7K200 SATA OEM Specification

14.39.7Selective self-test log data structure

The Selective self-test log is a log that may be both written and read by the host. This log allows the host to select the parameters for the self-test and to monitor the progress of the self-test. The following table defines the contents of the Selective self-test log which is 512 bytes long. All multi-byte fields shown in these data structures follow the specifications for byte ordering.

Description

Bytes

Offset

Read/Write

Data structure revision

2

00h

R/W

Starting LBA for test span 1

8

02h

R/W

Ending LBA for test span 1

8

0Ah

R/W

Starting LBA for test span 2

8

12A

R/W

Ending LBA for test span 2

8

1Ah

R/W

Starting LBA for test span 3

8

22h

R/W

Ending LBA for test span 3

8

2Ah

R/W

Starting LBA for test span 4

8

32h

R/W

Ending LBA for test span 4

8

3Ah

R/W

Starting LBA for test span 5

8

42h

R/W

Ending LBA for test span 5

8

4Ah

R/W

Reserved

256

52h

Reserved

Vendor specific

154

152h

Vendor specific

Current LBA under test

8

1ECh

Read

Current span under test

2

1F4h

Read

Feature flags

2

1F6

R/W

Vendor specific

4

1F8h

Vendor specific

Selective self test pending time

2

1FCh

R/W

Reserved

1

1FEh

Reserved

Data structure checksum

1

1FFh

R/W

 

512

 

 

Table 122 Selective self-test log data structure

14.39.8Error Reporting

The following table shows the values returned in the Status and Error Registers when specific error conditions are encountered by a device.

Error Condition

Status Register

Error Register

A S.M.A.R.T. FUNCTION SET command was received

51h

04h

by the device without the required key being loaded into

 

 

the LBA High and LBA Mid registers.

 

 

A S.M.A.R.T. FUNCTION SET command was received

51h

04h

by the device with a subcommand value in the Features

 

 

Register that is either invalid or not supported by this

 

 

device.

 

 

A S.M.A.R.T. FUNCTION SET command subcommand

51h

04h

other than S.M.A.R.T. ENABLE OPERATIONS was

 

 

received by the device while the device was in a

 

 

“S.M.A.R.T. disabled” state.

 

 

The device is unable to read its Attribute Values or

51h

10h or 40h

Attribute Thresholds data structure.

 

 

The device is unable to write to its Attribute Values data

51h

10h or 01h

structure.

 

 

 

 

 

Table 123 S.M.A.R.T. Error Codes

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Hitachi HDS723020BLA642 manual Selective self-test log data structure, Error Reporting, M.A.R.T. Error Codes

HDS723020BLA642 specifications

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