Cypress STK14C88-3 STK14C88-3

STK14C88-3
Document Number: 001-50592 Rev. ** Page 8 of 17
Data Retention and Endurance
Parameter Description Min Unit
DATA
R
Data Retention 100 Years
NV
C
Nonvolatile STORE Operations 1,000 K
Capacitance
In the following table, the capacitance parameters are listed.
[8]
Parameter Description Test Conditions Max Unit
C
IN
Input Capacitance T
A
= 25°C, f = 1 MHz,
V
CC
= 0 to 3.0 V 5pF
C
OUT
Output Capacitance 7 pF
Thermal Resistance
In the following table, the thermal resistance parameters are listed.
[8]
Parameter Description Test Conditions 32-SOIC 32-PDIP Unit
Θ
JA
Thermal Resistance
(Junction to Ambient) Test conditions follow standard test methods and procedures for measuring thermal impedance, per
EIA / JESD51.
TBD TBD °C/W
Θ
JC
Thermal Resistance
(Junction to Case) TBD TBD °C/W
Figure 6. AC Test Loads
AC Test Conditions
3.3V
Output
30 pF
R1 317Ω
R2
351Ω
Input Pulse Levels..................................................0 V to 3 V
Input Rise and Fall Times (10% - 90%)........................ <5 ns
Input and Output Timing Reference Levels................... 1.5 V
Note
8. These parameters are guaranteed by design and are not tested.
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