Cypress STK12C68-5 manual Data Retention and Endurance, Capacitance, Thermal Resistance

			STK12C68-5 (SMD5962-94599)
Data Retention and Endurance
Parameter	Description		Min		Unit
DATAR	Data Retention		100		Years
NVC	Nonvolatile STORE Operations		1,000		K
Capacitance
In the following table, the capacitance parameters are listed.[6]
Parameter	Description		Test Conditions		Max	Unit
CIN	Input Capacitance		TA = 25°C, f = 1 MHz,		8	pF
			VCC = 0 to 3.0 V
COUT	Output Capacitance				7	pF
Thermal Resistance
In the following table, the thermal resistance parameters are listed.[6]
Parameter	Description		Test Conditions	28-CDIP	28-LCC	Unit
ΘJA	Thermal Resistance		Test conditions follow standard test methods and	TBD	TBD	°C/W
	(Junction to Ambient)		procedures for measuring thermal impedance, per
			EIA / JESD51.
ΘJC	Thermal Resistance			TBD	TBD	°C/W
	(Junction to Case)
			Figure 7. AC Test Loads
		R1 963Ω	R1 963Ω For Tri-state Specs

5.0V

Output

30 pF R2

512Ω

5.0V

Output

5 pF R2

512Ω

AC Test Conditions

Input Pulse Levels	0V to 3V
Input Rise and Fall Times (10% to 90%)	<5 ns
Input and Output Timing Reference Levels	1.5

Note

6. These parameters are guaranteed by design and are not tested.

Document Number: 001-51026 Rev. ** Page 8 of 18

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