, tELEH

Read Cycle Time

25

 

35

 

45

 

 

ns

tAA [5]

tAVQV

Address Access Time

 

25

 

35

 

 

45

ns

tDOE

tGLQV

Output Enable to Data Valid

 

10

 

15

 

 

20

ns

tOHA [5]

tAXQX

Output Hold After Address Change

5

 

5

 

5

 

 

ns

tLZCE [6]

tELQX

Chip Enable to Output Active

5

 

5

 

5

 

 

ns

tHZCE [6]

tEHQZ

Chip Disable to Output Inactive

 

10

 

13

 

 

15

ns

tLZOE [6]

tGLQX

Output Enable to Output Active

0

 

0

 

0

 

 

ns

tHZOE [6]

tGHQZ

Output Disable to Output Inactive

 

10

 

13

 

 

15

ns

tPU [3]

tELICCH

Chip Enable to Power Active

0

 

0

 

0

 

 

ns

tPD [3]

tEHICCL

Chip Disable to Power Standby

 

25

 

35

 

 

45

ns

Switching Waveforms

Figure 5. SRAM Read Cycle 1: Address Controlled [4, 5]

$''5(66

W5&

W$$

W2+$

'4 '$7$287

'$7$9$/,'

Figure 6. SRAM Read Cycle 2: CE and OE Controlled [4]

$''5(66

&(

2(

'4 '$7$287

,&&

W5&

W$&(

W/=&(

W'2(

W/=2(

W38 $&7,9(

67$1'%<

W3'

W+=&(

W+=2(

'$7$9$/,'

Notes

4.WE must be High during SRAM Read cycles.

5.I/O state assumes CE and OE < VIL and WE > VIH; device is continuously selected.

6.Measured ±200 mV from steady state output voltage.

Document Number: 001-50638 Rev. **

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Cypress STK11C68 manual AC Switching Characteristics, Switching Waveforms, Min Max, Parameter