STK14C88-3

AC Switching Characteristics

 

 

 

 

 

 

 

SRAM Read Cycle

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Parameter

 

Description

 

35 ns

45 ns

Unit

Cypress

Alt

 

Min

 

Max

Min

 

Max

Parameter

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

tACE

tELQV

 

Chip Enable Access Time

 

 

35

 

 

45

ns

tRC [9]

tAVAV, tELEH

 

Read Cycle Time

35

 

 

45

 

 

ns

tAA [10]

tAVQV

 

Address Access Time

 

 

35

 

 

45

ns

tDOE

tGLQV

 

Output Enable to Data Valid

 

 

15

 

 

20

ns

tOHA [10]

tAXQX

 

Output Hold After Address Change

5

 

 

5

 

 

ns

tLZCE [11]

tELQX

 

Chip Enable to Output Active

5

 

 

5

 

 

ns

tHZCE [11]

tEHQZ

 

Chip Disable to Output Inactive

 

 

13

 

 

15

ns

tLZOE [11]

tGLQX

 

Output Enable to Output Active

0

 

 

0

 

 

ns

tHZOE [11]

tGHQZ

 

Output Disable to Output Inactive

 

 

13

 

 

15

ns

tPU [8]

tELICCH

 

Chip Enable to Power Active

0

 

 

0

 

 

ns

tPD [8]

tEHICCL

 

Chip Disable to Power Standby

 

 

35

 

 

45

ns

Switching Waveforms

Figure 7. SRAM Read Cycle 1: Address Controlled [9, 10]

$''5(66

W5&

W$$

W2+$

'4 '$7$287

'$7$9$/,'

Figure 8. SRAM Read Cycle 2: CE and OE Controlled [9]

$''5(66

&(

2(

'4 '$7$287

,&&

W5&

W$&(

W/=&(

W'2(

W/=2(

W38 $&7,9(

67$1'%<

W3'

W+=&(

W+=2(

'$7$9$/,'

Notes

9.WE and HSB must be HIGH during SRAM Read Cycles.

10.I/O state assumes CE and OE < VIL and WE > VIH; device is continuously selected.

11.Measured ±200 mV from steady state output voltage.

Document Number: 001-50592 Rev. **

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Cypress STK14C88-3 manual AC Switching Characteristics, Switching Waveforms