MAINTENANCE

Page 29

VACUUM CHECK

A sufficient level of vacuum is necessary for proper performance of the vacuum interrupters. Although vacuum leaks are rare, the vacuum integrity should be checked periodically. The relationship between dielectric breakdown voltage of the contact gap and internal vacuum interrupter pressure has been found to be

WARNING

Hazardous voltages are present during dielectric testing which can result in severe injury or death. Only qualified personnel should conduct this testing.

generally predictable. Therefore, vacuum interrupter integrity is checked by performing a high potential test across the open gap of the interrupter.

TEST EQUIPMENT:

Toshiba offers a compact vacuum checker (Type CI35-1D) which enables a quick and easy check on vacuum interrupter internal pressure. Alternatively, any commercially available AC high potential tester may be used which is capable of delivering at least 25 milliamperes at 22 kV for a period of one minute.

PRECAUTIONS:

Applying abnormally high voltage across a pair of contacts in vacuum may produce X-rays. The radiation may increase with the increase in voltage and/or decrease in contact spacing. X- radiation produced during this test with recommended voltage and normal contact spacing is extremely low and well below the maximum permitted by standards. As an additional safety measure, however, it is recommended that all personnel keep at least 1 meter (3.3 ft) away from the vacuum circuit breaker while this test is performed.

TEST PROCEDURE:

1.The circuit breaker should be disconnected from the main circuit and be in the OFF position.

2.Connect all the line side primary terminals together and to the output of the vacuum checker or AC hi-pot machine. Connect all the load side primary terminals together and to the ground terminal of the vacuum checker or AC hi-pot machine.

3.Increase the voltage from zero to 22kV AC at a rate of approximately 2kV per second. Hold the voltage at this value for 1 minute and observe the current drawn by the interrupter.

4.Decrease the voltage back to zero.

WARNING

Radiation exposure hazard. X-rays may cause illness or injury. Stay at least 1 meter (3.3 ft) away from the circuit breaker during the vacuum check test .

Fig. 33 Toshiba Portable Vacuum Checker

CTi Automation - Phone: 800.894.0412 - Fax: 208.368.0415 - Web: www.ctiautomation.net - Email: info@ctiautomation.net

Page 32 Page 34
Page 33
Image 33
Toshiba HV6FS-MLD instruction manual Vacuum Check, Test Equipment, Precautions, Test Procedure
Page 32 Page 34

HV6FS-MLD specifications

The Toshiba HV6FS-MLD is a high-performance semiconductor designed for various applications such as inverters, power supplies, and automotive systems. This device is particularly noted for its efficiency and reliability in managing high voltage levels, making it an essential component in modern electronic systems.

One of the standout features of the HV6FS-MLD is its superior power handling capacity. Designed to accommodate high voltage operations, this device ensures minimal energy loss during the conversion and regulation processes. The incorporation of advanced materials contributes to its ability to withstand high temperatures without compromising performance, making it suitable for harsh environments.

Another key technology integrated into the HV6FS-MLD is Toshiba’s Isolated Gate Drive technology. This technology enhances the safety and stability of the device by preventing unwanted current flow, which is particularly crucial in high-voltage applications. The isolated gate drive also allows for better control and reliability when interfacing with different circuit topologies.

The HV6FS-MLD is characterized by its compact design, which enables it to fit into space-constrained environments without sacrificing power capabilities. This compactness does not impair its performance; rather, it ensures that devices are not only efficient but also adaptable to various designs. Furthermore, the device is equipped with integrated protection features, including over-voltage protection and thermal shutdown mechanisms, which safeguard both the HV6FS-MLD itself and the larger system in which it operates.

Moreover, the HV6FS-MLD supports a wide operating temperature range, making it versatile for applications ranging from consumer electronics to industrial systems. This adaptability is crucial as manufacturers increasingly demand components that can perform reliably across varying conditions.

Toshiba's commitment to quality and innovation is reflected in the HV6FS-MLD’s robust performance and longevity. The component’s reliability is further enhanced by rigorous testing protocols that ensure it meets stringent industry standards. As electronic systems continue to evolve, the HV6FS-MLD stands out as a dependable solution for powering the next generation of devices.

In conclusion, the Toshiba HV6FS-MLD is an advanced semiconductor solution that embodies efficiency, reliability, and versatility, making it an invaluable asset in the design and implementation of modern electronic systems.
Top Page Image Contents