STK11C88

AC Switching Characteristics

 

 

 

 

 

 

SRAM Read Cycle

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Parameter

 

Description

 

25 ns

45 ns

Unit

Cypress

Alt

 

Min

 

Max

Min

Max

Parameter

 

 

 

 

 

 

 

 

 

 

 

 

 

tACE

tELQV

 

Chip Enable Access Time

 

 

25

 

45

ns

tRC [5]

tAVAV, tELEH

 

Read Cycle Time

25

 

 

45

 

ns

tAA [6]

tAVQV

 

Address Access Time

 

 

25

 

45

ns

tDOE

tGLQV

 

Output Enable to Data Valid

 

 

10

 

20

ns

tOHA [6]

tAXQX

 

Output Hold After Address Change

5

 

 

5

 

ns

tLZCE [7]

tELQX

 

Chip Enable to Output Active

5

 

 

5

 

ns

tHZCE [7]

tEHQZ

 

Chip Disable to Output Inactive

 

 

10

 

15

ns

tLZOE [7]

tGLQX

 

Output Enable to Output Active

0

 

 

0

 

ns

tHZOE [7]

tGHQZ

 

Output Disable to Output Inactive

 

 

10

 

15

ns

tPU [4]

tELICCH

 

Chip Enable to Power Active

0

 

 

0

 

ns

tPD [4]

tEHICCL

 

Chip Disable to Power Standby

 

 

25

 

45

ns

Switching Waveforms

Figure 5. SRAM Read Cycle 1: Address Controlled [5, 6]

$''5(66

W5&

W$$

W2+$

'4 '$7$287

'$7$9$/,'

Figure 6. SRAM Read Cycle 2: CE and OE Controlled [5]

$''5(66

&(

2(

'4 '$7$287

,&&

W5&

W$&(

W/=&(

W'2(

W/=2(

W38 $&7,9(

67$1'%<

W3'

W+=&(

W+=2(

'$7$9$/,'

Notes

5.WE must be HIGH during SRAM Read Cycles and LOW during SRAM WRITE cycles.

6.I/O state assumes CE and OE < VIL and WE > VIH; device is continuously selected.

7.Measured ±200 mV from steady state output voltage.

Document Number: 001-50591 Rev. **

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Cypress STK11C88 manual AC Switching Characteristics, Switching Waveforms, Sram Read Cycle