STK15C88
Document Number: 001-50593 Rev. ** Page 7 of 15
Data Retention and Endurance
Parameter Description Min Unit
DATA
R
Data Retention 100 Years
NV
C
Nonvolatile STORE Operations 1,000 K
Capacitance
In the following table, the capacitance parameters are listed.
[4]
Parameter Description Test Conditions Max Unit
C
IN
Input Capacitance T
A
= 25°C, f = 1 MHz,
V
CC
= 0 to 3.0 V 5pF
C
OUT
Output Capacitance 7 pF
Thermal Resistance
In the following table, the thermal resistance parameters are listed.
[4]
Parameter Description Test Conditions 28-SOIC
(300 mil) 28-SOIC
(330 mil) Unit
Θ
JA
Thermal Resistance
(Junction to Ambient) Test conditions follow standard test methods and
procedures for measuring thermal impedance,
per EIA / JESD51.
TBD TBD °C/W
Θ
JC
Thermal Resistance
(Junction to Case) TBD TBD °C/W
Figure 4. AC Test Loads
AC Test Conditions
5.0V
Output
30 pF
R1 480Ω
R2
255Ω
Input Pulse Levels..................................................0 V to 3 V
Input Rise and Fall Times (10% - 90%)........................ <5 ns
Input and Output Timing Reference Levels................... 1.5 V
Note
4. These parameters are guaranteed by design and are not tested.
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