
Absolute Maximum Ratings
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be operable above the recommended operating conditions and stressing the parts to these levels is not recommended. In addi- tion, extended exposure to stresses above the recommended operating conditions may affect device reliability. The absolute maximum ratings are stress ratings only.
Symbol | Parameter | Min. | Max. | Unit | ||
| IN, OUTA, OUTB, ONA, ONB, FLAGB(A), FLAGB(B) to GND | 6.0 | V | |||
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| SO8 |
| 0.8(1) |
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PD | Power Dissipation |
| 1.4(2) | W | ||
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MLP |
| 0.6(3) | ||||
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| 2.2(4) |
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TSTG | Storage Temperature | +150 | °C | |||
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| SO8 |
| 158(1) |
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ΘJA | Thermal Resistance, |
| 92(2) | °C/W | ||
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MLP |
| 216(3) | ||||
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| 57(4) |
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ESD | Electrostatic Discharge Protection | Human Body Model, | 4000 |
| V | |
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Charged Device Model, | 2000 |
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Notes:
1.
2.
3.Soldered thermal pad on a
4.Soldered thermal pad on a
Recommended Operating Range
The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not recommend exceeding them or designing to absolute maximum ratings.
Symbol | Parameter | Min. | Max. | Unit |
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IN | Supply Input | 1.8 | 5.5 | V |
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TA | Ambient Operating Temperature | +85 | °C |
Switch Limit Current
© 2009 Fairchild Semiconductor Corporation | www.fairchildsemi.com |
FPF2300/02/03 • Rev. 1.1.3 | 4 |