Sony service manual MZ-R500/R500PC, 0 43Res, Resume Clear, Overall CD and MO adjustment items

•Overall CD and MO adjustment items

1. Overall CD adjustment items

Item No.	Description
312
313	CD electrical offset adjustment
314
321	CD tracking error gain adjustment
328	CD TWPP gain adjustment
324	CD tracking error offset adjustment
332
336	CD ABCD gain adjustment
344	CD focus gain adjustment
345	CD tracking gain adjustment
521	CD two-axis sensitivity adjustment
522

2. Overall MO adjustment items

Item No.	Description
112
113	MO electrical offset adjustment
114
118
221	Low reflective CD tracking error gain adjustment
224	Low reflective CD tracking error offset adjustment
232
236	Low reflective CD ABCD level adjustment
244	Low reflective CD focus gain adjustment
245	Low reflective CD tracking gain adjustment
121	MO tracking error gain adjustment
122	MO TON offset adjustment
134	MO TWPP gain adjustment
131	MO double speed read TWPP offset adjustment
132
136	MO ABCD gain adjustment
144	MO focus gain adjustment
145	MO tracking gain adjustment
434	MO write TWPP gain adjustment
431	MO write TWPP offset adjustment
432	MO tracking error offset adjustment
436	MO write ABCD gain adjustment
445	MO write tracking gain adjustment
411	MO normal speed read TWPP offset adjustment
412	MO tracking error offset adjustment
448	20 sec full recording

MZ-R500/R500PC

5-9. Resume Clear

Perform the Resume clear when all adjustments completed.

• Resume Clear Setting Method

1.Select the manual mode of the test mode, and set item number 043 (see page 13).

This set LCD display

043Resume

2. Press the X key.

This set LCD display

0 43Res

Resume clear complete

043ResClr

3.Press the x key to return to the test mode (display check mode).

5-10. Patch Data Rewriting When Nonvolatile Memory was Replaced

When the microcomputer in this set is replaced with a different version of microcomputer, it is needed to initialize the modified program data in the nonvolatile memory and write specific modi- fied data for the new version in the memory.

If the microcomputer is replaced with a different version, the patch data should be rewritten as performed when the nonvolatile memory is replaced.

For a version where the method to write patch data is not described, the modified data should be initialized as specified below:

• Initial set of modified data

1.Select the manual mode of the test mode, and set item number 022 (see page 13).

This set LCD display

022PatClr

2.Press the [ENTER] key and set the address & adjusted value display (see page 14).

This set LCD display

022SCC

CC: Adjusted value

3.Press the X key to initialize the patch data.

(The modified data writing is over, if the adjusted value changes to DD.)

This set LCD display

022SDD

DD: Adjusted value

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