4.3From the TEM BRIGHTFIELD page, press COMPUSTAGE once; the COMPUSTAGE REGISTER CONTROL page will appear.

4.4Press A-WOBBLER; this will initiate back-and-forth tilting of the goniometer.

4.5Use the Z control lever on the JOYSTICK to move the specimen up or down and thus minimize apparent movement of the centered feature.

4.6When the feature moves only minimally or not at all, press the A-WOBBLER key to inactivate tilting; then press the READY button to return to TEM BRIGHTFIELD.

5.Pivot Point Alignment

Ensure that the specimen is eucentric before performing this procedure. For this procedure you may work with the OBJECTIVE APERTURE in place to protect your specimen.

5.1Center (X/Y JOYSTICK) and focus (concentric knobs under STEP SIZE) an image feature at 24,500x (MAG knob).

5.2Press the ALGN button to access the ALIGNMENT SELECTION page. (Note that the alignments are divided into PROCEDURES (on the left side of the page) and DIRECT alignments (most of which are on the right side of the page). Most users will not want to access the PROCEDURES, which are long and complicated. For this set of instructions we will be using only the DIRECT alignments.)

5.3Using the INTENSITY knob, adjust the beam to crossover.

5.4Press the beamcoils PIVOT POINT X key, on the right side of the page, so that it is highlighted.

5.5Using the MULTIFUNCTION X/Y knobs, bring the two beam spots (the pivot points, on the fluorescent viewing screen) together so that they overlap.

5.6Center the coinciding spots using the SHIFT X/Y knobs.

5.7Press the beamcoils PIVOT POINT Y key.

5.8Using the MULTIFUNCTION X/Y knobs, bring the two beam spots together so that they overlap.

5.9Center the coinciding spots using the SHIFT X/Y knobs.

5.10Press the ALGN button to exit the ALIGNMENT SELECTION page.

6.Rotation Center Alignment

This procedure may be performed with the OBJECTIVE APERTURE in place to protect the specimen and add contrast to the image.

6.1Focus and center a feature of the specimen at 100,000x.

6.2Press ALGN to open the ALIGNMENT SELECTION page. On the upper right-hand side of the page, press ROT CENTER so that it becomes highlighted. Now either voltage or current centering may be performed.

6.3VOLTAGE CENTERING

(i)On the lower right-hand side of the page, select VOLT (under rot center VOLT CURR) so that it becomes highlighted. This will cause the high tension to modulate (the inner STEP SIZE knob adjusts the amplitude of modulation). If the chosen feature shifts off center laterally, the beam is not aligned along the optical axis of the microscope and must be corrected.

(ii)Use the MULTIFUNCTION X/Y knobs to stabilize the feature at the center of the screen, eliminating all lateral movement. The feature should appear to be pulsating.

(iii)Press the ALGN button to return to the TEM BRIGHTFIELD page.

6.3.1Current centering:

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Philips CM-200 manual Pivot Point Alignment, Rotation Center Alignment, Voltage Centering
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CM-200 specifications

The Philips CM-200 is a sophisticated electron microscope designed to facilitate high-resolution imaging and analysis of materials at the nanoscale. Renowned for its robust performance and versatility, the CM-200 is utilized extensively in both research and industrial applications, particularly in materials science, biology, and nanotechnology.

One of the key features of the CM-200 is its advanced electron optics, which utilizes a high-tension generator to produce a stable and finely focused electron beam. This enables researchers to achieve magnifications of up to 1,000,000 times, allowing for the visualization of structures that are mere nanometers in size. The high resolution is further complemented by a large depth of field, which provides unprecedented clarity and detail in imaging complex samples.

The CM-200 also incorporates a range of imaging modes, including bright field, dark field, and selected area diffraction imaging. These modes allow for a comprehensive analysis of the sample under various conditions, making it easier to identify structural features and materials' properties. Furthermore, the microscope is equipped with a state-of-the-art camera system, which captures high-quality images and facilitates real-time observation.

In terms of sample preparation, the CM-200 supports various techniques, including ultra-thin sectioning and cryo-preparation methods. This flexibility makes it suitable for analyzing a wide array of sample types, from biological tissues to advanced material composites. The ability to handle both conductive and non-conductive samples without significant alteration ensures that the integrity of the sample is maintained throughout the imaging process.

Moreover, the CM-200 is designed with ease of use in mind. Its intuitive interface and automated functions streamline operation, allowing users to focus on analysis rather than technical adjustments. This user-friendly design promotes efficiency and accessibility for both novice and experienced researchers.

In summary, the Philips CM-200 is a cutting-edge electron microscope that combines advanced technologies with user-centric features. Its high-resolution imaging capabilities, versatile imaging modes, and adaptability for various sample types make it an invaluable tool in scientific research and industrial applications. Researchers can rely on the CM-200 to provide detailed insights into the nanoscale world, driving advancements across multiple fields.
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